SIST HD 605 S3:2019

SLOVENSKI STANDARD
SIST HD 605 S3:2019
01-oktober-2019
Nadomešča:
SIST HD 605 S2:2009
Električni kabli - Dodatne preskusne metode
Electric cables - Additional test methods
Starkstromkabel - Ergänzende Prüfverfahren
Câbles électriques - Méthodes d’essais supplémentaires
Ta slovenski standard je istoveten z: HD 605-S3:2019
ICS:
29.060.20 Kabli Cables
SIST HD 605 S3:2019 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST HD 605 S3:2019

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SIST HD 605 S3:2019


HARMONIZATION DOCUMENT HD 605-S3

DOCUMENT D'HARMONISATION

HARMONISIERUNGSDOKUMENT
August 2019
ICS 29.060.20  Supersedes HD 605 S2:2008 and all of its amendments
and corrigenda (if any)
English Version
Electric cables - Additional test methods
Câbles électriques - Méthodes d'essais supplémentaires Starkstromkabel - Ergänzende Prüfverfahren
This Harmonization Document was approved by CENELEC on 2019-07-01. CENELEC members are bound to comply with the
CEN/CENELEC Internal Regulations which stipulate the conditions for implementation of this Harmonization Document at national level.
Up-to-date lists and bibliographical references concerning such national implementations may be obtained on application to the CEN-
CENELEC Management Centre or to any CENELEC member.
This Harmonization Document exists in three official versions (English, French, German).
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2019 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. HD 605-S3:2019 E

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HD 605 S3:2019 (E)
Contents Page
European foreword . 4
1 General . 5
1.1 Scope . 5
1.2 Applicable tests . 5
1.3 Classification of tests . 5
1.4 Sampling . 5
1.5 Test conditions . 5
2 Non-electrical tests . 6
2.1 Dimensional measurements . 6
2.2 Mechanical tests on non-metallic components . 23
2.3 Mechanical tests on metallic components . 33
2.4 Non-electrical tests on samples of complete cable . 35
2.5 Physical and chemical tests . 63
3 Electrical tests . 76
3.1 Electrical resistance . 76
3.2 Voltage tests . 80
3.3 Insulation resistance tests . 86
3.4 Surface resistance of the cable oversheath . 89
3.5 (Spare) . 89
3.6 Spark tests . 89
3.7 Measurement of transfer impedance . 90
3.8 Heating cycle test . 92
3.9 Measurement of the electrical resistivity of the semi-conducting screens . 96
3.10 Partial discharge test . 98
3.11 Tan δ measurement . 100
3.12 Resistance of the insulating sheaths to weather conditions . 100
3.13 Adherence of screens at short circuit temperature . 103
3.14 Resistivity test for water blocking tape . 104
3.15 Moisture absorption test – Electric method . 104
3.16 (Spare) . 105
3.17 (Spare) . 105
3.18 (Spare) . 105
3.19 (Spare) . 105
4 Fire performance tests . 105
4.1 Flame propagation tests . 105
4.2 Smoke emission tests . 109
4.3 (Spare) . 111
4.4 Toxic gas emission tests . 111
4.5 (Spare) . 118
4.6 (Spare) . 118
5 Long term tests . 118
5.1 Thermal endurance tests . 118
5.2 Pulling lubricant immersion test . 120
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5.3 Long term water immersion test . 120
5.4 Long term voltage test . 121
5.5 Radial watertightness test and corrosion resistance test of metallic screen. 126
5.6 Insulation water resistance test . 126
Annex A (normative) Normative references . 128
Annex B (normative) Rounding of numbers . 130
B.1 Rounding of numbers for the purpose of the fictitious calculation method . 130
B.2 Rounding of numbers for other purposes . 130
Bibliography . 132

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European foreword
This document (HD 605 S3:2019) has been prepared by CLC/TC 20, “Electric cables”.
The following dates are fixed:
• latest date by which this document has to be (dop) 2020-07-01
implemented at national level by publication of
an identical national standard or by
endorsement
• latest date by which the national standards (dow) 2022-07-01
conflicting with this document have to be
withdrawn

This document supersedes HD 605 S2:2008 and all of its amendments and corrigenda (if any).
In order to maintain the integrity of existing clause numbers, and hence avoid unnecessary amendments to
over 100 particular sections of the product HDs, the normative references are given in Annex A.
The numbering of tables and figures in this standard is not conventional. It retains the scheme as used in
HD 605 S1. This is to facilitate easier cross referencing in national sections of HD 603, HD 620 and other
compendia HDs. It also allows for continuing work to rationalize and harmonize more of these test methods in
the future, without the need for further re-numbering.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
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1 General
1.1 Scope
This HD collates and specifies the test methods to be used for testing polymeric insulated and sheathed electric
cables, of rated voltage up to and including 20,8/36 kV, intended for public distribution systems, and for use in
power generating plants and sub-stations.
Test methods in this HD are additional to those already harmonized, e.g. EN 60332-1 series and EN 60811
series, and are used for testing cable types specified in HD 603, HD 604, HD 620, HD 622, HD 626 and
HD 627. In each case, these HDs give complementary information needed for the practical application to each
specific type. Therefore the present HD as such is not sufficient for carrying out and evaluating the tests on
electric cables.
Full test conditions (e.g. temperatures, durations) and/or test requirements are not specified in this HD. Such
data needed to carry out the tests is given in the particular sections.
NOTE The words 'particular section' refer throughout to the section of HD 603 or HD 604, or other HD to which
HD 605 applies, in which a particular cable type is specified.
1.2 Applicable tests
Tests applicable to each type of cable are given in the particular section, which may also state the sequence,
the frequency of test, and the possibility of repeating failed tests.
1.3 Classification of tests
The classification of tests is given in Parts 1 of HD 603, HD 604, HD 620, HD 622, HD 626 and HD 627.
1.4 Sampling
The size and number of samples are given either in this HD or in the particular HDs.
If a marking is indented in the insulation or sheath surface, the samples used for the tests shall be taken so as
to include such markings.
For multicore cables, except for the test specified in 2.1.1, not more than three cores (of different colours, if
available) shall be tested unless otherwise specified.
1.5 Test conditions
1.5.1 Ambient temperature
Unless otherwise specified in the details for the particular test, tests shall be made at an ambient temperature
of (20 ± 15) °C.
1.5.2 Tolerance on temperature values
Unless otherwise specified in the particular specification, the tolerance on temperature values quoted in the
test methods are the following:
Table 1.5.2 — Tolerance on temperature values
Specified temperature, t
Tolerance
°C K
-40 ≤ t ≤ 0 ± 2
0 < t ≤ 50 according to relevant clause
50 < t ≤ 150 ± 2
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t > 150 ± 3
1.5.3 Frequency and waveform of power-frequency test voltages
Unless otherwise specified the test voltage shall be in the range 49 Hz to 61 Hz of approximately sine-wave
form, the peak ratio value/r.m.s. value being equal to √2 with a tolerance of ± 7 %. The values given are r.m.s.
1.5.4 Pre-conditioning
Unless otherwise stated the tests shall be carried out not less than 16 h after the extrusion or cross-linking,
if any, of the insulating or sheathing compounds.
2 Non-electrical tests
2.1 Dimensional measurements
2.1.1 Measurement of insulation thickness
2.1.1.1 Procedure
The thickness of insulation shall be measured in accordance with EN 60811-201. Unless otherwise specified
one sample of cable shall be taken and measurement made at three places.
Compliance shall be checked on each core of cables having up to five cores, and on the number of cores
stated in the individual specification for cables with more than five cores.
If withdrawal of the conductor is difficult, it shall be stretched in a tensile machine or the piece of core shall be
immersed in an appropriate liquid until the insulation becomes loose.
2.1.1.2 Evaluation of results
Unless otherwise specified the mean of the 18 values (expressed in millimetres) obtained from the three pieces
of insulation from each core shall be calculated to two decimal places and rounded off as given below, and
this shall be taken as the mean value of the thickness of insulation.
If in the calculation the second decimal figure is 5 or more, the first decimal figure shall be raised to the next
number thus, for example, 1,74 shall be rounded off to 1,7 and 1,75 to 1,8.
The lowest of all values obtained shall be taken as the minimum thickness of insulation at any place.
2.1.2 Measurement of non-metallic sheath thickness
2.1.2.1 Procedure
The thickness of sheath shall be measured in accordance with EN 60811-202. Unless otherwise specified,
one sample of cable shall be taken and measurement made at three places.
2.1.2.2 Evaluation of results
The mean of all the values (expressed in millimetres) obtained from the three pieces of sheath shall be
calculated to two decimal places and rounded off as given below, and this shall be taken as the mean value
of the thickness of the sheath.
If in the calculation the second decimal figure is 5 or more, the first decimal figure shall be raised to the next
number, thus, for example, 1,74 shall be rounded off to 1,7 and 1,75 to 1,8.
The lowest of all values obtained shall be taken as the minimum thickness of sheath at any place.
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2.1.3 Measurement of cable dimensions
2.1.3.1 Measurement of overall dimensions
Unless otherwise specified the three samples taken in accordance with this HD, 2.1.1 or 2.1.2 shall be used.
The measurement of the overall diameter of any circular cable and of the overall dimensions of flat cables with
a major dimension not exceeding 15 mm shall be carried out in accordance with EN 60811-203.
For the measurement of flat cables with a major dimension exceeding 15 mm, a micrometer, a profile projector
or similar equipment shall be used.
The mean of the values obtained shall be taken as the mean overall dimensions.
2.1.3.2 Measurement of ovality
For checking the ovality of circular sheathed cables, two measurements shall be made at the same cross-
section of the cable, covering the maximum and minimum values.
2.1.4 Measurement of wires, strips and tapes
2.1.4.1 Conductor wires
Measurement of the diameter of conductor wires (class 5 conductors).
(a) Sampling
Take at random either 10 % of the total number of wires, rounded upwards, or 10 wires, whichever is the
lowest, from one core of each length of cable selected for the test.
(b) Method
Determine the diameter of each wire with a micrometer by taking a measurement in three positions, approx.
300 mm far away from each other. The readings shall be made to two decimal places. Take the average of
the three measurements to be the wire diameter.
2.1.4.2 Wires and tapes for concentric conductor or screen
(a) Sampling
A sample of about 500 mm length is taken from the test piece and straightened by means of a non-damaging
tool. After that it is cleaned.
(b) Procedure
For wires and tapes the diameter or the thickness is measured with an screw type micrometer or a dial gauge
with a measuring element with flat measurement planes with a diameter 4 mm to 8 mm. Measurements shall
be made at three points which are uniformly spread along the sample.
(c) Expression of results
The diameter or the thickness is the mean value obtained from the three measurements. The test is considered
to be fulfilled if the mean value does not fall below the minimum value prescribed in the particular specification.
2.1.4.3 Wires, strips and tapes for armour
(a) Round wires
Take at random 10 wires or 10 % of the total number of wires, whichever is the smaller, from a sample of the
completed cable.
Determine the diameter of each wire of this sampling by taking two measurements at right angles to each other
using a micrometer with flat noses to an accuracy of ± 0,01 mm.
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Take the average value as the wire diameter.
(b) Flat wires or strips
Take at random 10 flat wires or strips or 10 % of the total number of flat wires or strips, whichever is the smaller,
from a sample of the completed cable.
Determine the thickness and width of each flat wire of this sampling by using either a micrometer with flat
noses to an accuracy of ± 0,01 mm or a vernier calliper with flat noses to an accuracy of ± 0,02 mm.
Take the average value as the wire thickness and wire width.
(c) Metallic tapes thickness
Take and straighten a sample of each armour tape, remove the non-metallic coating if any, and determine the
tape thickness at six different places.
The measurement shall be made with either a micrometer or a vernier calliper, both with two flat noses of
approximately 5 mm in diameter, to a respective accuracy of ± 0,01 mm or ± 0,02 mm. For tapes up to 40 mm
in width the thickness shall be measured at the centre of the width. For wider tapes the measurements shall
be made 20 mm from each edge of the tape and the average of the results taken as the thickness.
Take the smallest value to be compared with the specified thickness with a tolerance given in the particular
specification.
2.1.5 Measurement of thickness of metallic sheath
The thickness of lead sheaths shall be determined by one of the following methods, at the discretion of the
manufacturer. (Methods of measuring thickness of other types of metallic sheath are under consideration.)
(a) Strip method
The measurement shall be made on a test piece of sheath about 50 mm in length removed from the finished
cable length. The test piece shall be taken a sufficient distance from the cable end to allow a proper
measurement to be made.
The piece shall be slit longitudinally and carefully flattened. After cleaning the test piece, a number of
measurements shall be taken along the circumference of the sheath and not less than 10 mm away from the
edge of the flattened piece to ensure that the minimum thickness is measured. The measurement shall be
made with a micrometer with plane faces of 2 mm to 8 mm diameter and an accuracy of ± 0,01 mm.
(b) Ring method
The measurements shall be made on a ring of the sheath carefully cut from the sample. The thickness shall
be determined at a sufficient number of points around the circumference of the ring to ensure that the minimum
thickness is measured.
The measurements shall be made with a micrometer having either one flat nose and one ball nose, or one flat
nose and a flat rectangular nose 0,8 mm wide and 2,4 mm long. The ball nose or the flat rectangular nose
shall be applied to the inside of the ring. The accuracy of the micrometer shall be ± 0,01 mm.
2.1.6 Check of application of screen or armour tapes, or wires
2.1.6.1 Method 1
Take a cable sample 300 mm long, at not less than 150 mm from the end of a factory length. Measure the gap
between adjacent edges of the tape(s), and also the tape width. Measurement is made at 4 positions along
the sample, with an accuracy better than 0,5 mm.
2.1.6.2 Method 2
Remove two rings of the oversheath each 50 mm in length, cut at a distance of 5 D and 15 D, respectively,
(where D is the overall diameter) from one end of the cable length, so as to expose the metallic tapes or wires.
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Make a visual examination of the exposed components and measure the largest gap between adjacent wires
or tapes. The measurement shall be made with an accuracy better than 0,5 mm and the result shall be given
to one decimal place.
2.1.7 Percentage coverage of a braided metallic layer
The percentage coverage “B” of the braiding shall be calculated by the following formula:
100d d
B= ( + - )
m n m n mn m n
11 2 2 11 2 2
q q
where
π DS
q=
22
2
+
π D S
D = mean diameter of braiding (= diameter under metallic layer + 2 d, mm);
d = nominal diameter of the wires of the braid, mm;
S = lay of the wires of the braiding, mm;
m1 = number of spindles in one direction;
m = number of spindles in the other direction;
2
n1; n2 = number of wires per spindle according to the direction.
2.1.8 Measurement of the gap between non-metallic tapes of taped bedding
See 2.1.6.1
2.1.9 (Spare)
2.1.10 Irregularities of semi-conducting layers and insulation
2.1.10.1 Method 1 – Irregularities of semi-conducting conductor screen and insulation
(a) Procedure
See 2.1.10.2
(b) Requirements
(i) Irregularities of semi-conducting conductor screen (Figure 2.1.10.1 a))
The semi-conducting conductor screen shall be as far as possible free from irregularities; in any case, there
shall be no pronounced irregularities.
Sporadic irregularities may be allowed if the following requirements are complied with:
— irregularities of the semi-conducting conductor screen may not penetrate by more than 0,080 mm into the
insulation;
— when the height H of the irregularities is not less than 0,040 mm, the ratio (B)/(H) shall be greater than or
equal to 3;
— irregularities where (H) is less than 0,040 mm are not taken into consideration.
(ii) Irregularities of the insulation into semi-conducting conductor screen (Figure 2.1.10.1 b))
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Irregularities of the insulation shall not penetrate into the semi-conducting conductor screen by more than
0,20 mm.
(iii) Irregularities inside the insulation (Figure 2.1.10.1 c))
Sporadic irregularities are allowed taking into account the following conditions:
— Irregularities for which the maximum dimension (L) is less than 0,05 mm are not considered;
— Irregularities for which the maximum dimension (L) is greater than 0,20 mm are not authorized;
— If irregularities are observed for which the maximum dimension (L) is greater than 0,05 mm but less than
or equal to 0,20 mm a second sample, taken close to the first one, shall be examined and shall not be
permitted to show irregularities.


a) Irregularities of semi- b) Irregularities of the insulation c) Irregularities inside the
conducting conductor screen into the semi-conducting insulation
conductor screen
Key
1 Insulation B Base of the irregularity
2 Semiconducting screen H Height of the irregularity
3 Conductor M Penetration depth of the irregularity
  L Dimension of the irregularity
Figure 2.1.10.1 — Method 1 – Irregularities of semi-conducting conductor screen and insulation
2.1.10.2 Method 2 – Irregularities of semi-conducting conductor screen and insulation
(a) Scope
This standard specifies the tests of irregularities of the surface of extruded inner semi-conducting layers and
in insulation of XLPE insulated power cables with rated voltages Uo/U 6/10 kV to 20,8/36 kV.
(b) Measuring equipment
(i) electrical air oven with natural air flow
(ii) beaker
(iii) silicone oil
(iv) measuring microscope or profile projector of at least 10x magnification, with rotating holding device for
the test piece, which shall allow for a reading of 0,01 mm
(v) illumination
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(c) Preparation of test pieces
From one end of the cable a test piece of 300 mm in length shall be taken. The outer semi-conducting layer of
the test piece will be removed. The test piece may be stored for one to two hours in the air oven ((b) (i)) at
approximately 80 °C. The beaker ((b) (ii)) shall be filled with silicone oil ((b) (iii)) and heated to approximately
130 °C.
(d) Measuring procedure
The test piece shall be inserted into the heated silicone oil until the XLPE insulation reaches its full
transparency. The test piece shall then be visually inspected with the assistance of the lamp ((b) (v)) and, if
necessary, any irregularities on the surface of the test piece shall be marked. The test piece shall then cool
down to room temperature.
In order to measure the irregularities the test piece shall be cut into discs or spirals at the points marked. The
measurement of the irregularities shall be carried out by means of the measuring equipment ((b) (iv)) in such
a manner that,
— the largest extension (b) of an irregularity in the insulation (Figure 2.1.10.2 a));
— the largest extension (t) of an irregularity in the inner semi-conducting layer (Figure 2.1.10.2 b));
— the largest extension (h) of an irregularity in the inter-facial area semi-conducting layer/insulation into the
insulation and its basis diameter (d) (Figure 2.1.10.2 c));
shall be ascertained.
(e) Evaluation of test results
The results are acceptable if the measured values are with the limits given in the particular specifications.


a) Irregularities in the insulation b) Irregularities extended into c) Irregularities of the conductor
the conductor screen screen extended into the
insulation
Key
1 Insulation b Dimension of the irregularity
2 Semiconducting screen t Penetration depth of the irregularity
3 Conductor d Base of the irregularity
  h Height of the irregularity
Figure 2.1.10.2 — Method 2 – Irregularities of semi-conducting conductor screen and insulation
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2.1.10.3 Method 3 – Imperfection in cross-linked polyethylene insulation and semi-conducting
layers
(a) Cross-linked Polyethylene Insulation
The insulation material shall be inspected for contaminants using a continuous sampling plan. The plan shall
sample a minimum of 2 % of the insulation material volume. The material analysis shall be reported for
engineering information only and at a minimum, list the size and a number of contaminants found per weight
of insulation inspected. Material that is not inspected by the producer, shall be inspected at the 2 % rate by the
cable supplier.
The insulation of the completed cable shall be free from:
(i) Any void larger than 0,075 mm. The number of voids larger than 0,05 mm shall not exceed two per cubic
cm of insulation for all voltages.
(ii) Any contaminant (opaque material or material that is not homogeneous cross-linked polyethylene) larger
than 0,125 mm in its greatest dimension. The number of contaminants of sizes between 0,05 mm and
0,125 mm shall not exceed one per cubic cm of insulation for all voltages.
(iii) Any translucent material that is larger than 1,25 mm in its greatest dimension.
(b) Semi-conducting conductor and insulation screen voids and protrusions
1. Semi-conducting extrusion for conductor shielding shall be free of any voids larger than 0,075 mm at
the insulation interface.
2. Semi-conducting extrusion for insulation shielding shall be free of any voids larger than 0,125 mm at
the insulation
...