SIST EN 60444-6:2014

SLOVENSKI STANDARD
SIST EN 60444-6:2014
01-januar-2014
1DGRPHãþD
SIST EN 60444-6:2002
0HULWYHSDUDPHWURYNYDUþQRNULVWDOQLKHQRWGHO0HUMHQMHRGYLVQRVWLRGUDYQL
QDSDMDQMD
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level
dependence (DLD)
/
Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance
du niveau d'excitation (DNE)
Ta slovenski standard je istoveten z: EN 60444-6:2013
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60444-6:2014 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 60444-6:2014

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SIST EN 60444-6:2014

EUROPEAN STANDARD
EN 60444-6

NORME EUROPÉENNE
October 2013
EUROPÄISCHE NORM

ICS 31.140 Supersedes EN 60444-6:1997


English version


Measurement of quartz crystal unit parameters -
Part 6: Measurement of drive level dependence (DLD)
(IEC 60444-6:2013)


Mesure des paramètres des résonateurs  Messung von Schwingquarz-Parametern -
à quartz - Teil 6: Messung der
Partie 6: Mesure de la dépendance du Belastungsabhängigkeit (DLD)
niveau d'excitation (DNE) (IEC 60444-6:2013)
(CEI 60444-6:2013)




This European Standard was approved by CENELEC on 2013-07-24. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60444-6:2013 E

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SIST EN 60444-6:2014
EN 60444-6:2013 - 2 -
Foreword
The text of document 49/1004/CDV, future edition 2 of IEC 60444-6, prepared by IEC/TC 49,
"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 60444-6:2013.
The following dates are fixed:
(dop) 2014-04-24
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2016-07-24

standards conflicting with the
document have to be withdrawn

This document supersedes EN 60444-6:1997.
EN 60444-6:2013 includes the following significant technical changes with respect to
EN 60444-6:1997:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal
modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to
upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference
measurement method was introduced into this specification.

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.

Endorsement notice
The text of the International Standard IEC 60444-6:2013 was approved by CENELEC as a European
Standard without any modification.

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SIST EN 60444-6:2014
- 3 - EN 60444-6:2013
Annex ZA
(normative)
Normative references to i nternational publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year



IEC 60444-1 - Measurement of quartz crystal unit EN 60444-1 -
parameters by zero phase technique
in a pi-network -
Part 1: Basic method for the measurement
of resonance frequency and resonance
resistance of quartz crystal units by zero
phase technique in a pi-network


IEC 60444-5 - Measurement of quartz crystal unit EN 60444-5 -
parameters -
Part 5: Methods for the determination of
equivalent electrical parameters using
automatic network analyzer techniques and
error correction


IEC 60444-8 - Measurement of quartz crystal unit EN 60444-8 -
parameters -
Part 8: Test fixture for surface mounted
quartz crystal units

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SIST EN 60444-6:2014

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SIST EN 60444-6:2014



IEC 60444-6

®


Edition 2.0 2013-06




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE











Measurement of quartz crystal unit parameters –

Part 6: Measurement of drive level dependence (DLD)




Mesure des paramètres des résonateurs à quartz –

Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)
















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE

PRICE CODE
INTERNATIONALE

CODE PRIX R


ICS 31.140 ISBN 978-2-83220-876-2



Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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SIST EN 60444-6:2014
– 2 – 60444-6  IEC:2013
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 DLD effects . 6
3.1 Reversible changes in frequency and resistance . 6
3.2 Irreversible changes in frequency and resistance . 6
3.3 Causes of DLD effects . 7
4 Drive levels for DLD measurement . 7
5 Test methods. 8
5.1 Method A (Fast standard measurement method) . 8
5.1.1 Testing at two drive levels . 8
5.1.2 Testing according to specification . 8
5.2 Method B (Multi-level reference measurement method) . 9
Annex A (normative) Relationship between electrical drive level and mechanical
displacement of quartz crystal units . 11
Annex B (normative) Method C: DLD measurement with oscillation circuit . 14
Bibliography . 19

Figure 1 – Maximum tolerable resistance ratio γ for the drive level dependence as a
function of the resistances R or R . 9
r2 r3
Figure B.1 – Insertion of a quartz crystal unit in an oscillator . 14
Figure B.2 – Crystal unit loss resistance as a function of dissipated power . 15
Figure B.3 – Behaviour of the R of a quartz crystal units . 16
r
Figure B.4 – Block diagram of circuit system . 16
Figure B.5 – Installed −R in scanned drive level range . 17
osc
Figure B.6 – Drive level behavior of a quartz crystal unit if −R = 70 Ω is used as
osc

test limit in the “Annex B” test . 17
Figure B.7 – Principal schematic diagram of the go/no-go test circuit . 18

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SIST EN 60444-6:2014
60444-6  IEC:2013 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 6: Measurement of drive level dependence (DLD)

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-6 has been prepared by lEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This second edition cancels and replaces the first edition published in 1995. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD
abnormal modes at present time. Therefore, this method made the transition to the
Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in
order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level
reference measurement method was introduced into this specification.

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SIST EN 60444-6:2014
– 4 – 60444-6  IEC:2013
The text of this standard is based on the following documents:
CDV Report on voting
49/1004/CDV 49/1038/RVC

Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60444 series, published under the general title Measurement of
quartz crystal unit parameters, can be found on the IEC website.

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SIST EN 60444-6:2014
60444-6  IEC:2013 – 5 –
INTRODUCTION
The drive level (expressed as power/voltage across or current through the crystal unit) forces
the resonator to produce mechanical oscillations by way of piezoelectric effect. In this process,
the acceleration work is converted to kinetic and elastic energy and the power loss to heat.
The latter conversion is due to the inner and outer friction of the quartz resonator.
The frictional losses depend on the velocity of the vibrating masses and increase when the
oscillation is no longer linear or when critical velocities, elongations or strains, excursions or
accelerations are attained in the quartz resonator or at its surfaces and mounting points (see
Annex A). This causes changes in resistance and frequency, as well as further changes due
to the temperature dependence of these parameters.
At “high” drive levels (e.g. above 1 mW or 1 mA for AT-cut crystal units) changes are
observed by all crystal units and these also can result in irreversible amplitude and frequency
changes. Any further increase of the drive level may destroy the resonator.
Apart from this effect, changes in frequency and resistance are observed at “low” drive levels
in some crystal units, e.g. below 1 mW or 50 µA for AT-cut crystal units). In this case, if the
loop gain is not sufficient, the start-up of the oscillation is difficult. In crystal filters, the
transducer attenuation and ripple will change.
Furthermore, the coupling between a specified mode of vibration and other modes (e.g. of the
resonator itself, the mounting and the back-fill gas) also depends on the level of drive.
Due to the differing temperature response of these modes, these couplings give rise to
changes of frequency and resistance of the specified mode within narrow temperature ranges.
These changes increase with increasing drive level. However, this effect will not be
considered further in this part of IEC 60444.
The first edition of IEC 60444-6 was published in 1995. However, it has not been revised until
today. In the meantime the demand for tighter specification and measurement of DLD has
increased.
In this new edition, the concept of DLD in IEC 60444-6:1995 is maintained. However, the
more suitable definition for the user’s severe requirements was introduced. Also, the
specifications based on the matters arranged in the Stanford meeting in June, 2011 are taken
into consideration.

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SIST EN 60444-6:2014
– 6 – 60444-6  IEC:2013
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 6: Measurement of drive level dependence (DLD)



1 Scope
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of
quartz crystal units. Two test methods (A and C) and one referential method (B) are described.
“Method A”, based on the π-network according to IEC 60444-1, can be used in the complete
frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-
network or reflection method according to IEC 60444-1, IEC 60444-5 or IEC 60444-8 can be
used in the complete frequency range covered by this part of IEC 60444. “Method C”, an
oscillator method, is suitable for measurements of fundamental mode crystal units in larger
quantities with fixed conditions.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60444-1, Measurement of quartz crystal unit parameters by zero phase technique in a π-
network – Part 1: Basic method for the measurement of resonance frequency and resonance
resistance of quartz crystal units by zero phase technique in a π-network
IEC 60444-5, Measurement of quartz crystal units parameters – Part 5: Methods for the
determination of equivalent electrical parameters using automatic network analyzer
techniques and error correction
IEC 60444-8, Measurement of quartz crystal unit parameters – Part 8: Test fixture for surface
mounted quartz crystal units
3 DLD effects
3.1 Reversible changes in frequency and resistance
Reversible changes are changes in frequency and resistance occurring under the same drive
levels after repeated measurements made alternatively at low and high levels, or after
continuous or quasi-continuous measurements from the lowest to the highest level and back,
if these changes remain within the limits of the measurement accuracy.
3.2 Irreversible changes in frequency and resistance
Irreversible changes are significant changes in frequency and/or resistance occurring at low
level after an intermediate measurement at high level e.g. when a previously high resistance
at low level has changed in the repeated measurement to a low resistance. Especially, when
the crystal unit has not been operated for several days, its resistance may have changed back
to a high value when operated again at a lower level. Greater att
...