SIST EN 60444-9:2008

SLOVENSKI STANDARD
SIST EN 60444-9:2008
01-januar-2008
0HULWYHSDUDPHWURYNYDUþQRNULVWDOQLKHQRWGHO0HULWYHQHåHOHQLKUHVRQDQF
HQRWVSLH]RHOHNWULþQLPLNULVWDOL,(&
Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious
resonances of piezoelectric crystal units (IEC 60444-9:2007)
Messung von Schwingquarz-Parametern - Teil 9: Messung der Nebenresonanzen von
Schwingquarzen (IEC 60444-9:2007)
Mesure des parametres des résonateurs a quartz - Partie 9 : Mesure des résonances
parasites des quartz piézoélectriques (IEC 60444-9:2007)
Ta slovenski standard je istoveten z: EN 60444-9:2007
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60444-9:2008 en,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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EUROPEAN STANDARD
EN 60444-9

NORME EUROPÉENNE
April 2007
EUROPÄISCHE NORM

ICS 31.140


English version


Measurement of quartz crystal unit parameters -
Part 9: Measurement of spurious resonances
of piezoelectric crystal units
(IEC 60444-9:2007)


Mesure des paramètres  Messung von Schwingquarz-Parametern -
des résonateurs à quartz - Teil 9: Messung der Nebenresonanzen
Partie 9: Mesure des résonances von Schwingquarzen
parasites des quartz piézoélectriques (IEC 60444-9:2007)
(CEI 60444-9:2007)




This European Standard was approved by CENELEC on 2007-03-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in two official versions (English and German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2007 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60444-9:2007 E

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EN 60444-9:2007 - 2 -
Foreword
The text of document 49/764/FDIS, future edition 1 of IEC 60444-9, prepared by IEC TC 49, Piezoelectric
and dielectric devices for frequency control and selection, was submitted to the IEC-CENELEC parallel
vote and was approved by CENELEC as EN 60444-9 on 2007-03-01.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2007-12-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2010-03-01
__________
Endorsement notice
The text of the International Standard IEC 60444-9:2007 was approved by CENELEC as a European
Standard without any modification.
__________

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INTERNATIONAL IEC


STANDARD 60444-9





First edition
2007-02


Measurement of quartz crystal unit parameters –
Part 9:
Measurement of spurious resonances
of piezoelectric crystal units
© IEC 2007 ⎯ Copyright - all rights reserved
No part of this publication may be reproduced or utilized in any form or by any means, electronic or
mechanical, including photocopying and microfilm, without permission in writing from the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: +41 22 919 02 11 Telefax: +41 22 919 03 00 E-mail: inmail@iec.ch Web: www.iec.ch
PRICE CODE
Commission Electrotechnique Internationale P
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

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– 2 – 60444-9 © IEC:2007(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

MEASUREMENT OF QUARTZ
CRYSTAL UNIT PARAMETERS –

Part 9: Measurement of spurious resonances
of piezoelectric crystal units


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
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Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
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members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-9 has been prepared by IEC technical committee 49:
Piezoelectric and dielectric devices for frequency control and selection.
The text of this standard is based on the following documents:
FDIS Report on voting
49/764/FDIS 49/774/RVD

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

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60444-9 © IEC:2007(E) – 3 –
A list of all parts of IEC 60444 series, published under the general title Measurement of quartz
crystal unit parameters, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this standard may be issued at a later date.

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– 4 – 60444-9 © IEC:2007(E)
MEASUREMENT OF QUARTZ
CRYSTAL UNIT PARAMETERS –

Part 9: Measurement of spurious resonances
of piezoelectric crystal units



1 Scope
This part of IEC 60444 describes two methods for determining the spurious (unwanted) modes
of piezoelectric crystal resonators. It extends the capabilities and improves the reproducibility
and accuracy compared to previous methods.
The previous methods described in IEC 60283 (1968) were based on the use of a measuring
bridge, which applies to non-traceable components such as variable resistors and a hybrid
transformer, which are no longer commercially available.
Method A (Full parameter determination)
Full parameter determination allows the determination of the equivalent parameters of the
spurious resonances and is based on the methods described in IEC 60444-5 using the same
measurement equipment. It is the preferred method, which can be applied to the
measurement of low and medium impedance spurious resonances up to several kΩ.
Method B (Resistance determination)
Resistance determination should be used for the determination of high impedance spurious
resonances as specified, for example for certain filter crystals. It uses the same test
equipment as method A in conjunction with a test fixture, which consists of commercially
available microwave components such as a 180° hybrid coupler and a 10 dB attenuator, which
are well-defined in a 50 Ω environment. This method is an improvement to the “reference
method” of the obsolete IEC 60283.
2 Overview
Piezoelectric crystal units show multiple resonances, which can be electrically represented by
a parallel connection of a number of series resonant circuits. The one-port equivalent circuit
of the complete crystal unit is shown in Figure 1 (taken from IEC 60444-5).

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60444-9 © IEC:2007(E) – 5 –

L L L
1 2 3
C
G 0
0
C C C
1 2 3
R R R
1 2 3
IEC  324/07

Figure 1 – General one-port equivalent circuit for multiple resonances
The total admittance Y of the equivalent circuit for n resonance modes is therefore
tot
Y = G + jωC + Y (1)
∑ i
tot 0 0
i
with
−1
⎛⎞
1
Y = G + jB = Rj+ωL +  (i = 1,2,…n) (2)
⎜⎟
i i i ii
jCω
⎝⎠i
Index i = 1 represents the main mode, while i = 2 … n represents the spurious resonance
modes.
The spurious modes are regarded as uncoupled modes. Coupled modes can also be found by
the described test methods, however their strong amplitude dependence does not allow for
the precise determination of their parameters.
i
The attenuation a , of a spurious mode i, is defined as the logarithmic ratio (expressed in
spur
dB) of its resistance R , to the resistance R of the main mode:
i 1
⎛⎞R
i i
a2=⋅0log (3)
⎜⎟
spur 10
R
⎝⎠1
Figure 2 shows a typical spectrum for the spurious resonances of an AT-cut quartz crystal unit
as displayed on a spectrum analyzer using a π-network according to IEC 60444-1.

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– 6 – 60444-9 © IEC:2007(E)

0
10
20
30
40
50
60
70
80
20 900 000 21 000 000 21 100 000 21 200 000
Frequency  Hz
IEC  325/07

Figure 2 – Spectrum of spurious responses
NOTE The attenuation values measured on a network analyzer depend on the termination resistance of the test
fixture used (e.g. 25 Ω for a π-network of IEC 60444-1). They are different from the spurious attenuation as
computed from equation (3).
NOTE The frequencies and attenuation values measured on a network analyzer are different if the crystal
resonator is connected to a load capacitor.
See also note under 3.2.1.2.
3 Measurement methods
The following measurement parameters are necessary and should be given in the detail
specification:
• frequency range of the spurious resonances FR to be evaluated;
spur
• level of drive.
Care must be taken in selecting a suitable measurement (sweep) time.
3.1 Method A (Full parameter determination)
The measurement system consists of a π-network or an s-parameter test fixture in
accordance with IEC 60444-1 and IEC 60444–5 in conjunction with a network analyzer or an
equivalent setup.
The admittance of the crystal is measured within the specified frequency range FR . The
spur
spurious resonances are isolated with
...