SIST EN 61747-6-3:2011

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.PRGXOHFlüssigkristall-Anzeige-Bauelemente -- Teil 6-3: Messverfahren für Bewegungsartefakte bei Aktiv-Matrix-LCD-ModulenDispositifs d’affichage à cristaux liquides - Partie 6-3: Méthodes de mesure pour les modules d’affichage à cristaux liquides - Mesure de l'artefact de mouvement dans les modules d'affichage à cristaux liquides à matrice activeLiquid crystal display devices - Part 6-3: Measuring methods for liquid crystal display modules - Motion artifact measurement of active matrix liquid crystal display modules31.120Elektronske prikazovalne napraveElectronic display devicesICS:Ta slovenski standard je istoveten z:EN 61747-6-3:2011SIST EN 61747-6-3:2011en01-december-2011SIST EN 61747-6-3:2011SLOVENSKI
STANDARD



SIST EN 61747-6-3:2011



EUROPEAN STANDARD EN 61747-6-3 NORME EUROPÉENNE
EUROPÄISCHE NORM September 2011
CENELEC European Committee for Electrotechnical Standardization Comité Européen de Normalisation Electrotechnique Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2011 CENELEC -
All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 61747-6-3:2011 E
ICS 31.120
English version
Liquid crystal display devices -
Part 6-3: Measuring methods for liquid crystal display modules -
Motion artifact measurement of active matrix liquid
crystal display modules (IEC 61747-6-3:2011)
Dispositifs d'affichage à cristaux liquides - Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux liquides -
Mesure de l'artefact de mouvement dans les modules d'affichage à cristaux liquides à matrice active (CEI 61747-6-3:2011)
Flüssigkristall-Anzeige-Bauelemente -
Teil 6-3: Messverfahren für Bewegungsartefakte bei Aktiv-Matrix-LCD-Modulen (IEC 61747-6-3:2011)
This European Standard was approved by CENELEC on 2011-08-17. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation under the responsibility of a CENELEC member into its own language and notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland and the United Kingdom.
SIST EN 61747-6-3:2011



EN 61747-6-3:2011 - 2 -
Foreword The text of document 110/296/FDIS, future edition 1 of IEC 61747-6-3, prepared by IEC TC 110, Flat panel display devices, was submitted to the IEC-CENELEC parallel vote and approved by CENELEC as EN 61747-6-3:2011.
The following dates are fixed: • latest date by which the document has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2012-05-17 • latest date by which the national standards conflicting with the document have to be withdrawn (dow) 2014-08-17
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such patent rights. Endorsement notice The text of the International Standard IEC 61747-6-3:2011 was approved by CENELEC as a European Standard without any modification. In the official version, for Bibliography, the following notes have to be added for the standards indicated: IEC 61747-1:2003 NOTE
Harmonized as EN 61747-1:1999 + A1:2003 (not modified). IEC 61747-5:1998 NOTE
Harmonized as EN 61747-5:1998 (not modified). ISO 9241-307 NOTE
Harmonized as EN ISO 9241-307. ISO 11664-4:2008 NOTE
Harmonized as EN ISO 11664-4:2011 (not modified).
SIST EN 61747-6-3:2011



- 3 - EN 61747-6-3:2011 Annex ZA (normative)
Normative references to international publications with their corresponding European publications
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies.
NOTE
When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD applies.
Publication Year Title EN/HD Year
IEC 61747-6 - Liquid crystal and solid-state display devices - Part 6: Measuring methods for liquid crystal modules - Transmissive type EN 61747-6 -
SIST EN 61747-6-3:2011



SIST EN 61747-6-3:2011



IEC 61747-6-3 Edition 1.0 2011-07 INTERNATIONAL STANDARD NORME INTERNATIONALE Liquid crystal display devices –
Part 6-3: Measuring methods for liquid crystal display modules – Motion artifact measurement of active matrix liquid crystal display modules
Dispositifs d'affichage à cristaux liquides –
Partie 6-3: Méthodes de mesure pour les modules d'affichage à cristaux
liquides – Mesure de l'artefact de mouvement dans les modules d'affichage
à cristaux liquides à matrice active
INTERNATIONAL ELECTROTECHNICAL COMMISSION COMMISSION ELECTROTECHNIQUE INTERNATIONALE T ICS 31.120 PRICE CODE CODE PRIX ISBN 978-2-88912-586-9
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale ®
SIST EN 61747-6-3:2011 colourinside



– 2 – 61747-6-3  IEC:2011 CONTENTS FOREWORD . 4 1 Scope . 6 2 Normative references . 6 3 Terms and definitions . 6 4 Abbreviations . 7 5 Standard measuring conditions . 7 5.1 Temperature, humidity and pressure conditions . 7 5.2 Illumination condition . 7 6 Standard motion-blur measuring methods . 8 6.1 General . 8 6.2 Direct measurement method . 8 6.2.1 Standard measuring process . 8 6.2.2 Test patterns . 8 6.2.3 Analysis method . 10 6.3 Indirect measurement method . 12 6.3.1 Temporal step response . 12 6.3.2 High speed camera . 15 7 Test report. 16 7.1 General . 16 7.2 Items to be reported . 16 7.2.1 Environmental conditions . 16 7.2.2 Display parameters . 16 7.2.3 Measuring method and conditions . 16 7.2.4 Analysis method . 16 Annex A (informative)
Subjective test method . 18 Annex B (informative)
Motion contrast degradation . 19 Annex C (informative)
Dynamic modulation transfer function . 21 Bibliography . 23
Figure 1 – Examples of edge blur test pattern . 8 Figure 2 – Example of a pivoting pursuit camera system . 9 Figure 3 – Example of a linear pursuit camera system . 9 Figure 4 – Example of luminance cross section profile of blurred edge . 11 Figure 5 – Example of luminance cross section profile of blurred edge . 11 Figure 6 – PBET calculation . 12 Figure 7 – Set-up to measure the temporal step response . 13 Figure 8 – Example of a LC response time measurement . 14 Figure 9 – Example of a motion picture response curve
derived from the response measurement presented in Figure 8,
and a convolution with a one frame wide window function. 15 Figure 10 – Example of measurement data reporting . 17 Figure B.1 – Example of motion contrast degradation test pattern . 19 Figure B.2 – Example of motion contrast degradation due to line spreading . 20 Figure C.1 – Example of motion contrast degradation . 21 SIST EN 61747-6-3:2011



61747-6-3  IEC:2011 – 3 – Figure C.2 – Example of DMTF properties for different motion speeds (V) . 22
Table 1 – Step response data for different luminance transitions . 10
SIST EN 61747-6-3:2011



– 4 – 61747-6-3  IEC:2011 INTERNATIONAL ELECTROTECHNICAL COMMISSION ___________
LIQUID CRYSTAL DISPLAY DEVICES –
Part 6-3: Measuring methods for liquid crystal display modules –
Motion artifact measurement of
active matrix liquid crystal display modules
FOREWORD 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International, governmental and non-governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions determined by agreement between the two organizations. 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international consensus of opinion on the relevant subjects since each technical committee has representation from all interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any misinterpretation by any end user. 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications transparently to the maximum extent possible in their national and regional publications. Any divergence between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter. 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any services carried out by independent certification bodies. 6) All users should ensure that they have the latest edition of this publication. 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and members of its technical committees and IEC National Committees for any personal injury, property damage or other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is indispensable for the correct application of this publication. 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent rights. IEC shall not be held responsible for identifying any or all such patent rights. International Standard IEC 61747-6-3 has been prepared by IEC technical committee 110: Flat panel display devices. The text of this standard is based on the following documents: FDIS Report on voting 110/296/FDIS 110/313/RVD
Full information on the voting for the approval on this standard can be found in the report on voting indicated in the above table. This publication has been drafted in accordance with the ISO/IEC Directives, Part 2. SIST EN 61747-6-3:2011



61747-6-3  IEC:2011 – 5 – A list of all parts of the IEC 61747 series, under the general title Liquid crystal display devices, can be found on the IEC website. Future standards in this series will carry the new general title as cited above. Titles of existing standards in this series will be updated at the time of the next edition. The committee has decided that the contents of this publication will remain unchanged until the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data related to the specific publication. At this date, the publication will be
• reconfirmed, • withdrawn, • replaced by a revised edition, or • amended.
IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates that it contains colours which are considered to be useful for the correct understanding of its contents. Users should therefore print this document using a colour printer.
SIST EN 61747-6-3:2011



– 6 – 61747-6-3  IEC:2011 LIQUID CRYSTAL DISPLAY DEVICES –
Part 6-3: Measuring methods for liquid crystal display modules –
Motion artifact measurement of
active matrix liquid crystal display modules
1 Scope This part of IEC 61747 applies to transmissive type active matrix liquid crystal displays. This standard defines general procedures for quality assessment related to the motion performance of LCDs. It defines artifacts in the motion contents and methods for motion artifact measurement. NOTE Motion blur measurement methods and analysis methods introduced in this standard could not be universal tools for all different LCD motion enhancement technologies due to its complexity. Users shall be notified of these circumstances. 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 61747-6, Liquid crystal and solid-state display devices – Part 6: Measuring methods for liquid crystal modules – Transmissive type 3 Terms and definitions For the purposes of this document, the following terms and definitions apply. 3.1
motion picture response curve a curve, representing the convolution of the temporal step response with a moving window function of 1-frame wide. It shows how the luminance is integrated over time during smooth pursuit eye tracking and combines the effects of the LCD response time and the hold-type characteristics of the device under test 3.2
motion induced edge profile luminance profile of an intrinsically sharp moving luminance transition when this transition is followed with smooth pursuit eye tracking along its motion trajectory NOTE The profile can be calculated from the motion picture response curve for any given motion speed. 3.3
edge blur blur that becomes visible on an intrinsically sharp transition between two adjacent areas, with a different luminance level, when the transition smoothly moves across the display as a function of time. NOTE Preconditions for this type of edge blur are smooth pursuit eye tracking of the object, and no obvious flicker, indicating that luminance integration with a frame period is allowed. This blur phenomenon is mainly caused by a slow response time of the liquid crystal cell in combination with the hold-type characteristics. SIST EN 61747-6-3:2011



61747-6-3  IEC:2011 – 7 – 3.4
perceived blurred edge time time-related equivalent of the perceived blurred edge width. The latter one is derived from the motion induced edge profile by means of filtering the edge profile with the contrast sensitivity function of the human eye 4 Abbreviations For the purpose of this document, the following abbreviations apply. BET blurred edge time BEW blurred edge width CCD charge-coupled device CIE Commission Internationale de l’Eclairage (international commission on illumination) CMOS complimentary metal-oxide semiconductor CSF contrast sensitivity function DMTF dynamic modulation transfer function DUT display under test DVI digital visual interface EBET extended blurred edge time FFT fast Fourier transform IEC International Electrotechnical Commission ISO International Organization for Standardization JND just noticeable difference LCD liquid crystal display LMD light measuring device LVDS low-voltage differential signaling MCD motion contrast degradation MPRC motion picture response curve MTF modulation transfer function PBET perceived blurred edge time PBEW perceived blurred edge width TN-LCD twisted nematic liquid crystal display VA-LCD vertically-aligned liquid crystal display 5 Standard measuring conditions 5.1 Temperature, humidity and pressure conditions The standard environmental condition for the motion artifact measurement is (25 ±=3) °C for temperature, 25 % to 85 % for relative humidity, and 86kPa to 106kPa for air pressure. All visual inspection tests shall be tested in (25 ±=5) °C. 5.2 Illumination condition The illuminance at the measuring spot of the DUT shall be below 1 lx (standard dark room condition as defined in IEC 61747-6).
SIST EN 61747-6-3:2011



– 8 – 61747-6-3  IEC:2011 6 Standard motion-blur measuring methods 6.1 General Motion induced object blur is the result of a slow response of the liquid crystal cells and a stationary representation of the temporal image (related to the hold time of the display), in combination with smooth pursuit eye-tracking of an object over the display surface. When an object moves across the display and the eye is tracking this object, a spatiotemporal integration of the object luminance is taken place at the human retina. There are several ways to measure and characterize this spatiotemporal integration, via a direct measurement or via an indirect measurement technique. For direct measurements a pursuit camera system can be used, and the indirect measurement is based on measuring the temporal response curves and from those curves the motion induced object blur that will occur on the retina can be calculated. Both direct and indirect measurements will be described in this standard. 6.2 Direct measurement method 6.2.1 Standard measuring process 6.2.2 Test patterns There are several patterns that can be used to measure motion induced object blur, such as full test pattern, box test pattern, and line bar test pattern (see Figure 1). The details of the used test pattern(s) shall be reported. When using a pursuit system, the width of the test pattern should be sufficiently wide, e.g. 5 time the advancement (step-width) per frame, to capture the total temporal response of the display. It is recommended that a minimum of seven gray shades, including black and white, are used for gray level of each part of a test pattern in Figure 1. The lightness function, specified in CIE 1976 (L*u*v*) and CIE 1976 (L*a*b*) color spaces, can be used to space the intermediate gray shades equally on the lightness scale. One of gray level data that are available at the LCD modules input, e.g. 0 to 255 for an 8-bit LCD module, also can be used as this gray level.
(A) Full test pattern (B) Box test pattern (C) Line bar test pattern IEC
1605/11
Figure 1 – Examples of edge blur test pattern
6.2.2.1 Pursuit detection system Measuring edge blur of the LCD module should be done by using CCD camera with the pursuit measurement system shown in Figure 2 and Figure 3. Relevant literature on these systems can be found in the bibliography, references [1]1 to [5].
___________ 1
Figures in square brackets refer to the Bibliography.
SIST EN 61747-6-3:2011



61747-6-3  IEC:2011 – 9 –
Pursuing speed (v)
LMD with pursuing system
Captured image on CCD Moving pattern
scroll speed (v) IEC
1606/11
Figure 2 – Example of a pivoting pursuit camera system
Moving test pattern Linear pursuing LMD system Captured image
LCD module IEC
1607/11
Figure 3 – Example of a linear pursuit camera system
The following guidelines are recommended when implementing the pursuit measuring system:
a) LMD: CCD or CMOS type surface measurement devices (CCD camera), with preferably an integrated CIE 1931 photopic luminous sensitivity function (measuring luminance). b) Scroll speed: the scroll speed of test pattern and the pursuing speed of LMD shall be synchronized accurately to prevent integration errors. c) Pursuing system: either pivoting or linear pursuit system shown in Figure 2 and Figure 3, respectively. The angular rotation shall be limited to avoid viewing-angle related dependencies (less than ±5˚). SIST EN 61747-6-3:2011



– 10 – 61747-6-3  IEC:2011 6.2.2.2 Specified conditions a) Any deviations from the standard measurement conditions shall be reported: “Full test pattern” shown in Figure 1(A) shall be used as the test pattern for this test method. Other test patterns, such as “Box test pattern” shown in Figure 1(B) or “Line bar test pattern” shown in Figure 1(C), can be used additionally depending on the requirements. The used patterns shall be reported.
NOTE When other test patterns other than the standard “Full test pattern” are used, special care should be taken because the size of the pattern can alter the luminance level of some of the LCD modules equipped with automatic luminance level control function, or some long tails of the blurred edge can fall on the adjacent edge causing ambiguity in the data analysis. b) The signal level (the start level and the end level) for the test pattern is summarized Table 1. Table 1 – Step response data for different luminance transitions
Data per color (e.g. R,G,B,W) End level L1 L2 L3 . . LN Start level L1
L1-2(t) L1-3(t)
L1-N(t) L2 L2-1(t)
L2-3(t)
L2-N(t) L3 L3-1(t) L3-2(t)
L3-N(t) .
..
LN LN-1(t) LN-2(t) LN-3(t)
c) Standard measuring conditions 1) Scroll speed : 4, 8, 12 pixel/frame 2) Shutter speed of camera : 1/20 sec. 6.2.3 Analysis method 6.2.3.1 Blurred edge time The time between the transition from 10 % to 90 % in the luminance transition curve (see Figure 4) is used to represent blurred edge time. Other ranges, such as 40 % to 60 %, can be used, but they shall be reported. SIST EN 61747-6-3:2011



61747-6-3  IEC:2011 – 11 –
Relative luminance intensity Luminance transition curve 50 45 40 35 30 25 20 15 10 5 0 0 0,2 0,4 0,6 0,8 1,0 1,2 1,4 90 % 10 % Time
(ms) IEC
1608/11
Figure 4 – Example of luminance cross section profile of blurred edge 6.2.3.2 Extended blurred edge time The extended blurred edge time is defined as EBET = BET/0.8, which linearly extends the BET to the 0 % to 100 % levels (see Figure 5).
Relative luminance intensity Luminance transition curve 50 45 40 35 30 25 20 15 10 5 0 0 0,2 0,4 0,6 0,8 1,0 1,2 1,4 90 % 10 % 0 % 100 % 0 % - 100 % Time
(ms) IEC
1609/11
Figure 5 – Example of luminance cross-section profile of blurred edge 6.2.3.3 Perceived blurred edge time The process to obtain a PBET curve is described in bibliographic reference [6], and summarized in Figure 6. Luminance blurred edge is converted to a spectrum by a fast Fourier transformation (FFT). The spectrum is multiplied by values given by CSF. After then a PBET SIST EN 61747-6-3:2011



– 12 – 61747-6-3  IEC:2011 curve is obtained by an inverse FFT. The value of the PBET is the distance between the peaks of PBET curve (expressed in ms).
Relative luminance
Luminance profile CSF PBET PBEW Fourier transform Inverse Fourier transform Transform Sensitivity Relative stimuli
Relative stimuli
CCD pixel Spatial
frequency Spatial
frequency Width Time IEC
1610/11
Figure 6 – PBET calculation
NOTE This standard recommends Peter Barten’s CSF (reference [7]), although other CSFs could be used.
Barten’s CSF formulae:
where S(u)
is the spatial contrast sensitivity function for binocular vision; mt(u)
is the modulation threshold; u
is the spatial frequency; σ
is the standard deviation of the line-spread function of the eye ; K
is the signal-to-noise ratio (3,0); T
is the integration time of the eye (0,1 s); XO
is the angular size of the object; Xmax
is the maximum angular filed size of the object (12˚); Nmax
is the maximum number of cycles over which the eye can integrate (15 cycles); η
is the quantum efficiency of the eye (0,03); p
is the photon conversion factor, depending on the light source
(e.g. 1,2 106 photons/sec/deg2/Td) ; E
is the retinal illumination (Td); Φ0
is the spectral density of the neural noise (3,10-8 sec deg2); Uo
is the spatial frequency above which the lateral inhibition ceases (7 cycles/degree). For the calculations, the viewing distance is set to 1.5 times the diagonal screen size of the active display area (approximately 3 x height of display active area)
6.3 Indirect measurement method 6.3.1 Temporal step response The temporal step response measurement method is based on the literature, indicated in the Bibliography, i.e., references [9] to [15]. −Φ+++==−−20222)/(02max22max20211112/)(1)(uuutepENuXXTkeumuSησπSIST EN 61747-6-3:2011



61747-6-3  IEC:2011 – 13 – 6.3.1.1 Measurement system A schematic representation of the measurement set-up to measure the temporal step response is shown in Figure 7.
4) Amplifier 5) Data
acquisition 1) DUT 2) Pattern generator 6) Luminance
meter 7) Control
system Monitor 3) Photo
diode LVDS/DVI Trigger Data transfer Control
L,x,y transfer v(t) IEC
1611/11
Figure 7 – Set-up to measure the temporal step response
The measurement set-up, presented in Figure 7, comprises of the following components:
The DUT (1), which is the display to be measured.
A pattern generator (2), which generates the test patterns in the native display resolution and applicable refresh rates. The pattern generator, preferably, has a control terminal or interface, which enables selection of the pattern and start-stop of the measurement procedure. The output of the pattern generator may consist of one or more LVDS, DVI, or other output terminal(s), which can be connected with the display input terminal(s). The pattern generator should also include a trigger output signal that can be used to start the data acquisition process.
A fast response photo-diode or other opto-electrical detector (3), with a spectral sensitivity that is matched to the spectral luminous efficiency function V(λ) for photopic vision. This detector is used to capture the temporal luminance, produced by the DUT. A signal amplifier (4), which is used for signal amplification to match the input range of data acquisition device, and for low-pass filtering to attenuate the signal noise.
A data acquisition device (5) that records the amplified signal v(t) of the photo-diode. The sampling rate shall be at least 10 kHz to enable acquiring temporal luminance data with sufficient temporal resolution, and furthermore the sampling rate should be related to the refresh rate of the display to allow time accurate analysis of the data. An oscilloscope
...