SIST EN 130800:2002

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Sectional specification: Tantalum surface mounting capacitorsRahmenspezifikation: Oberflächenmontierbare TantalkondensatorenSpécification intermédiaire: Condensateurs au tantale pour montage en surfaceSectional Specification: Tantalum surface mounting capacitors31.060.40Tantalski elektrolitni kondenzatorjiTantalum electrolytic capacitorsICS:Ta slovenski standard je istoveten z:EN 130800:2000SIST EN 130800:2002en01-september-2002SIST EN 130800:2002SLOVENSKI
STANDARD



SIST EN 130800:2002



EUROPEAN STANDARD
EN 130800 NORME EUROPÉENNE EUROPÄISCHE NORM
October 2000 CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2000 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 130800:2000 E
ICS 31.060.40 Supersedes CECC 30 800:1990
English version
Sectional Specification:
Tantalum surface mounting capacitors
Spécification intermédiaire: Condensateurs au tantale pour
montage en surface
Rahmenspezifikation: Oberflächenmontierbare Tantalkondensatoren
This European Standard was approved by CENELEC on 1997-03-11. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic, Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Netherlands, Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.
SIST EN 130800:2002



Page 2 EN 130800:2000 Foreword
This European Standard was prepared by the Technical Committee CENELEC TC 40XA, Capacitors.
The text of this European Standard consists of the text ratified on 1993-09-15 and two amendments ratified respectively on 1996-12-09 (prAA) and 1997-03-11 (prAB), when it was decided to publish the combined text as EN 130800.
This European Standard supersedes CECC 30 800:1990.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement
(dop) 2001-05-01 – latest date by which the national standards conflicting
with the EN have to be withdrawn
(dow) 2001-05-01 __________
SIST EN 130800:2002



Page 3 EN 130800:2000
Contents
Page
1 General.4
1.1 Scope.4 1.2 Related documents.4 1.3 Information to be given in a detail specification.4 1.4 Terminology.5 1.5 Marking.6
2 Preferred ratings and characteristics .7
2.1 Preferred climatic categories.7 2.2 Preferred values of ratings.7
3 Quality assessment procedures.8
3.1 Primary stage of manufacture.8 3.2
Structurally similar components.8 3.3 Certified test records.8 3.4 Qualification approval.8 3.5 Quality conformance inspection.9
4 Test and measurement procedures.10
4.1 Preliminary drying.10 4.2 Measuring conditions.10 4.3 Mounting.10 4.4 Visual examination and check of dimensions.11 4.5 Electrical tests.11
4.6 Resistance to soldering heat.12
4.7 Solderability.13
4.8 Shear (adhesion) test.13
4.9 Substrate bending test.13
4.10 Rapid change of temperature.14
4.11 Climatic sequence.14
4.12 Damp heat, steady state.14
4.13 Characteristics at high and low temperature.15
4.14 Surge voltage.15
4.15 Endurance.15
4.16 Reverse voltage.16
4.17 Component solvent resistance.16
4.18 Solvent resistance of the marking.16
Annex A - Test plans for assessment level E.17
Table A.1 - Test plan for qualification approval .17 Table A.2 - Test plan for quality conformance inspection - lot-by-lot tests.18 Table A.3 - Test plan for quality conformance inspection - periodic tests.19
Annex B - Test plans for assessment level EZ.20 Table B.1 - Test plan for qualification approval - Assessment level EZ.20 Table B.2 - Test plan for quality conformance inspection - lot-by-lot tests.21 Table B.3 - Test plan for quality conformance inspection - periodic tests.22
Annex C -
Test schedule for assessment levels E and EZ .23
SIST EN 130800:2002



Page 4 EN 130800:2000 1 General
1.1 Scope
This specification applies to tantalum solid electrolyte surface mounting capacitors.
These capacitors are primarily intended to be mounted directly onto substrates for hybrid circuits or onto printed boards.
Two styles are considered: Style 1: protected capacitors
Style 2: unprotected capacitors.
The object of this specification is to prescribe preferred ratings and characteristics and selects from the generic specification EN 130000 the appropriate quality assessment procedures, tests and measuring methods and gives general performance requirements for this type of capacitor.
1.2 Related documents
EN 130000 Generic Specification: Fixed capacitors
IEC 60062 Marking codes for resistors and capacitors (harmonized as EN 60062)
IEC 60063:1963 Preferred number series for resistors and capacitors + A1:1967 + A2:1977
IEC 60068 Basic environmental testing procedures (harmonized in the HD 323 and EN 60068 series)
IEC 60384-3 Fixed capacitors for use in electronic equipment --
Part 3: Sectional specification: Fixed tantalum chip capacitors
IEC 60410 Sampling plans and procedures for inspection by attributes
ISO 3 Preferred numbers - Series of preferred numbers
NOTE
The above references apply to the current editions, except for IEC 60063 for which the referenced edition must be used.
1.3 Information to be given in a detail specification
Detail specifications shall be derived from the relevant blank detail specification.
Detail specifications shall not specify requirements inferior to those of the generic, sectional or blank detail specification.
When more severe requirements are included, they shall be listed in 1.9 of the detail specification and indicated in the test schedules, for example by an asterisk.
The following information shall be given in each detail specification and the values quoted shall preferably be selected from those given in the appropriate clause of this sectional specification.
1.3.1
Outline drawing and dimensions
The detail specification shall give an illustration of the capacitor as an aid to easy recognition and for comparison of the capacitor with others. Dimensions and their associated tolerances, which affect interchangeability and mounting, shall be given.
All dimensions are to be stated in mm.
NOTE
The information given in 1.3.1 may for convenience, be presented in tabular form.
SIST EN 130800:2002



Page 5 EN 130800:2000 Normally the numerical values shall be given for the length, the width and height of the body.
When necessary, for example when a number of case sizes are covered by a detail specification, the dimensions and their associated tolerances shall be placed in a table below the drawing.
When the configuration is other than described above, the detail specification shall state such dimensional information as will adequately describe the capacitor.
1.3.2
Mounting
The detail specification shall give guidance on methods of mounting for normal use.
Mounting for test and measurement purposes (if required) shall be in accordance with 4.3.
1.3.3
Ratings and characteristics
The ratings and characteristics shall be in accordance with the relevant clauses of this specification, together with the following:
1.3.3.1
Rated capacitance range
See 2.2.1.
NOTE
When products approved to the detail specification have different ranges, the following statement should be added: "The range of capacitance values available in each voltage range is given in the Qualified Product List (QPL)”.
1.3.3.2
Particular characteristics
Additional characteristics may be listed, when they are considered necessary to specify adequately the component for design and application purposes.
1.3.4
Marking
The detail specification shall specify the content of the marking on the capacitor and on the package.
Deviations from 1.5 of this sectional specification shall be specifically stated.
1.4 Terminology
In addition to the applicable terms and definitions of EN 130000 the following definitions apply:
1.4.1
Surface mounting capacitor
A capacitor whose small dimensions and nature or shape of terminations make it suitable for surface mounting in hybrid circuits and on printed boards.
1.4.2
Rated voltage (UR)
The rated voltage is the maximum DC voltage which may be applied continuously to a capacitor at the rated temperature.
NOTE 1
The sum of the DC voltage and the peak AC voltage applied to the capacitor shall not exceed the rated voltage.
NOTE 2
For short periods, however, the rated voltage may be exceeded (see 2.2.5 and 4.14).
SIST EN 130800:2002



Page 6 EN 130800:2000 1.5 Marking
See 2.4 of EN 130000 with the following details:
1.5.1
The information given in the marking is normally selected from the following list; the relative importance of each item is indicated by its position in the list:
(1) Polarity of the terminations (unless identified by the construction);
(2) Rated capacitance;
(3) Rated voltage (DC voltage may be indicated by the symbol
or
⎯⎯);
(4) Tolerance on rated capacitance;
(5) Style (in accordance with 1.1);
(6) Year and month (or week) of manufacture;
(7) Manufacturer's name or trade mark;
(8) Climatic category;
(9) Manufacturer's type designation;
(10) Reference to the detail specification.
1.5.2
Surface mounting capacitors are generally not marked on the body.
If some marking can be applied, they shall be clearly marked with as many as possible of the above items as is considered useful.
Designation of polarity is a mandatory item.
Any duplication of information in the marking on the capacitor should be avoided.
1.5.3
Any marking shall be legible and not easily smeared or removed by rubbing with the finger.
1.5.4
The package containing the capacitor(s) shall be marked with all the information listed in 1.5.1, except polarity, unless this is applicable to the method of packaging.
1.5.5
Any additional marking shall be so applied that no confusion can arise.
1.5.6
Where space does not permit the marking of the capacitor in accordance with IEC 60062 the following code may be used.
Capacitance coding:
The rated capacitance value in picofarad is given by the following letter and digit code.
Letter Value
Digit Multiplier A 1,0
9 10-1 C 1,2
0 100 E 1,5
1 101 G 1,8
2 102 J 2,2
3 103 L 2,7
4 104 N 3,3
5 105 Q 3,9
6 106 S 4,7
7 107 U 5,6
8 108 W 6,8
Y 8,2
SIST EN 130800:2002



Page 7 EN 130800:2000
Voltage coding:
Rated voltage 2 4 6,310 16 20 25 35 50 Code letter Z G J A C D E V T
EXAMPLE: W6G = 6,8 µF 4V
2 Preferred ratings and characteristics
The values given in the detail specification shall preferably be selected from the following:
2.1 Preferred climatic categories
The capacitors covered by this specification are classified into climatic categories according to the general rules given in IEC 60068-1.
The lower and upper category temperature and the duration of the damp heat, steady state test shall be chosen from the following:
Lower category temperature: - 55 oC
Upper category temperature: + 85 oC and + 125 oC
Duration of the damp heat, steady state test: Style 1:
21 and 56 days
Style 2:
---.
The severities for the cold and dry heat tests are the lower and the upper category temperatures respectively.
2.2 Preferred values of ratings
2.2.1
Rated capacitance (CR)
Preferred values of rated capacitance are
1,0 - 1,5 - 2,2 - 3,3 - 4,7 - 6,8 and their decimal multiples.
These values conform to the E6 series of preferred values given in IEC 60063: Preferred number series for resistors and capacitors.
2.2.2
Tolerances on rated capacitance
Preferred tolerances on rated capacitance are
± 10 % and ± 20 %.
2.2.3
Rated voltage (UR)
The preferred values of rated voltage taken from the R5 series of IS0 3 are
1,0 - 1,6 - 2,5 - 4,0 - 6,3 V and their decimal multiples.
If other values are required they shall preferably be chosen from the R10 series.
SIST EN 130800:2002



Page 8 EN 130800:2000 2.2.4
Category voltage (UC)
For capacitors having an upper category temperature of 125 oC category voltages are given in the following table:
UR (V) 2,5 4 6,3 10 16 25 40 63 100UC (V) 1,6 2,5 4 6,310 16 25 40 63
2.2.5
Surge voltage
The surge voltage shall be 1,3 times the rated voltage or 1,3 times the category voltage rounded off to the nearest volt.
2.2.6
Rated temperature
The standard value of rated temperature is 85 oC.
3 Quality assessment procedures
3.1 Primary stage of manufacture
The primary stage of manufacture is the forming of the tantalum oxide dielectric.
3.2 Structurally similar components
Capacitors considered as being structurally similar are capacitors produced with similar processes and materials, though they may be of different case sizes and capacitance and voltage values.
3.3 Certified test records
The information required in 3.9 of EN 130000 shall be made available when prescribed in the detail specification and when requested by a purchaser.
After the endurance test the parameters for which variables information is required are the capacitance change, tangent of loss angle and the leakage current.
3.4 Qualification approval
The procedures for qualification approval testing are given in 3.5 of the generic specification EN 130000.
The schedule to be used for qualification approval testing on the basis of lot-by-lot and periodic tests is given in 3.5 of this specification.
The procedure using a fixed sample size schedule is given in 3.4.1 and 3.4.2 below.
3.4.1
Sampling
The fixed sample size procedure is described in 3.5.3(2) of EN 130000. The sample shall be representative of the range of capacitors for which approval is sought.
This may or may not be the complete range covered by the detail specification. The sample shall consist of specimens having the lowest and highest voltages, and for these voltages the smallest and largest case size.
When there are more than four case sizes an intermediate case size shall also be tested.
In each of these case size/voltage combinations (values) the highest capacitance shall be chosen.
Thus for the approval of a range, testing is required of either four or six values.
When the range consists of less than four values, the number of specimens to be tested shall be that required for four values.
SIST EN 130800:2002



Page 9 EN 130800:2000 Spare specimens are permitted as follows:
(1)
0ne per value which may be used to replace the permitted non-conforming items in Group 0.
(2)
0ne per value which may be used as replacements for specimens which are non-conforming because
of incidents not attributable to the manufacturer.
The numbers given in Group 0 assume that all groups are applicable. If this is not so the numbers may be reduced accordingly.
When additional groups are introduced into the qualification approval test schedule, the number of specimens required for Group 0 shall be increased by the same number as that required for the additional groups.
Table A.1 or B.1 gives the number of samples to be tested in each group or sub-group together with the permissible number of non-conforming items for qualification approval tests.
3.4.2
Tests
The complete series of tests for selected assessment level given in Tables A.1 to A.3, respectively in Tables B.1 to B.3 and the test schedule given in annex C are required for the approval of capacitors covered by one detail specification.
The tests of each group shall be carried out in the order given.
The whole sample shall be subjected to the tests of Group 0 and then divided for the other groups.
Non-conforming specimens found during the tests of Group 0 shall not be used for the other groups.
"0ne non-conforming item" is counted when a capacitor has not satisfied the whole or a part of the tests of a group.
The approval is granted when the number of non-conforming items does not exceed the specified number of permissible non-conforming items for each group or sub-group and the total number of permissible non-conforming items.
NOTE 1
Table A.1 and Table C.1 or Table B.1 and Table C.1 together form the fixed sample size test schedule.
Annex A or B includes the details for the sampling and permissible non-conforming items for the different tests or groups of tests whereas annex C together with the details of test contained in clause 4 give a complete summary of test conditions and performance requirements indicate where, for example for the test method or conditions of test, a choice has to be made in the detail specification.
NOTE 2
The conditions of test and performance requirements for the fixed sample size test schedule shall be identical to those prescribed in the detail specification for quality conformance inspection.
3.5 Quality conformance inspection
3.5.1
Formation of inspection lots
3.5.1.1
Groups A and B inspection
These tests shall be carried out on a lot-by-lot basis according to test plan for selected assessment level in Table A.2 or B.2.
A manufacturer may aggregate the current production into inspection lots subject to the following safeguards:
(1) The inspection lot shall consist of structurally similar capacitors (see 3.2).
(2a) The sample tested shall be representative of the values and dimensions contained in the
inspection lot:
- in relation to their number
- with a minimum of five of any one value
SIST EN 130800:2002



Page 10 EN 130800:2000 (2b) If there are less than five of any one value in the sample the basis for the drawing of samples shall be agreed between the manufacturer and the National Supervising Inspectorate.
3.5.1.2
Group C inspection
These tests shall be carried out on a periodic basis according to the test plan for selected assessment level in Table
A.3 or B.3.
Samples shall be representative of the current production of the specified periods and shall be divided into small, medium and high sizes.
In order to cover the range of approvals in any period one voltage shall be tested from each group of sizes.
In subsequent periods other sizes and/or voltage ratings in production shall be tested with the aim of covering the whole range of approval.
3.5.2
Test schedule
The test schedule for qualification approval is given in annex C.
3.5.3
Delayed delivery
When according to the procedures of 3.11 of EN 130000 re-inspection has to be made, solderability, capacitance and leakage current shall be checked as specified in Group A and B inspection.
3.5.4
Assessment levels
The assessment level(s) given in the blank detail specification shall preferably be selected from Table A.2/A.3 respectively Table B.2/B.3.
4 Test and measurement procedures
This clause supplements the information given in clause 4 of EN 130000.
4.1 Preliminary drying
If prescribed in the detail specification for Style 2 capacitors, the conditions as given in 4.3 of EN 130000 apply.
4.2 Measuring conditions
Capacitors of Style 2 shall be measured at a relative humidity of 25 % to 75 %.
4.3 Mounting
See 4.33 of EN 130000 with the following details:
4.3.1
Mounting conditions
The detail specification shall specify the soldering process to be used and the SMD classification given in 6.2 of CECC 00802.
4.3.2
Final inspection, measurements and requirements
The capacitors shall be visually examined and measured and meet the requirements of annex C.
SIST EN 130800:2002



Page 11 EN 130800:2000 4.4 Visual examination and check of dimensions
See 4.4 of EN 130000 with the following details:
4.4.1
Visual examination
Visual examination shall be carried out with suitable equipment with approximately 10x magnification and lighting appropriate to the specimen under test and the quality level required.
NOTE
The operator should have available facilities for incident or transmitted illumination as well as an appropriate measuring facility.
4.4.2
Requirements
The capacitors shall be examined to verify that the materials, design, construction, physical dimensions and workmanship are in accordance with the applicable requirements given in the detail specification.
4.5 Electrical tests
4.5.1
Leakage current
See 4.9 of EN 130000 with the following details:
4.5.1.1
Measuring conditions
The rated voltage shall be applied across the capacitor and its protective resistor.
The protective resistor shall have a value of 1 000 ohms.
4.5.1.2
Requirement
The leakage current at 20°C shall not exceed 0,02xCRUR µA/(µFxV) or I µA, whichever is the greater.
4.5.2
Capacitance
See 4.7 of EN 130000 with the following details:
4.5.2.1
Measuring conditions
The capacitance shall be measured at a frequency of 100 Hz or 120 Hz.
The alternating voltage actually applied across the capacitor terminations shall not exceed 0,5 V AC r.m.s.
A DC bias voltage of 2,1 V to 2,5 V may be applied during the measurement.
The inaccuracy of the measurement instrument shall not exceed ± 2% of the specified limit, whether this is given as an absolute value or as a change of capacitance.
NOTE
Measurement without a polarizing voltage is optional.
4.5.2.2
Requirement
The capacitance shall correspond to the rated value taking into account the tolerance.
4.5.3
Tangent of loss angle
See 4.8 of EN 130000 with the following details:
4.5.3.1
Measuring conditions
The measurement shall be made under the conditions of 4.5.2. The inaccuracy of the measuring equipment shall not exceed 0,01 absolute value.
SIST EN 130800:2002



Page 12 EN 130800:2000 4.5.3.2
Requirement
The tangent of loss angle (at 20 °C) shall not exceed the following limits:
0,06 for CR < 100 µF
0,08 for CR ≥ 100 µF
4.5.4
Impedance
(if required by the detail specification)
See 4.10 of EN 130000 with the following details:
4.5.4.1
Measuring conditions
The ambient temperature shall be (20 ± 2) °C.
The AC of the measuring voltage shall not exceed 0,5 V AC r.m.s.
A DC bias voltage of 2.1 to 2.5 V may be applied during the measurement.
The frequency of the measuring voltage shall be 100 kHz.
The error of measurement shall not exceed 10% of the requirement.
4.5.4.2
Requirements
The impedance shall meet the requirements of the detail specification.
4.5.5
Equivalent series resistance
(if required by the detail specification)
See 4.41 of EN 130000 with the following details:
4.5.5.1
Measuring conditions
The ambient temperature shall be (20 ± 2) °C.
The AC of the measuring voltage shall not exceed 0,5 V AC r.m.s.
A DC bias voltage of 2.1 to 2.5 V may be applied during the measurement.
The frequency of the measuring voltage shall be 100 kHz.
The error of measurement shall not exceed 10% of the requirement.
4.5.5.2
Requirements
The ESR shall meet the requirements of the detail specification.
4.6 Resistance to soldering heat
See 4.14 of EN 130000 with the following details:
4.6.1
Initial measurement
The capacitance and the tangent of loss angle shall be measured according to 4.5.2 respectively 4.5.3.
4.6.2
Conditions of test
The detail specification shall prescribe which attitude is required.
SIST EN 130800:2002



Page 13 EN 130800:2000 4.6.3
Final inspection, measurements and requirements
The capacitors shall be visually examined and measured and shall meet the following requirements:
Under normal lighting and approximately 10x magnification there shall be no signs of damage such as cracks. Dissolution of the metallization (leaching) shall not exceed 25% of the length of the edges and 10 % of the areas both to be examined as defined in the detail specification.
The capacitance and tangent of loss angle shall be measured.
They shall not exceed the limits specified in the detail specification.
4.7 Solderability
See 4.15 of EN 130000 with the following details:
4.7.1
Conditions of test
The detail specification shall prescribe the temperature and immersion time for the test.
4.7.2
Final inspection, measurements and requirements
The surface mounting capacitor shall then be visually examined under normal lighting and approximately 10x magnification.
There shall be no signs of damage.
The areas and edges to be examined as defined in the detail specification shall be covered with a smooth and bright solder coating with no more than a small amount of scattered imperfections such as pinholes or un-wetted or de-wetted areas.
These imperfections shall not be concentrated in one area.
4.8 Shear (adhesion) test
See 4.34 of EN 130000 with the following details:
4.8.1
Initial requirements
Not required (see Group 3).
4.8.2
Final measurements and requirements
The capacitors shall be visually examined and measured and meet the requirements of annex C.
4.9 Substrate bending test
(not applicable to surface mounting capacitors, which according to their detail specification shall only be mounted on alumina substrates.).
See 4.35 of EN 130000 with the following details:
4.9.1
Initial measurements
Not required (see Group 3).
4.9.2
Conditions of test
The detail specification shall prescribe the amount of deflection and the number of bends.
4.9.3
Final measurements and requirements
The capacitors shal
...