SIST EN IEC 62271-101:2021

SLOVENSKI STANDARD
SIST EN IEC 62271-101:2021
01-november-2021
Nadomešča:
SIST EN 62271-101:2013
SIST EN 62271-101:2013/A1:2018
Visokonapetostne stikalne in krmilne naprave - 101. del: Sintetično preskušanje
(IEC 62271-101:2021)
High-voltage switchgear and controlgear - Part 101: Synthetic testing (IEC 62271-
101:2021)
Hochspannungs-Schaltgeräte und -Schaltanlagen - Teil 101: Synthetische Prüfung (IEC
62271-101:2021)
Appareillage à haute tension - Partie 101: Essais synthétiques (IEC 62271-101:2021)
Ta slovenski standard je istoveten z: EN IEC 62271-101:2021
ICS:
29.130.10 Visokonapetostne stikalne in High voltage switchgear and
krmilne naprave controlgear
SIST EN IEC 62271-101:2021 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 62271-101:2021

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SIST EN IEC 62271-101:2021


EUROPEAN STANDARD EN IEC 62271-101

NORME EUROPÉENNE

EUROPÄISCHE NORM
September 2021
ICS 29.130.10 Supersedes EN 62271-101:2013 and all of its
amendments and corrigenda (if any)
English Version
High-voltage switchgear and controlgear - Part 101: Synthetic
testing
(IEC 62271-101:2021)
Appareillage à haute tension - Partie 101: Essais Hochspannungs-Schaltgeräte und -Schaltanlagen - Teil
synthétiques 101: Synthetische Prüfung
(IEC 62271-101:2021) (IEC 62271-101:2021)
This European Standard was approved by CENELEC on 2021-08-31. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.


European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2021 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN IEC 62271-101:2021 E

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SIST EN IEC 62271-101:2021
EN IEC 62271-101:2021 (E)
European foreword
The text of document 17A/1312/FDIS, future edition 3 of IEC 62271-101, prepared by SC 17A
“Switching devices” of IEC/TC 17 “High-voltage switchgear and controlgear” was submitted to the IEC-
CENELEC parallel vote and approved by CENELEC as EN IEC 62271-101:2021.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2022-05-31
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2024-08-31
document have to be withdrawn
This document supersedes EN 62271-101:2013 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 62271-101:2021 was approved by CENELEC as a
European Standard without any modification.
2

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SIST EN IEC 62271-101:2021
EN IEC 62271-101:2021 (E)
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod), the
relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 62271-100 2021 High-voltage switchgear and controlgear - EN IEC 62271-100 2021
Part 100: Alternating-current circuit-
breakers


3

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SIST EN IEC 62271-101:2021




IEC 62271-101

®


Edition 3.0 2021-07




INTERNATIONAL



STANDARD




NORME


INTERNATIONALE

colour

inside










High-voltage switchgear and controlgear –

Part 101: Synthetic testing




Appareillage à haute tension –

Partie 101: Essais synthétiques
















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE

INTERNATIONALE




ICS 29.130.10 ISBN 978-2-8322-1004-6




Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN IEC 62271-101:2021
– 2 – IEC 62271-101:2021 © IEC 2021
CONTENTS
FOREWORD . 9
1 Scope . 11
2 Normative references. 11
3 Terms and definitions . 11
4 Synthetic testing techniques and methods for short-circuit breaking tests . 13
4.1 Basic principles and general requirements for synthetic breaking test
methods . 13
4.1.1 General . 13
4.1.2 High-current interval . 14
4.1.3 Interaction interval . 15
4.1.4 High-voltage interval . 15
4.2 Synthetic test circuits and related specific requirements for breaking tests . 18
4.2.1 Current injection methods . 18
4.2.2 Voltage injection method . 19
4.2.3 Duplicate circuit method (transformer or Skeats circuit) . 20
4.2.4 Other synthetic test methods . 20
4.3 Three-phase synthetic test methods . 20
5 Synthetic testing techniques and methods for short-circuit making tests . 24
5.1 Basic principles and general requirements for synthetic making test methods . 24
5.1.1 General . 24
5.1.2 High-voltage interval . 27
5.1.3 Pre-arcing interval . 27
5.1.4 Latching interval and fully closed position . 27
5.2 Synthetic test circuit and related specific requirements for making tests . 27
5.2.1 General . 27
5.2.2 Test circuit and test requirements . 27
5.2.3 Alternative test method with reduced voltage . 32
7 Type tests . 33
7.102 General . 33
7.104 Demonstration of arcing times . 34
7.107 Terminal fault tests . 45
7.109 Short-line fault tests . 49
7.110 Out-of-phase making and breaking tests . 50
7.111 Capacitive current tests . 50
Annex A (normative) Correction of di/dt and TRV for test duty T100a . 53
A.1 General . 53
A.2 Reduction in di/dt . 53
A.3 Corrected TRV for the first-pole-to-clear with required asymmetry . 53
A.4 Correction of the di/dt and TRV of the first-pole-to-clear for tests with
intermediate asymmetry . 60
A.5 Correction of the di/dt and TRV of the second- or last-pole-to-clear with
major extended loop with required asymmetry during three-phase tests . 61
A.6 Correction of the di/dt and TRV during tests with a subsequent minor loop . 61
A.7 Calculation of the di/dt and TRV of the first-pole-to-clear . 61
A.7.1 General . 61
A.7.2 Calculation of di/dt . 61

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A.7.3 Calculation of TRV . 62
A.7.4 Examples of calculation of di/dt and TRV . 64
Annex B (normative) Tolerances on test quantities for type tests . 66
Annex C (normative) Information to be given and results to be recorded for synthetic
tests . 69
C.1 General . 69
C.2 Auxiliary circuit-breaker . 69
C.3 Test conditions . 69
C.4 Quantities to be recorded . 69
C.4.1 General . 69
C.4.2 Voltages . 69
C.4.3 Currents . 69
Annex D (normative) Test procedure using a three-phase current circuit and one
voltage circuit . 70
D.1 Test circuit . 70
D.2 Test method . 71
D.2.1 General . 71
D.2.2 Test duty T100s(b) . 71
D.2.3 Test duty T100a . 80
D.2.4 Combination of first-pole-to-clear factors 1,3 and 1,5 . 89
Annex E (normative) Splitting of test duties in test series taking into account the
associated TRV for each pole-to-clear . 92
E.1 General . 92
E.2 Test-duties T10, T30, T60, T100s(b), OP1 and OP2(b). 92
E.2.1 Test procedure for first-pole-to-clear factors 1,5 and 2,5 . 92
E.2.2 Test procedure for first-pole-to-clear factors 1,3 and 2,0 . 93
E.2.3 Test procedure for first-pole-to-clear factor 1,2 . 94
E.3 Test duty T100a . 95
E.3.1 General . 95
E.3.2 Test procedure for first-pole-to-clear factor 1,5 . 96
E.3.3 Test procedure for first-pole-to-clear factor 1,3 . 97
E.3.4 Test procedure for first-pole-to-clear factor 1,2 . 99
E.4 Combination of first-pole-to-clear factors . 100
E.4.1 General . 100
E.4.2 Combination of first-pole-to-clear factors 1,3 and 1,5 for test duties T10,
T30, T60 and T100s(b) . 100
E.4.3 Combination of first-pole-to-clear factors 2,0 and 2,5 for test duties OP1
and OP2(b) . 101
E.4.4 Combination of first-pole-to-clear factors 1,3 and 1,5 for test duty T100a . 102
Annex F (informative) Three-phase synthetic test circuits . 114
F.1 General . 114
F.2 Three-phase synthetic combined circuit . 114
F.3 Three-phase synthetic circuit with injection in all phases . 117
F.4 Three-phase synthetic circuit with injection in two phases . 118
Annex G (informative) Examples of test circuits for metal-enclosed and dead tank
circuit-breakers . 122
Annex H (informative) Step-by-step method to prolong arcing . 133
Annex I (informative) Synthetic methods for capacitive current tests . 135
I.1 General . 135

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I.2 Recovery voltage . 135
I.3 Combined current and voltage circuits . 135
I.4 Making tests . 136
I.5 Current chopping . 136
I.6 Examples test circuits . 136
Annex J (normative) Synthetic test methods for circuit-breakers with opening resistors . 145
J.1 General . 145
J.2 Conditions. 145
J.2.1 General . 145
J.2.2 Transient recovery voltage interval . 145
J.2.3 Power-frequency recovery voltage interval . 145
J.3 Multiple step test procedure . 145
J.3.1 General . 145
J.3.2 Test to verify the re-ignition behaviour of the making and breaking unit . 146
J.3.3 Test to verify the re-ignition behaviour of the making and breaking unit
during short circuit test duties with any test method . 147
J.3.4 Tests on resistor switch(s) . 148
J.4 Test requirements . 149
J.4.1 General . 149
J.4.2 Testing of the making and breaking unit . 150
J.4.3 Testing of the resistor switch . 151
J.4.4 Test of the resistor stack . 151
Annex K (informative) Combination of current injection and voltage injection methods . 152
K.1 Current injection methods . 152
K.2 Voltage injection methods . 152
K.3 Combined current and voltage injection circuits. 152
K.3.1 General . 152
K.3.2 Combined current and voltage injection circuit with application of full
test voltage to earth . 152
K.3.3 Combined current and voltage injection circuit with separated
application of test voltage . 152
Bibliography . 155


Figure 1 – Interrupting process – Basic time intervals . 14
Figure 2 – Examples of evaluation of initial recovery voltage . 17
Figure 3 – Equivalent surge impedance of the voltage circuit for the current injection
method . 19
Figure 4 – Reference lines of TRV with four-parameter for k = 1,5 . 22
pp
Figure 5 – Reference lines of TRV with four-parameter for k = 1,3 . 23
pp
Figure 6 – Reference lines of TRV with four-parameter for k = 1,2 . 24
pp
Figure 7 – Making process – Basic time intervals . 26
Figure 8 – Example of synthetic making circuit for single-phase tests . 29
Figure 9 – Example of synthetic making circuit for out-of-phase tests . 30
Figure 10 – Example of synthetic making circuit for three-phase tests (k = 1,5) . 31
pp
Figure 11 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100s with k = 1,5 . 37
pp

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Figure 12 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic (right) for T100s with k = 1,3 . 38
pp
Figure 13 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic tests (right) for T100a with k = 1,5 . 41
pp
Figure 14 – Comparison of arcing time settings during three-phase direct tests (left)
and three-phase synthetic tests (right) for T100a with k = 1,3 . 42
pp
Figure 15 – Evaluation of recovery voltage during synthetic capacitive current
switching testing . 52
Figure D.1 – Example of a three-phase current circuit with single-phase synthetic
injection . 71
Figure D.2 – Representation of the testing conditions of Table D.1. 73
Figure D.3 – Representation of the testing conditions of Table D.2. 75
Figure D.4 – Representation of the testing conditions of Table D.3. 77
Figure D.5 – Representation of the testing conditions of Table D.4. 79
Figure D.6 – Representation of the testing conditions of Table D.5. 82
Figure D.7 – Representation of the testing conditions of Table D.6. 84
Figure D.8 – Representation of the testing conditions of Table D.7. 86
Figure D.9 – Representation of the testing conditions of Table D.8. 88
Figure E.1 – Example of graphical representation of the tests shown in Table E.6 . 97
Figure E.2 – Example of graphical representation of the tests shown in Table E.7 and
Table E.8 . 99
Figure F.1 – Three-phase synthetic combined circuit . 115
Figure F.2 – Waveshapes of currents, phase-to-ground and phase-to phase voltages
during a three-phase synthetic test (T100s; k = 1,5) performed according to the
pp
three-phase synthetic combined circuit . 116
Figure F.3 – Three-phase synthetic circuit with injection in all phases for k = 1,5 . 117
pp
Figure F.4 – Waveshapes of currents and phase-to-ground voltages during a three-
phase synthetic test (T100s; k = 1,5) performed according to the three-phase
pp
synthetic circuit with injection in all phases . 118
Figure F.5 – Three-phase synthetic circuit for terminal fault tests with k = 1,3
pp
(current injection method) . 119
Figure F.6 – Waveshapes of currents and phase-to-ground voltages during a
three-phase synthetic test (T100s; k = 1,3 ) performed according to the three-phase
pp
synthetic circuit shown in Figure F.5 . 120
Figure F.7 – TRV voltages waveshapes of the test circuit described in Figure F.5 . 121
Figure G.1 – Example of a test circuit for unit testing (circuit-breaker with interaction
due to gas circulation) . 123
Figure G.2 – Oscillogram corresponding to Figure G.1 – Example of the required TRVs
to be applied between the terminals of the unit(s) under test and between the live parts
and the insulated enclosure . 124
Figure G.3 – Example of test circuit using two voltage circuits for breaking tests . 125
Figure G.4 – Example of test circuit using two voltage circuits for breaking tests . 126
Figure G.5 – Example of a synthetic test circuit for unit testing (if unit testing is allowed

as per 7.102.4.2 of IEC 62271-100:2021) . 127
Figure G.6 – Oscillogram corresponding to Figure G.3 – Example of the required TRVs
to be applied between the terminals of the unit(s) under test and between the live parts
and the insulated enclosure . 128

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Figure G.7 – Example of a capacitive current injection circuit with enclosure of the
circuit-breaker energized . 129
Figure G.8 – Example of a capacitive synthetic circuit using two power-frequency
circuits and with the enclosure of the circuit-breaker energized . 130
Figure G.9 – Example of a capacitive synthetic current injection circuit – Unit testing on
half a pole of a circuit-breaker with two units per pole – Enclosure energized with DC
voltage . 131
Figure G.10 – Example of a synthetic making circuit for out-of-phase tests . 132
Figure H.1 – Example of a re-ignition circuit diagram for prolonging arc-duration . 133
Figure H.2 – Example of waveforms obtained during a symmetrical test using the
circuit in Figure H.1. 134
Figure I.1 – Power-frequency circuits in parallel. 138
Figure I.2 – Current injection circuit . 139
Figure I.3 – Power-frequency current injection circuit . 140
Figure I.4 – Current injection circuit, recovery voltage applied to both terminals of the
circuit-breaker . 141
Figure I.5 – Current injection circuit with decay compensation. 142
Figure I.6 – LC oscillating circuit . 143
Figure I.7 – Inrush making current test circuit . 144
Figure J.1 – Test circuit to verify re-ignition behaviour of the making and breaking unit
using current injection method. 147
Figure J.2 – Test circuit to verify re-ignition behaviour of the making and breaking unit . 148
Figure
...