Connectors for frequencies below 3 MHz for use with printed boards -- Part 1: Generic specification - General requirements and guide for the preparation of detail specifications, with assessed quality

It is applicable to printed board connectors designed for use in equipment for telecommunication and electronic data processing and in electronic equipment or devices employing similar techniques. The object is to establish uniform specifications, type test requirements and quality assessment procedures for rectangular connectors and to establish rules for the preparation of detail specifications for connectors of assessed quality.

Steckverbinder für gedruckte Schaltungen für Frequenzen unter 3 MHz -- Teil 1: Fachgrundspezifikation - Allgemeine Anforderungen und Leitfaden für die Erstellung von Bauartspezifikationen mit Qualitätsbewertung

Connecteurs pour fréquences inférieures à 3 MHz pour utilisation avec cartes imprimées -- Partie 1: Spécification générique - Prescriptions générales et guide de rédaction des spécifications particulières, avec assurance de la qualité

Est applicable aux connecteurs pour cartes imprimées prévus pour être utilisés dans les équipements de télécommunications, de traitement électronique de données et dans les dispositifs ou équipements électroniques employant des techniques similaires. A pour objet de définir des prescriptions uniformes pour les spécifications, les essais types, et les procédures d'assurance de la qualité des connecteurs rectangulaires ainsi que des règles pour la rédaction des spécifications particulières pour des connecteurs sous assurance de la qualité.

Connectors for frequencies below 3 MHz for use with printed boards - Part 1: Generic specification - General requirements and guide for the preparation of detail specifications, with assessed quality (IEC 60603-1:1991 + A1:1992)

General Information

Status
Published
Publication Date
31-Aug-2002
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
01-Sep-2002
Due Date
01-Sep-2002
Completion Date
01-Sep-2002

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2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Connectors for frequencies below 3 MHz for use with printed boards - Part 1: Generic specification - General requirements and guide for the preparation of detail specifications, with assessed quality (IEC 60603-1:1991 + A1:1992)Steckverbinder für gedruckte Schaltungen für Frequenzen unter 3 MHz -- Teil 1: Fachgrundspezifikation - Allgemeine Anforderungen und Leitfaden für die Erstellung von Bauartspezifikationen mit QualitätsbewertungConnecteurs pour fréquences inférieures à 3 MHz pour utilisation avec cartes imprimées -- Partie 1: Spécification générique - Prescriptions générales et guide de rédaction des spécifications particulières, avec assurance de la qualitéConnectors for frequencies below 3 MHz for use with printed boards -- Part 1: Generic specification - General requirements and guide for the preparation of detail specifications, with assessed quality31.220.10Plug-and-socket devices. ConnectorsICS:Ta slovenski standard je istoveten z:EN 60603-1:1998SIST EN 60603-1:2002en01-september-2002SIST EN 60603-1:2002SLOVENSKI
STANDARD



SIST EN 60603-1:2002



SIST EN 60603-1:2002



SIST EN 60603-1:2002



SIST EN 60603-1:2002



SIST EN 60603-1:2002



IEC111CODE PRIXPRICE CODEUNORMEINTERNATIONALEINTERNATIONALSTAN DARDCEIIEC603-1QC 010000Deuxième éditionSecond edition1991-06Connecteurs pour fréquences inférieuresà 3 MHz pour utilisation avec cartes impriméesPartie 1:Spécification générique —Prescriptions générales et guide de rédactiondes spécifications particulières,avec assurance de la qualitéConnectors for frequencies below 3 MHzfor use with printed boardsPart 1:Generic specificationGeneral requirements and guide forthe preparation of detail specifications,with assessed quality© CEI 1991 Droits de reproduction réservés—Copyright — all rights reservedAucune partie de cette publication ne peut être reproduite niutilisée sous quelque forme que ce soit et par aucun procédé,électronique ou mécanique, y compris la photocopie et lesmicrofilms, sans raccord écrit de l'éditeur.No part of this publication may be reproduced or utilizedin any form or by any means, electronic or mechanical,including photocopying and microfilm, without permissionin writing from the publisherBureau central de la Commission Electrotechnique Internationale 3, rue de Varembé Genève SuisseCommission Electrotechnique InternationaleInternational Electrotechnical CommissionMeniuyHapoAHaa 3neItTpoTexHH4ecnan HOMHCCHaPour prix, voir catalogue en vigueurFor price, see current catalogueSIST EN 60603-1:2002



603-1 © IEC– 3 –CONTENTSPageFOREWORD 7SECTION 1 – SCOPE AND OBJECTClause1 Scope and object
9SECTION 2 – GENERAL2 Related documents
92.1Terminology
112.1.1 Type 112.1.2 Style
112.1.3 Variant 112.1.4 Examples 132.2 Classification into climatic categories
132.3 Creepage and clearance distances
132.4 Currents
132.5 Marking 132.5.1 On the connector
132.5.2 On the package
152.6 IEC type designation
15SECTION 3 – QUALITY ASSESSMENT PROCEDURES3 Quality assessment procedures
173.1 Primary stage of manufacture
173.2 Structurally similar styles 173.3 System of levels
173.3.1Performance level
173.3.2 Assessment level
193.3.3Inspection level (IL)
193.3.4 Acceptable quality level (AQL)
193.3.5 Combination of performance and assessment levels
193.4 Grouping of tests
213.4.1Test groups for qualification approval testing
213.4.2 Inspection groups for quality conformance inspection
213.4.3 Delayed delivery
213.4.4 Release for delivery before completion of "Group B" tests
213.4.5 Delivery of tested connectors
23SIST EN 60603-1:2002



603-1 ©IEC– 5 –ClausePage3.5 Approval of manufacturers, independent test laboratories and distributors
233.6 Qualification approval procedures
233.6.1 General
233.6.2 Granting of qualification approval
233.6.3 Extent of qualification approval
233.6.4 Maintenance of qualification approval
253.6.5 Suspension or withdrawal of qualification approval
253.6.6 Significant changes
253.6.7 Qualification approval testing
253.6.8 Qualification approval report 253.7 Quality conformance inspection
293.7.1Formation of inspection lots
293.7.2 Small lots and/or expensive connectors
293.7.3 Quality conformance inspection groups
293.7.4 Lot-by-lot tests
313.7.5 Periodic tests
313.7.6 Certified record of released lots
333.7.7 Quality conformance testing
333.7.8 In-process testing
35SECTION 4 – GENERAL REQUIREMENTS, TESTS AND TEST SCHEDULES4 Testing
374.1 General aspects
374.2 Pre-conditioning
394.3 Mounting of specimens
394.4 Test schedules
394.4.1Basic (minimum) test schedule
414.4.2 Full test schedule
41SECTION 5 – PREPARATION OF DETAIL SPECIFICATIONS5 Title of detail specifications
495.1Drawing information
495.1.1 Projection method and dimensioning system
495.1.2 Drawings and dimensions
495.1.3 System of lettering
515.2 Contents of detail specification
51Appendix A – Common lettering system to be used in drawings
57SIST EN 60603-1:2002



603-1 © IEC– 7 –INTERNATIONAL ELECTROTECHNICAL COMMISSIONCONNECTORS FOR FREQUENCIES BELOW 3 MHzFOR USE WITH PRINTED BOARDSPart 1: Generic specification - General requirements andguide for the preparation of detail specifications,with assessed qualityFOREWORD1)The formal decisions or agreements of the IEC on technical matters, prepared by Technical Committees onwhich all the National Committees having a special interest therein are represented, express, as nearly aspossible, an international consensus of opinion on the subjects dealt with.2)They have the form of recommendations for international use and they are accepted by the NationalCommittees in that sense.3)In order to promote international unification, the IEC expresses the wish that all National Committeesshould adopt the text of the IEC recommendation for their national rules in so far as national conditions willpermit. Any divergence between the IEC recommendation and the corresponding national rules should, asfar as possible, be clearly indicated in the latter.4)The IEC has not laid down any procedure concerning marking as an indication of approval and has noresponsibility when an item of equipment is declared to comply with one of its recommendations.This part of International Standard IEC 603 has been prepared by Sub-Committee 48B:Connectors, of IEC Technical Committee No. 48: Electromechanical components for elec-tronic equipment.It forms the second edition of IEC 603-1 and supersedes the first edition issued in 1981.The text of this part is based on the first edition and the following documents:Six Months' RuleReports on Voting48B(CO)16048B(CO)16848B(CO)18748B(CO)195Full information on the voting for the approval of this part can be found in the VotingReports indicated in the above table.The QC number that appears on the front cover of this publication is the specificationnumber in the IEC Quality Assessment System for Electronic Components (IECQ).SIST EN 60603-1:2002



603-1 ©IEC– 9 –CONNECTORS FOR FREQUENCIES BELOW 3 MHzFOR USE WITH PRINTED BOARDSPart 1: Generic specification - General requirements andguide for the preparation of detail specifications,with assessed qualitySECTION 1 – SCOPE AND OBJECT1 Scope and objectThis part of IEC 603 is applicable to printed board connectors designed for use inequipment for telecommunication and electronic data processing and in electronic equip-ment or devices employing similar techniques. This generic specification shall be used inconjunction with the relevant detail specification(s).Connectors essentially for applications at frequencies exceeding 3 MHz are not coveredby this generic specification.The object of this part of IEC 603 is to establish uniform specifications, type testrequirements and quality assessment procedures for connectors for use with printedboards and to establish rules for the preparation of detail specifications for connectors ofassessed quality.In the event of conflict between this generic specification and the detail specification, therequirements of the detail specification shall prevail.SECTION 2 – GENERAL2 Related documentsThis generic specification shall be used in conjunction with the following publications.Units, graphic symbols and letter symbols shall be used whenever possible in accordancewith the requirements of the publications listed below.IEC 27, Letter symbols to be used in electrical technology.IEC 50(581): 1978, /EV - Chapter 581: Electromechanical components for electronicequipment.IEC 68-1: 1988, Environmental testing - Part 1: General and guidance.IEC 410: 1973, Sampling plans and procedures for inspection by attributes.IEC 512-1: 1984, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods. Part 1: General.IEC 512-2: 1985, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods - Part 2: General examination, electrical continuitySIST EN 60603-1:2002



603-1 © IEC-11 -IEC 512-3: 1976, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods - Part 3: Current-carrying capacity tests.IEC 512-4: 1976, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods - Part 4: Dynamic stress tests.IEC 512-5: 1977, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods - Part 5: Impact tests (free components), static loadtests (fixed components), endurance tests and overload tests.IEC 512-6: 1984, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods - Part 6: Climatic tests and soldering tests.IEC 512-7: 1988, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods - Part 7: Mechanical operating tests and sealing tests.IEC 512-8: 1984, Electromechanical components for electronic equipment; basic testingprocedures and measuring methods - Part 8: Connector tests (mechanical) and mecha-nical tests on contacts and terminations.IEC 617, Graphical symbols for diagrams.QC 001002: 1986, Rules of procedure of the IEC quality assessment system for electroniccomponents (IECQ).iSO 129: 1985, Technical drawings - Dimensioning - General principles, definitions,methods of execution and special indications.ISO 286-1: 1988, ISO system of limits and fits - Part 1: Bases of tolerances, deviationsand fits.ISO 286-2: 1988, ISO system of limits and fits - Part 2: Tables of standard tolerancegrades and limit deviations for holes and shafts.ISO 1000: 1981, SI units and recommendations for use of their multiples and of certainother units.2.1 TerminologyThe terminology used in and applicable to this part of IEC 603 is included in IEC 50(581).For the purpose of this standard, the following additional terms and definitions shall apply:2.1.1 type: Connectors within a particular sub-family, such as one part connectors(edge-socket connectors), two-part connectors.2.1.2 style: A particular connector within a type.2.1.3 variant: Variations within a type and style, or within a group of related connectors.SIST EN 60603-1:2002



603-1 ©IEC- 13 -2.1.4 Examples-Family: connector.-Sub-family: connector for printed boards.-Type: two-part connector for printed boards.Style: a particular external mounting configuration, e.g. rectangular flangemounting.-Variant: number of contacts, polarization, terminations, etc.2.2 Classification into climatic categoriesThe connectors are classified into climatic categories in accordance with the general rulesgiven in IEC 68-1.The following preferred temperature ranges and severities of the damp heat, steady statetests have been selected:CategoryTemperature rangeDamp heat,steady stateClimatic category 10/070/04-10 °C to +70 °C4 daysEach performance level of a designated25/070/10-25 °C to +70 °C10 daysconnector has only one climatic category40/085/21-40 °C to +85 °C21 daysand shall be specified in Sub-clause 6.140/085/56-40 °C to +85 °C56 daysof the detail specification55/100/21-55 °C to +100 °C21 days55/125/21-55 °C to +125 °C21 days55/125/56-55 °C to +125 °C56 days65/155/56-65 °C to +155 °C56 days2.3 Creepage and clearance distancesPermissible operating voltages depend on the application and on the applicable or spe-cified safety requirements. Therefore, creepage and clearance distances as well as proofvoltages under specified air pressure shall be specified in the detail specification.2.4 CurrentsFor each connector, the current-carrying capacity shall be specified in the detail speci-fication, preferably by the current-temperature derating curve evaluated in accordancewith Test 5b of lEC 512-3 or by at least one value of current and the associated tempera-ture on this derating curve as well as the maximum operating temperature.2.5 Marking2.5.1 On the connectorEach connector shall have the following information marked upon it:a) Identification of the contact position as indicated in the detail specification.SIST EN 60603-1:2002



603-1 ©IEC– 15 –If space does not permit full marking, as much as possible of the following in the ordershown shall be included:b)IEC type designation.c)Mark of origin (manufacturer's name or trade mark).d)Date code.2.5.2 On the packageThe information b), c) and d) shall also be marked on the package.2.6 1EC type designationConnectors to which this standard applies shall be designated by the following indicationsand in the order given:a)The number of the detail specification.b)The letters "IEC".c)A letter denoting the style of the connector. (The system shall be specified in thedetail specification.)d)The number of contacts of connectors or of contact cavities of connector bodies.e)A letter denoting the type of the contact of two-part connectors or the number ofelectrically independent rows of edge-socket connectors.The following letters shall be used:M . male contactF = female contactH = hermaphroditic contactf)A letter denoting the basic type of the termination.The following letters shall be used:A = screw terminationsS = solder terminationsC = crimp terminationsW = wrap terminationsT = tab terminationsIf necessary and explicitly specified in the detail specification, the IEC type designationmay optionally be extended to cover further information, for example climatic category,termination information, etc.For connectors of assessed quality to a specified performance level, a digit shall be usedto denote performance level and a letter shall be used to denote assessment level. Thedigit and letter shall be included in this order as final characters of the type designation.SIST EN 60603-1:2002



603-1 ©IEC– 17 –SECTION 3 – QUALITY ASSESSMENT PROCEDURES3 Quality assessment procedures3.1 Primary stage of manufactureThe primary stage of manufacture as defined in the Rules of Procedure (QC 001002, Sub-clause 8.5.2), is the first process subsequent to the manufacture of finished componentparts and sub-assemblies. A sub-assembly is defined as the permanent assembly of twoor more component parts.This primary stage of manufacture and all subsequent processes shall be carried outunder the direct surveillance of the manufacturer's approved Chief Inspector. They may becarried out by sub-contractors providing that equivalent disciplines apply.3.2 Structurally similar stylesConnectors having the same basic design, common contact sizes, and the same contactsurface finish, are considered to be structurally similar components as defined in theRules of Procedure (QC 001002, Sub-clause 8.5.3). They may be different in otherfeatures, such as number of contacts, overall size, mounting, termination technique, etc.,but shall be produced by the same manufacturing processes and methods.Structurally similar connectors may be covered by one common or by several detail speci-fications. Connectors covered by one common detail specification are considered to bestructurally similar. Additional details may be given in the detail specification.For the purpose of quality conformance inspection and of sampling, all structurally similarconnectors may be aggregated into one inspection lot.3.3 System of levelsThe term lever is used in the following different meanings and should be clearlydistinguished. A detail specification may contain more than one performance level andassessment level combination. All details of these levels and their combinations shall bespecified in the detail specification. The performance level and its assessment level shallbe clearly described in the detail specification.3.3.1 Performance levelThe performance level is based on four factors:-the climatic category;–the test schedule;–the severities of the test conditions;–the requirements.SIST EN 60603-1:2002



603-1 © IEC– 19 –Variations of one or more of these factors, i.e. climatic category, extent of test scheduleand/or severity and/or requirements, will result in different performance levels.This publication contains a "basic test schedule" and a "full test schedule". Both schedulesare explicitly given while an "intermediate test schedule" is mentioned together with theinstruction how to specify an intermediate test schedule. These test schedules togetherwith the severities to be applied and the requirements to be fulfilled as specified in thedetail specification define the performance levels of the components.A given component with its type designation has one performance level only. If twocomponents differ in their performance levels, they shall be considered as two differentcomponents and they shall have two different type designations.In the type designation, the performance level shall be designated by a digit. The digitshall be 1, 2 or 3 and specified in the detail specification.3.3.2 Assessment levelThe assessment level is the combination of sample size and number of defectives per-mitted. Each performance level of a structurally similar connector shall have only oneassessment level.For fixed sample size the assessment level is defined by the number of specimens to betested and the number of defectives permitted. Fixed sample sizes are usually applied forqualification approval testing and for periodic tests within quality conformance inspection.For variable sample size the assessment level is defined by the "Inspection Level, IL" andthe "Acceptable Quality Level, AQL". Variable sample sizes are usually applied for lot-by-lot tests.In the type designation, the assessment level shall be designated by a letter. The lettershall be specified in the detail specification.3.3.3 Inspection level (IL)The inspection level determines the sample size relative to the lot size. For further infor-mation, see IEC 410.3.3.4 Acceptable quality level (AOL)The AM is defined in IEC 410 as the maximum per cent defective that can be consideredsatisfactory as a process average. For further information, see IEC 410.3.3.5 Combination of performance and assessment levelsIn principle, any combination of performance level and assessment level is possible.Practice has shown, for connectors, that only one combination of performance and assess-ment levels is meaningful for each performance level.NOTE - The type designation specified in the relevant detail specification should provide a digit and aletter for each performance level - assessment level combination.SIST EN 60603-1:2002



603-1 © IEC– 21 –3.4 Grouping of testsIn this part of IEC 603, two different systems of grouping tests are used which should beclearly distinguished.3.4.1 Test groups for qualification approval testingThis part of IEC 603 contains test schedules. The test schedules are subdivided into testgroups, P, AP, BP, CP, DP and EP. In each test group a specified minimum number ofspecimens shall undergo a number of specified tests. For qualification approval, Sub-clause 3.6 specifies the same test schedules and test groups, and the minimum number ofspecimens to be tested. The number of defectives permitted will be stated in the relevantdetail specification. By specifying all these details, fixed rules are established and thequalification approval becomes a standardized procedure.The groups described in this sub-clause and used for qualification approval testing arecalled "Qualification Approval Test Groups" or "QA Test Groups".3.4.2 Inspection groups for quality conformance inspectionFor the purpose of quality conformance inspection, usually a smaller number of tests isapplied, since certain tests are significant for qualification approval testing only but arenot necessary for inspecting the current production. Some of the tests are applied on alot-by-lot basis, either 100 % or using sampling procedures, while it is sufficient to applyothers at shorter or longer intervals only. The periodicity of these tests may be between 1and 36 months.For many reasons, it is convenient to combine the tests into groups according to theapplication of the tests. These groups are called "Quality Conformance Inspection Groups"or "QC Inspection Groups".The following grouping has been found convenient:–Lot-by-lot tests, applied either 100 % or using sampling procedures (QC inspectiongroups A and B, see Sub-clause 3.7).–Periodic tests for quality conformance inspection (QC inspection group C, see Sub-clause 3.7).–Periodic tests for attainment or maintenance of qualification approval (QC inspec-tion group D, see Sub-clause 3.7).3.4.3 Delayed deliveryConnectors held for a period of more than 36 months after the release of the lot shall bevisually examined prior to delivery. The detail specification may specify additionalretesting, e.g. solderability. Reexamination shall be performed using the originalassessment level. Once a lot has been satisfactorily retested, its quality assessment isreassessed for a further 36 months.3.4.4 Release for delivery before completion of "Group B" testsWhen the condition of IEC 410 for changing to reduced inspection has been fulfilled forthe Group B tests, the connectors may be delivered prior to the completion of such tests.SIST EN 60603-1:2002



603-1 © IEC- 23 -3.4.5 Delivery of tested connectorsSpecimens subjected to tests that may affect their quality shall not be included in the lot tobe delivered.3.5 Approval of manufacturers, independent test laboratories and distributorsManufacturers wishing to participate in the IECQ System shall comply with the generalrequirements specified in Clause 10 of QC 001002, and the requirements regarding theprimary stage of manufacture specified in Sub-clause 3.1 of this part of IEC 603.Independent distributors and independent test laboratories wishing to participate inthe IECQ System shall comply with the general requirements specified in Clause 10 ofQC 001002.3.6 Qualification approval procedures3.6.1 GeneralAn approved manufacturer (see Sub-clause 3.5) wishing to obtain qualification approvalfor a connector or a range of structurally similar connectors, shall submit a request to thebody designated in the national rules, e.g. the National Supervising Inspectorate. In therequest, he shall state that he is in a position to apply all the processes, tests, measure-ments, etc., from the primary stage of manufacture onwards, that will result in theapproved component.3.6.2 Granting of qualification approvalQualification approval will be granted either:-on satisfactory completion of approval testing, evidence of which is the qualificationapproval report, as specified by the detail specification in accordance with Sub-clause3.6.7, or-on satisfactory completion of quality conformance inspection, evidence of which is thecertified records of released lots, as specified by the detail specification in accordancewith Sub-clause 3.7. The lot-by-lot tests on a minimum of three consecutive inspectionlots and all relevant periodic tests on at least one lot shall have been carried out.Quality conformance inspection tests can be substituted for qualification approval testingonly if testing is equivalent in all respects. Verification of equivalent testing shall be madeby the National Supervising Inspectorate.3.6.3 Extent of qualification approvalThe qualification approval covers all styles and variants within a group of structurallysimilar connectors (see Sub-clause 3.2) providing the connectors tested arerepresentative for this group and include the maximum and the minimum number ofcontacts, for which approval is sought (see also Sub-clause 4.1).SIST EN 60603-1:2002



603-1 ©IEC- 25 -If the qualification approval shall be extended to cover additional styles and variants withfeatures beyond the limits of the original qualification approval, it is sufficient to test theadditional areas only. Negotiation between manufacturer and the relevant national body,e.g. the National Supervising Inspectorate may be necessary.3.6.4 Maintenance of qualification approvalMaintenance of qualification approval shall be in accordance with the Rules of Procedure,i.e. maintenance of qualification approval is assured:-if the connectors are continuously submitted to quality conformance inspection,evidence of which is the certified record of released lots,-if the qualification is reassessed,either periodically, if the component is manufactured in short runs or discontinuously,or occasionally, if a modification of a relevant specification or a significant change asdescribed in Sub-clause 3.6.6 has been carried out. In this case, it may be sufficient toreassess the modified area only.3.6.5 Suspension or withdrawal of qualification approvalThe general rules laid down in Sub-clause 10.7 of QC 001002 shall apply.3.6.6 Significant changesChanges in design, material, technology and/or manufacturing processes are permitted. Inthe case of modifications which might affect the qualification approval, the manufacturershall report them to the relevant national body, e.g. the National Supervising Inspectorate.3.6.7 Qualification approval testingThe detail specification shall specify:-the climatic category;-the test schedule (basic, intermediate or full);-the seventies and/or conditions of tests as necessary in accordance with Clause 4;-requirements at end of test;-the number of specimens and of defectives permitted.3.6.8 Qualification approval reportThe manufacturer shall prepare and provide the qualification approval test report to becertified by the relevant national body, e.g. the National Supervising Inspectorate (seealso Sub-clauses 11.3.1 and 11.3.2 of QC 001002).SIST EN 60603-1:2002



603-1 © IEC– 27 –Table I - Qualification approval test schedule for connectors. Table I covers thetest schedules given in Clause 4TestgroupTestphaseBasic test scheduleIntermediate testscheduleFull test scheduleNumber ofspecimensto be testedNumber ofdefectivespermittedNumber ofspecimensto be testedNumber ofdefectivespermittedNumber ofspecimensto be testedNumber ofdefectivespermittedPP1P2P3P4P520X20X,`20X* If P2 not applicable, substitute Test 13b: Insertion and withdrawal forces.The specimens shall then be divided into the appropriate number of groups of four specimens each. M specimens ofeach group shall be submitted for the tests of one test group in accordance with the data I specifications.APAP1AP2AP3AP4AP5AP6AP7AP8AP9AP10AP11AP12AP13AP14AP15AP16AP17AP18}4n.a.Xn.a.c-oÉ`oo0X4Xm3 cTie OBPBP1BP2BP3BP4BPBP6BP7BP8BP9BP10BP11n.a.n.a._c Câ Nm rmm ôco 03E cŸ ôÇ eX4XCPCP1CP2CP3CP4CP5}n.a.n.a.X4XSIST EN 60603-1:2002



603-1 © IEC–29–Table I (continued)TestgroupTestphaseBasic test scheduleIntermediate testscheduleFull test scheduleNumber ofspecimensto be testedNumber ofdefectivespermittedNumber ofspecimensto be testedNumber ofdefectivespermittedNumber ofspecimensto be testedNumber ofdefectivespermittedDPDP1DP2DP3DP4DP5DP6DP7DP8n.a.n.a.eEw-3 ô0 0X,4XUW L_To .0;v^°m ômE .EEPEP1EP2EP4EP5EP6n.a.n.a.X4XTotal number of defectives permitted,all test groups togetherBasic test scheduleXIntermediate test scheduleXFull test scheduleXX = to be specified in the detail specification.n.a. = not applicable.3.7 Quality conformance inspection3.7.1 Formation of inspection lotsFor the purpose of the quality conformance inspection, all connectors fulfilling the require-ments for structurally similar connectors (see Sub-clause 3.2) may be aggregated into oneinspection lot.The lot size shall be chosen so as to permit sampling procedures in accordance withIEC 410 under reasonable economic conditions.3.7.2 Small lots and/or expensive connectorsA program for the aggregation of small production lots of connectors or small lots ofexpensive connectors into inspection lots shall be determined by the Chief Inspector andshall be submitted for approval to the National Supervising Inspectorate.3.7.3 Quality conformance inspection groupsIn accordance with Clause 12 of QC 001002, the tests are put together to form inspectiongroups as specified in Sub-clauses 3.7.4, 3.7.4.1, 3.7.4.2, 3.7.5, 3.7.5.1 and 3.7.5.2.SIST EN 60603-1:2002



603-1 © IEC– 31 –3.7.4 Lot-by-lot testsLot-by-lot tests are carried out on each inspection lot. Normally these tests are subdividedinto two groups:3.7.4.1 Group A InspectionThis group covers lot-by-lot tests for the inspection of the principal characteristics by non-destructive tests, mainly visual and dimensional examination, carried out 100 % or on asampling basis.Group A Inspection is divided into sub-groups as follows:–Sub-group Al: This sub-group comprises the main visual examination.–Sub-group A2: This sub-group comprises the main dimensional examination.–Sub-group A3: This is a spare sub-group for additional Group A tests that maybe necessary for verifying characteristics of the connectors. Sub-group A3 and allnecessary details shall be specified by the detail specification.3.7.4.2 Group B InspectionThis group covers lot-by-lot tests on a sampling basis for the inspection of additionalcharacteristics necessary for verifying the quality of the connectors. It includes mecha-nical, electrical and environmental tests which are generally more complex and may be oflonger duration (up to 10 days).
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