SIST EN 61083-2:1998

SLOVENSKI STANDARD
SIST EN 61083-2:1998
01-januar-1998
Digital recorders for measurements in high- voltage impulse tests - Part 2:
Evaluation of software used for the determination of the parameters of impulse
waveforms (IEC 61083-2:1996)
Digital recorders for measurements in high-voltage impulse tests -- Part 2: Evaluation of
software used for the determination of the parameters of impulse waveforms
Digitalrecorder für Stoßspannungs- und Stoßstromprüfungen -- Teil 2: Bewertung von
Software zur Bestimmung der Parameter von Stoßspannungen
Enregistreurs numériques pour les mesures pendant les essais de choc à haute tension
-- Partie 2: Evaluation du logiciel utilisé pour obtenir les paramètres des formes d'onde
de choc
Ta slovenski standard je istoveten z: EN 61083-2:1997
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
SIST EN 61083-2:1998 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 61083-2:1998

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SIST EN 61083-2:1998

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SIST EN 61083-2:1998

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SIST EN 61083-2:1998

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SIST EN 61083-2:1998

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SIST EN 61083-2:1998
NORME CEI
INTERNATIONALE
IEC
1083-2
INTERNATIONAL
Première édition
STANDARD
First edition
1996-07
Enregistreurs numériques pour les mesures
pendant les essais de choc à haute tension –
Partie 2:
Evaluation du logiciel utilisé pour obtenir
les paramètres des formes d'onde de choc
Digital recorders for measurements
in high-voltage impulse tests –
Part 2:
Evaluation of software used for the determination
of the parameters of impulse waveforms
© CEI 1996 Droits de reproduction réservés — Copyright - all rights reserved
de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized
Aucune partie
utilisée quelque forme que ce soit et par aucun procédé, in any form or by any means, electronic or mechanical,
sous
électronique ou mécanique, y compris la photocopie et les including photocopying and microfilm, without
microfilms, sans l'accord écrit de l'éditeur. permission in writing from the publisher
Bureau central de la Commission Electrotechnique Internationale 3, rue de Varembé Genève, Suisse
CODE PRIX ^+
Commission Electrotechnique Internationale
PRICE CODE ^7
International Electrotechnical Commission
IEC
MermayHapotnian 3neKrporexHwlecHaR HOMHCCHR
• Pour prix, voir catalogue en vigueur
•
For price, see current catalogue

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SIST EN 61083-2:1998
– 3 –
1083-2 © IEC:1996
CONTENTS
Page
FOREWORD 5
7
INTRODUCTION
Clause
9
1 Scope
9
2 Normative references
3 Definitions 11
4 Test data generator (TDG) 13
13
5 Software validation
13
5.1 Test procedure
15
5.2 Evaluation procedure
17
5.3 Data format
17
5.4 Setting characteristics
17
5.5 Application
17
6 Classification and prescribed limits of the reference waveforms
17
6.1 Classification into waveform groups
19
6.2 Specified limits of the parameters of the reference waveforms
7 Record of performance 21
23
8 Performance check
23
8.1 Performance check for user-developed software
8.2 Performance check for compiled code and firmware 23
23
9 Use of processed data
Annexes
25
A Examples of reference waveforms
35
B Test data generator (description of the IEC-TDG software)
39
C Switching impulses – time to peak

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SIST EN 61083-2:1998
1083-2 © IEC:1996 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
DIGITAL RECORDERS FOR MEASUREMENTS IN
HIGH-VOLTAGE IMPULSE TESTS —
Part 2: Evaluation of software used for the determination of
the parameters of impulse waveforms
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international co-operation on all questions concerning standardization in the electrical and electronic
fields. To this end and in addition to other activities, the IEC publishes International Standards. Their
preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt
with may participate in this preparatory work. International, governmental and non-governmental
organizations liaising with the IEC also participate in this preparation. The IEC collaborates closely with the
International Organization for Standardization (ISO) in accordance with conditions determined by agreement
between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters, express as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has
representation from all interested National Committees.
The documents produced have the form of recommendations for international use and are published in the
3)
form of standards, technical reports or guides and they are accepted by the National Committees in that
sense.
In order to promote international unification, IEC National Committees undertake to apply IEC International
4)
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
6)
of patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 1083-2 has been prepared by IEC technical committee 42: High-
voltage testing techniques.
The text of this standard is based on the following documents:
Report on voting
FDIS
42/123/FDIS 42/132/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annexes A, B and C are for information only.

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SIST EN 61083-2:1998
1083-2 © IEC:1996 – 7 –
INTRODUCTION
IEC 1083-1 specifies the test requirements for digital recorders. Digital recorders, like
analog oscilloscopes, are susceptible to changes of their characteristics. However, the more
stringent testing specified for digital recorders (more than is practical for analog
oscilloscopes) has led to the accuracy of digital recorders being more clearly demonstrated.
The method of processing a digital record is left to the parties concerned in the test; the
only condition specified is that the raw data are retained for comparison with the processed
data. However, since the parameters of the test impulse (including the test value) may be
read from the processed data, it is important to establish tests to ensure that the reading of
parameters is adequately performed. The problem is how to ensure this, while permitting
users to develop a wide range of techniques which may give greater accuracy.
This problem is further complicated by the different needs of various users, ranging from
single-purpose test laboratories, for example a cable manufacturer who may only test a few
objects which are capacitive, to large high-voltage test/research laboratories, which may
perform tests on a very wide range of objects, which have a correspondingly wide range of
impedances.
The approach taken in this part of IEC 1083 is to provide from a floppy disk waveforms (and
ranges of their parameters), which a user can employ to verify that a procedure gives values
within the specified ranges. To reduce the amount of testing required the waveforms are
divided into groups (see table 1), and the user need only check those groups which are
appropriate for the high-voltage tests to be performed in his laboratory.
The detailed studies of methods for the evaluation of parameters has revealed (or
emphasized) some fundamental problems with the definitions of some parameters. The use
of digital techniques provides an opportunity to improve the definition of some parameters,
such as time-to-peak, and the classification of overshoot and oscillations. These matters are
still under consideration.

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SIST EN 61083-2:1998
9 —
1083-2 © IEC:1996 —
DIGITAL RECORDERS FOR MEASUREMENTS IN
VOLTAGE IMPULSE TESTS -
HIGH -
Part 2: Evaluation of software used for the determination of
the parameters of impulse waveforms
1 Scope
This part of IEC 1083 is applicable to the processing of records taken by digital recorders
used for measurements during tests with high-voltage impulses and high current impulses
as specified in IEC 60. It specifies the test procedures to be applied to assess the accuracy
of software used to process and read the records of impulses and calibration signals.
This part:
defines the terms specifically related to digital processing;
—
establishes the tests which are necessary to show that software is compatible with the
—
requirements of IEC 60-1 and IEC 1083-1;
— specifies limits on estimates of the values of parameters of the reference waveforms;
gives the requirements for the record of performance.
—
NOTE — For waveforms not specified in IEC 60, for example waveforms accepted in tests of transformers and
arresters, it is recommended to evaluate the impulse parameters from the raw data in the traditional way
prescribed by the relevant technical committee.
2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 1083. At the time of publication, the editions
indicated were valid. All normative documents are subject to revision, and parties to
agreements based on this part of IEC 1083 are encouraged to investigate the possibility of
applying the most recent editions of the normative documents indicated below. Members of
IEC and ISO maintain registers of currently valid International Standards.
High-voltage test techniques — Part 1: General definitions and test
IEC 60-1: 1989,
requirements
IEC 60-2: 1994, High-voltage test techniques — Part 2: Measuring systems
Digital recorders for measurements in high-voltage impulse tests —
IEC 1083-1: 1991,
Part 1: Requirements for digital recorders

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SIST EN 61083-2:1998
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1083-2 © IEC:1996
3 Definitions
For the purposes of this part of IEC 1083, the following definitions apply.
Terms defined in the referenced subclauses of IEC 1083-1
3.1
– output of a digital recorder 1.4.2
full-scale deflection 1.4.7
–
1.4.9
– average code bin width
1.4.12
– sampling rate
– record length 1.4.14
1.4.6
– rated resolution
– internal noise level 2.2.3
3.2 offset: Output for zero input.
raw data: Original record of sampled and quantized information obtained when a
3.3
digital recorder converts an analog signal into digital form.
The correction of the output for offset to give a zero-based record is permitted, as is
multiplying the record by a constant scale factor: records processed in this way are still
considered as raw data.
NOTES
1 This information may be made available in binary, octal, hexadecimal or decimal form.
2 Raw data are available from most digital recorders, but not from all.
processed data: Data obtained by any processing (other than correction for offset
3.4
and/or multiplying by a constant scale factor) of the raw data.
NOTE – Automatically processed data are not covered by IEC 1083-1 nor by this standard (see clause 9).
Waveform supplied by the test data generator (TDG) for testing
3.5 reference waveform:
software.
3.6 trigger delay: Elapsed time from the occurrence of a trigger event to the time at
which a specified data sample is recorded.
NOTES
1 Delayed mode: the specified data sample is the first sample in the record.
2 Pre-trigger mode: the specified sample is selected part of the way through the record.
3 In the TDG, the time scale origin is set equal to the instant of trigger and the pre-trigger amount is specified
as a percentage of the record.

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SIST EN 61083-2:1998
1083-2 © IEC:1996 - 13 -
4 Test data generator (TDG)
The test data generator (TDG) is a computer program which generates reference waveforms
with specified parameters. The TDG is an integral part of this standard and is provided as
or for another computer compatible to it) on a
compiled code (for an IBM TM-PC computer 1)
floppy disk. It is a menu-driven program, which can be used without additional instructions;
however, operating instructions are given in annex B.
Reference waveforms are drawn from three sources:
analytically defined impulses without superimposed noise;
-
- the same analytically defined impulses with superimposed noise;
- impulses recorded under normal test conditions.
5 Software validation
Software may be validated for the evaluation of one or more sets of the following impulse
parameters (definitions of these parameters are given in IEC 60-1):
peak value of voltage/current
Up/Ip
T1 - front time
T2 — time to half-value
Tc - time to chopping
Tp - time to peak (see annex C)
13, i — overshoot, duration of overshoot
A, f - amplitude and frequency of oscillations
Any parameter for which the software is validated shall be evaluated for all reference
waveforms in each selected waveform group, for example, waveform group LI (reference
waveforms 1 and 6). The classification of the reference waveforms is given in table 1.
The settings of the TDG shall be chosen to match the settings of the digital recorder (or
recorders) which is to be used with the software (see 5.4). The resulting TDG record
simulates the output of this digital recorder when recording the selected reference
waveform. The 15 reference waveforms calculated for the selected settings of the TDG are
shown in annex A. The prescribed limits to be met by the software being tested are given in
table 2.
5.1 Test procedure
Each reference waveform from the waveform group selected by the user is generated by the
TDG and is input to the software in lieu of an actual output of the digital recorder. The
values of the parameters determined by the software under test are compared with the limits
given in table 2. The software under test passes the test for each set if all the values of that
parameter set are within the specified limits.
-PC is the trade name of a product supplied by IBM Corporation. This information is given for the
1) IBM TM
convenience of users of this International Standard and does not constitute an endorsement by IEC of the product
named. Equivalent products may be used if they can be shown to lead to the same results.

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SIST EN 61083-2:1998
1083-2 © IEC:1996 – 15 –
Evaluation procedure
5.2
Waveforms (reference and test) shall be evaluated according to the requirements given in
18.1, 18.1.3 and 19.2 of IEC 60-1, as stated below:
18.1 Definitions of general applicability
These definitions apply to impulses without oscillations or overshoot, or to the mean
curve drawn through the oscillations and overshoot.
18.1.3 Value of the test voltage
For a lightning impulse without oscillations, the value of the test voltage is its peak value.
The determination of the peak value in the case of oscillations or overshoot is considered
in 19.2.
19.2 Tolerances
With some test circuits, oscillations or an overshoot may occur at the peak of the impulse
(see figure 1). If the frequency of such oscillations is not less than 0,5 MHz or the
duration of overshoot not more than 1 µs, a mean curve should be drawn as in figures
10a and 10b and, for the purpose of measurement, the maximum amplitude of this curve
is chosen as the peak value defining the value of the test voltage.
Overshoot or oscillations in the neighbourhood of the peak, measured by a system
according to IEC 60-3*, are tolerated provided their single peak amplitude is not larger
than 5 % of the peak value. In commonly used impulse generator circuits, oscillations on
that part of the wavefront during which the voltage does not exceed 90 % of the peak
value have generally negligible influence on test results. If the relevant Technical
Committee finds these are of importance, it is recommended that their amplitudes,
measured by a suitable measuring device, as specified in IEC 60-3, are under the
straight line drawn through the points A' B' (refer to figure 12 of IEC 60-1). These points
are taken on the verticals of, respectively, the points A and B determined according to
18.1.4, the distance AA' being equal to 25 %, and BB' to 5 % of the peak value.
Figures 10a to 10d of IEC 60-1 are reproduced here as figure 1. For the examples a and b
given in figure 1, the peak value is the peak value of the mean curve; T 1 and T2 are found
from the mean curve.
by evaluating t30 , t90 and t50
For the examples c and d given in figure 1, the peak value is taken from the raw data
2 are found by evaluating and t50 from the raw
(smoothed on a local basis); T 1 and T
t30 , t90
data.
Now replaced by IEC 60-2.

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SIST EN 61083-2:1998
1083-2 © IEC:1996 – 17 –
5.3 Data format
The reference waveforms generated by the TDG simulate raw data obtained from the digital
recorder of the user. The reference waveforms are written as time/magnitude pairs in ASCII
format. Their respective values are given in terms of seconds and volts (or amperes). If the
data format/range expected by the software under test does not correspond to the
format/range provided by the TDG, a suitable conversion program should be used.
NOTE – Software which cannot read TDG reference waveforms (either in the direct or converted form) is not
covered by this standard.
5.4 Setting characteristics
The characteristics of the TDG shall be chosen to
...