SIST EN 62024-1:2008

SLOVENSKI STANDARD
SIST EN 62024-1:2008
01-julij-2008
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SIST EN 62024-1:2004
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High frequency inductive components - Electrical characteristics and measuring methods
- Part 1: Nanohenry range chip inductor (IEC 62024-1:2008)
Induktive Hochfrequenz-Bauelemente - Elektrische Eigenschaften und Messmethoden -
Teil 1: Chipinduktivitäten im Nanohenry-Bereich (IEC 62024-1:2008)
Composants inductifs à haute fréquence - Caractéristiques électriques et méthodes de
mesure - Partie 1: Inductance à puce de l'ordre du nanohenry (CEI 62024-1:2008)
Ta slovenski standard je istoveten z: EN 62024-1:2008
ICS:
29.100.10 Magnetne komponente Magnetic components
SIST EN 62024-1:2008 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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EUROPEAN STANDARD
EN 62024-1

NORME EUROPÉENNE
May 2008
EUROPÄISCHE NORM

ICS 29.100.10 Supersedes EN 62024-1:2002


English version


High frequency inductive components -
Electrical characteristics and measuring methods -
Part 1: Nanohenry range chip inductor
(IEC 62024-1:2008)


Composants inductifs à haute fréquence - Induktive Hochfrequenz-Bauelemente -
Caractéristiques électriques Elektrische Eigenschaften
et méthodes de mesure - und Messmethoden -
Partie 1: Inductance à puce Teil 1: Chipinduktivitäten
de l'ordre du nanohenry im Nanohenry-Bereich
(CEI 62024-1:2008) (IEC 62024-1:2008)




This European Standard was approved by CENELEC on 2008-03-01. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in two official versions (English and German). A version in any other language
made by translation under the responsibility of a CENELEC member into its own language and notified to the
Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Cyprus, the
Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain,
Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2008 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62024-1:2008 E

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EN 62024-1:2008 - 2 -
Foreword
The text of document 51/908/FDIS, future edition 2 of IEC 62024-1, prepared by IEC TC 51, Magnetic
components and ferrite materials, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 62024-1 on 2008-03-01.
This European Standard supersedes EN 62024-1:2002.
EN 62024-1:2008 includes the following significant technical changes with respect to EN 62024-1:2002:
– size 0402 added in Table 1 and Table 2;
– contents of 4.4 reviewed for easier understanding;
– errors in 3.1.4.2 corrected.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2008-12-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2011-03-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 62024-1:2008 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 62024-1:2008
Annex ZA
(normative)

Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced
document (including any amendments) applies.

NOTE  When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.

Publication Year Title EN/HD Year

1) 2)
IEC 61249-2-7 - Materials for printed boards and other EN 61249-2-7 2002
interconnecting structures - + corr. September 2005
Part 2-7: Reinforced base materials, clad and
unclad - Epoxide woven E-glass laminated
sheet of defined flammability (vertical burning
test) copper-clad


1)
ISO 6353-3 - Reagents for chemical analysis - - -
Part 3: Specifications - Second series


1)
ISO 9453 - Soft solder alloys - Chemical compositions - -
and forms




1)
Undated reference.
2)
Valid edition at date of issue.

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IEC 62024-1
Edition 2.0 2008-02
INTERNATIONAL
STANDARD


High frequency inductive components – Electrical characteristics and measuring
methods –
Part 1: Nanohenry range chip inductor


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 29.100.10 ISBN 2-8318-9631-2

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– 2 – 62024-1 © IEC:2008(E)
CONTENTS
FOREWORD.4

1 Scope.6
2 Normative references .6
3 Inductance, Q-factor and impedance .6
3.1 Inductance .6
3.1.1 Measuring circuit .7
3.1.2 Mounting of the inductor to the test fixture .7
3.1.3 Measurement method and calculation.9
3.1.4 Notes on measurement.9
3.2 Quality factor.10
3.2.1 Measurement method .10
3.2.2 Measurement circuit .11
3.2.3 Mounting of the inductor .11
3.2.4 Methods of measurement and calculation .11
3.2.5 Notes on measurement.11
3.3 Impedance .11
3.3.1 Measurement method .11
3.3.2 Measurement circuit .11
3.3.3 Measurement method and calculation.11
3.3.4 Notes on measurement.12
4 Resonance frequency.12
4.1 Self-resonance frequency.12
4.2 Minimum output method .12
4.2.1 Measurement circuit .12
4.2.2 Mounting the inductor for test .13
4.2.3 Measuring method .13
4.2.4 Note on measurement .14
4.3 Reflection method .14
4.3.1 Measurement circuit .14
4.3.2 Mounting the inductor for test .14
4.3.3 Measurement method .15
4.3.4 Notes on measurement.15
4.4 Measurement by analyser.16
4.4.1 Measurement by impedance analyser.16
4.4.2 Measurement by network analyser.16
5 DC resistance.16
5.1 Measuring circuit (Bridge method) .16
5.2 Measuring method and calculation formula.17
5.3 Precaution for measurement.17
5.4 Measuring temperature.18

Annex A (normative) Mounting method for a surface mounting coil .19

Figure 1 – Example of circuit for vector voltage/current method .7
Figure 2 – Fixture A .8

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62024-1 © IEC:2008(E) – 3 –
Figure 3 – Fixture B .8
Figure 4 – Short device shape .10
Figure 5 – Example of test circuit for the minimum output method.12
Figure 6 – Self-resonance frequency test board (minimum output method) .13
Figure 7 – Example of test circuit for the reflection method .14
Figure 8 – Self-resonance frequency test board (reflection method).15
Figure 9 – Suitable test fixture for measuring self-resonance frequency.16
Figure 10 – Example of measuring circuit of d.c. resistance.17

Table 1 – Dimensions of l and d.8
Table 2 – Short device dimensions and inductances .10

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– 4 – 62024-1 © IEC:2008(E)
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor


FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)“). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with an IEC Publication.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62024-1 has been prepared by IEC technical committee 51:
Magnetic components and ferrite materials.
This second edition cancels and replaces the first edition published in 2002. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) sizes 0402 added in Table 1 and Table 2;
b) contents of 4.4 reviewed for easier understanding;
c) correct errors in 3.1.4.2.

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62024-1 © IEC:2008(E) – 5 –
The text of this standard is based on the following documents:
FDIS Report on voting
51/908/FDIS 51/915/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts of IEC 62024 series, published under the general title High frequency
inductive components – Electrical characteristics and measuring methods, can be found on
the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.

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– 6 – 62024-1 © IEC:2008(E)
HIGH FREQUENCY INDUCTIVE COMPONENTS –
ELECTRICAL CHARACTERISTICS AND MEASURING METHODS –

Part 1: Nanohenry range chip inductor



1 Scope
This part of IEC 62024 specifies electrical characteristics and measuring methods for the
nanohenry range chip inductor that is normally used in high frequency (over 100 kHz) range.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 61249-2-7, Materials for printed boards and other interconnecting structures – Part 2-7:
Reinforced base materials clad and unclad – Epoxide woven E-glass laminated sheet of
defined flammability (vertical burning test) copper-clad
ISO 6353-3, Reagents for chemical analysis – Part 3: Specifications – Second series
ISO 9453, Soft solder alloys – Chemical compositions and forms
3 Inductance, Q-factor and impedance
3.1 Inductance
The inductance of an inductor is measured by the vector voltage/current method.

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62024-1 © IEC:2008(E) – 7 –
3.1.1 Measuring circuit





EV
2


L
x


R

R
g
L
s

C
d

EV
1
R

s
G



IEC  317/08
Components
R source resistance (50 Ω)
g
R resistor
L inductor under test
x
C distributed capacitance of inductor under test
d
L series inductance of inductor under test
s
R series resistance of inductor under test
s
phase reference signal
Ev , Ev vector voltmeter
1 2
G signal generator

Figure 1 – Example of circuit for vector voltage/current method
3.1.2 Mounting of the inductor to the test fixture
The inductor shall be measured in a test fixture as specified in the relevant standard. If no
fixture is specified, one of the following test fixtures A or B shall be used. The fixture used
shall be reported.

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– 8 – 62024-1 © IEC:2008(E)
3.1.2.1 Fixture A
The shape and dimensions of fixture A shall be as
...