SIST EN 61180-2:1998

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.High-voltage test techniques for low-voltage equipment - Part 2: Test equipment (IEC 61180-2:1994)Hochspannungs-Prüftechnik für Niederspannungsgeräte -- Teil 2: PrüfgeräteTechniques des essais à haute tension pour matériels à basse tension -- Partie 2: Matériel d'essaiHigh-voltage test techniques for low-voltage equipment -- Part 2: Test equipment19.080SUHVNXãDQMHElectrical and electronic testingICS:Ta slovenski standard je istoveten z:EN 61180-2:1994SIST EN 61180-2:1998en01-januar-1998SIST EN 61180-2:1998SLOVENSKI
STANDARD



SIST EN 61180-2:1998



SIST EN 61180-2:1998



SIST EN 61180-2:1998



SIST EN 61180-2:1998



SIST EN 61180-2:1998



NORMEINTERNATIONALEINTERNATIONALSTANDARDCEIIEC1180-2Première éditionFirst edition1994-06Techniques des essais à haute tensionpour matériel à basse tension -Partie 2:Matériel d'essaiHigh-voltage test techniquesfor low-voltage equipment -Part 2:Test equipment© CEI 1994 Droits de reproduction réservés — Copyright — all rights reservedAucune partie de cette publication ne peut âtre reproduite niutilisée sous quelque forme que ce soit et par aucun pro-cédé, électronique ou mécanique, y compris la photocopie etles microfilms, sans l'accord écrit de l'éditeur.No part of this publication may be reproduced or utilized inany form or by any means, electronic or mechanical,including photocopying and microfilm, without permissionin writing from the publisher.Bureau Central de la Commission Electrotechnique Internationale 3, rue de Varembé Genève, SuisseIECCommission Electrotechnique InternationaleInternational Electrotechnical CommissionMe»utyHapoAHae 3neKrpOTexHH4ecHaH IHoMHCCHNsCODE PRIXPRICE CODEPour prix, voir catalogue en vigueurFor price, see current catalogueSIST EN 61180-2:1998



1180-2 ©IEC:1994– 3 –CONTENTSPageFOREWORD 5Clause1 Scope 72 Normative references 73 Definitions 94 General conditions for verification of test equipment
94.1Atmospheric conditions 94.2 Connections and arrangement 94.3Influence of the load 114.4 Comparison procedure 114.5Frequency of verifications 115 Verification of characteristics of direct voltage generators 115.1Ripple factor
115.2 Permitted measuring error 115.3Voltage regulation 116 Verification of characteristics of alternating voltage generators
116.1Voltage wave-form 116.2 Permitted measuring error 136.3 Minimum test voltage 137 Verification of characteristics of impulse voltage 137.1Voltage wave-form 137.2Permitted measuring error 137.3 Conventional output impedance 138 Verification of characteristics of impulse current generators 158.1Current wave-form 158.2Permitted measuring error 159 Verification of characteristics of hybrid impulse voltage generators
159.1Wave-form and permitted measuring error 159.2 Virtual impedance
1510 Requirements for reference measuring systems 1710.1Direct voltage
1710.2Alternating voltage 1710.3Lightning impulse voltage
1710.4Impulse current
1710.5 Comparative measurement 17Annex A – Bibliography
19SIST EN 61180-2:1998



1180-2 © I EC:1994– 5 –INTERNATIONAL ELECTROTECHNICAL COMMISSIONHIGH-VOLTAGE TEST TECHNIQUES FORLOW-VOLTAGE EQUIPMENT -Part 2: Test equipmentFOREWORD1)The IEC (International Electrotechnical Commission) is a worldwide organization for standardizationcomprising all national electrotechnical committees (IEC National Committees). The object of the IEC is topromote international cooperation on all questions concerning standardization in the electrical andelectronic fields. To this end and in addition to other activities, the IEC publishes International Standards.Their preparation is entrusted to technical committees; any IEC National Committee interested inthe subject dealt with may participate in this preparatory work. International, governmental andnon-governmental organizations liaising with the IEC also participate in this preparation. The IECcollaborates closely with the International Organization for Standardization (ISO) in accordance withconditions determined by agreement between the two organizations.2)The formal decisions or agreements of the IEC on technical matters, prepared by technical committees onwhich all the National Committees having a special interest therein are represented, express, as nearly aspossible, an international consensus of opinion on the subjects dealt with.3)They have the form of recommendations for international use published in the form of standards, technicalreports or guides and they are accepted by the National Committees in that sense.4)In order to promote international unification, IEC National Committees undertake to apply IEC InternationalStandards transparently to the maximum extent possible in their national and regional standards. Anydivergence between the IEC Standard and the corresponding national or regional standard shall be clearlyindicated in the latter.5)The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for anyequipment declared to be in conformity with one of its standards.International Standard IEC 1180-2 has been prepared by IEC technical committee 42:High-voltage testing techniques.The text of this standard is based on the following documents:DISReport on voting
42(CO)5342(CO)56Full information on the voting for the approval of this standard can be found in the reporton voting indicated in the above table.Annex A is for information only.SIST EN 61180-2:1998



1180-2 © I EC:1994– 7 –HIGH-VOLTAGE TEST TECHNIQUES FORLOW-VOLTAGE EQUIPMENT -Part 2: Test equipment1 ScopeThis part of IEC 1180 is applicable to the test equipment used for dielectric tests onlow-voltage equipment. It covers tests with direct, alternating or impulse voltage, impulsecurrent, and tests with a combination of impulse voltage and impulse current. Verificationprocedures necessary for ensuring that the dielectric tests comply with the voltage, orcurrent, requirements stated in part 1 of this standard in shape and magnitude are stated.The test equipment comprises a voltage and/or current generator and a measuringsystem. This standard covers test equipment in which the measuring system is protectedagainst external interference and coupling by appropriate screening, for example a continu-ous conducting shield. Therefore, simple comparison tests are sufficient to ensure validresults.Test equipment having measuring systems composed of non-screened components and/orconnected by long leads is not covered in this standard. In this case guidance can beobtained from IEC 60-2 keeping in mind the less stringent requirements of this standard.2 Normative referencesThe following normative documents contain provisions which, through reference in thistext, constitute provisions of this part of IEC 1180. At the time of publication ofthis standard, the editions indicated were valid. All normative documents are subject torevision, and parties to agreements based on this part of IEC 1180 are encouragedto investigate the possibility of applying the most recent editions of the normativedocuments indicated below. Members of IEC and ISO maintain registers of currently validInternational Standards.IEC 68-1: 1988, Environmental testing – Part 1: General and guidanceIEC 790: 1984, Oscilloscopes and peak voltmeters for impulse testIEC 1083-1: 1991, Digital recorders for measurements in high-voltage impulse tests –Part 1: Requirements for digital recordersIEC 1180-1: 1992, High-voltage test techniques for low-voltage equipment – Part 1: Defi-nitions, test and procedure requirementsNOTE – The requirements of IEC 790 and IEC 1083-1 may be reduced because the uncertainty limitsof this part of 1180 are less stringent than those in IEC 60-1, for example, ±5 % for peak value (±3 %in IEC 60-1).SIST EN 61180-2:1998



1180-2 © IEC:1994- 9 -3 DefinitionsFor the purpose of this International Standard, the following definitions apply.3.1 test equipment: Complete set of devices needed to generate and measure the testvoltage or current applied to a test object.3.2 reference measuring system: Measuring system having sufficient accuracy andstability for it to be appropriate for use in the approval of other systems by making simul-taneous comparative measurements of specific types of wave-form and ranges of voltageor current.NOTE — Uncertainty limits are given in clause 10.3.3 measuring error: Difference between the value measured by the test equipment andthe value given by the reference measuring system (reference value). It is usuallyexpressed as a percentage of the reference value.3.4 conventional output impedance (impulse voltage generator): Value of [(Voc -VR)/ VR] R where Voc is peak output voltage into an open circuit and VR is the voltage ona resistive load R where R is suc
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