SIST EN 131200:2003

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Sectional Specification: Fixed capacitors with metallized electrodes and polypropylene dielectricRahmenspezifikation: Festkondensatoren mit metallisierten Polypropylenfolien als DielektrikumSpécification intermédiaire: Condensateurs fixes à électrodes métallisées et à diélectrique en polypropylèneSectional Specification: Fixed capacitors with metallized electrodes and polypropylene dielectric31.060.30Papirni kondenzatorji in folijski kondenzatorjiPaper and plastics capacitorsICS:Ta slovenski standard je istoveten z:EN 131200:2002SIST EN 131200:2003en01-oktober-2003SIST EN 131200:2003SLOVENSKI
STANDARD



SIST EN 131200:2003



EUROPEAN STANDARDEN 131200NORME EUROPÉENNEEUROPÄISCHE NORMMay 2002CENELECEuropean Committee for Electrotechnical StandardizationComité Européen de Normalisation ElectrotechniqueEuropäisches Komitee für Elektrotechnische NormungCentral Secretariat: rue de Stassart 35, B - 1050 Brussels© 2002 CENELEC -All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.Ref. No. EN 131200:2002 EICS 31.060.30Supersedes CECC 31 200:1981English versionSectional Specification:Fixed capacitors with metallized electrodesand polypropylene dielectricSpécification intermédiaire:Condensateurs fixes à électrodesmétallisées et à diélectrique enpolypropylèneRahmenspezifikation:Festkondensatoren mit metallisiertenPolypropylenfolien als DielektrikumThis European Standard was approved by CENELEC on 1997-03-11. CENELEC members are bound tocomply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving thisEuropean Standard the status of a national standard without any alteration.Up-to-date lists and bibliographical references concerning such national standards may be obtained onapplication to the Central Secretariat or to any CENELEC member.This European Standard exists in three official versions (English, French, German). A version in anyother language made by translation under the responsibility of a CENELEC member into its ownlanguage and notified to the Central Secretariat has the same status as the official versions.CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,Denmark, Finland, France, Germany, Greece, Iceland, Ireland, Italy, Luxembourg, Malta, Netherlands,Norway, Portugal, Spain, Sweden, Switzerland and United Kingdom.SIST EN 131200:2003



EN 131200:2002- 2 -ForewordThe text of CECC 31 200:1981, Issue 1, with its amendments A1 through A3 and documentsCECC(Secretariat)2492, 3061, 3078, 3079 and 2874 was submitted to the formal vote for conversioninto a European Standard.The text of the draft, together with the voting report, circulated as document CECC(Secretariat)3220,was approved as EN 131200 on 1992-10-14.Based on the positive voting results on prAB to EN 130800, assessment level EZ was accepted forintroduction into EN 131200 on 1997-03-11.The following dates were fixed:-latest date by which the EN has to be implementedat national level by publication of an identicalnational standard or by endorsement(dop)2002-12-01-latest date by which the national standardsconflicting with the EN have to be withdrawn(dow)2002-12-01____________SIST EN 131200:2003



- 3 -EN 131200:2002ContentsPage1General.41.1Scope.41.2Normative references.41.3Information to be given in a detail specification.41.4Definitions.51.5Marking.62Preferred ratings and characteristics.72.1Preferred climatic categories.72.2Preferred values of ratings.73Quality assessment procedure.83.1Primary stage of manufacture.83.2Structurally similar components.83.3Certified test records.93.4Qualification approval.93.5Quality conformity inspection.104Test and measurement procedures.104.1Visual inspection and check of dimensions.104.2Electrical tests.114.3Tests of groups 1a and C1a.154.4Tests of groups 1b and C1b.164.5Climatic sequence.184.6Test Ca: Damp heat, steady state.204.7Endurance (under d.c. voltage).214.8Charge and discharge.22Annex A (normative)
Test plans for qualification approval and quality conformity inspection24Annex B (normative)
Test schedule for qualification approval.30SIST EN 131200:2003



EN 131200:2002- 4 -1 General1.1 ScopeThis European Standard specifies requirements for fixed capacitors with metallized electrodes andpolypropylene dielectric. It specifies preferred ratings and characteristics and selects from EN 130000the appropriate quality assessment procedure, tests and measuring methods, and gives generalperformance requirements for this subfamily of capacitors.These capacitors may have “self-healing properties” depending on conditions of use. They are mainlyintended for use with direct voltage. Capacitors for alternating voltage and pulse applications will becovered by supplements to this document or a separate document.The maximum power to be applied is 500 var at 50 Hz and the maximum peak voltage is 2 500 V.Two performance grades of capacitors are covered by this specification, grade 1 for long-lifeapplication and grade 2 for normal application.Capacitors for direct connection to the supply mains to provide radio interference suppression are notincluded.1.2 Normative referencesThis European Standard incorporates by dated or undated reference, provisions from otherpublications. These normative references are cited at the appropriate places in the text and thepublications are listed hereafter. For dated references, subsequent amendments to or revisions of anyof these publications apply to this European Standard only when incorporated in it by amendment orrevision. For undated references the latest edition of the publication referred to applies.EN 60062:1993Marking codes for resistors and capacitorsAmendment A1:1997EN 60068 SeriesEnvironmental testingEN 130000:1993General specification: Fixed capacitorsAmendments A1 to A10IEC 60063:1963Preferred number series for resistors and capacitorsAmendment 1:1967Amendment 2:1977ISO 3:1973Preferred numbers - Series of preferred numbers1.3 Information to be given in a detail specification1.3.1 GeneralDetail specifications shall be derived from the relevant blank detail specification.Detail specifications shall not specify requirements inferior to those of the generic, sectional or blankdetail specification. When more severe requirements are included, they shall be listed in clause 10 ofthe detail specification and indicated in the test schedules, for example by an asterisk.NOTEThe information given in 1.3.2. may, for convenience, be presented in tabular form.The information given in 1.3.2 to 1.3.5 shall be given in each detail specification and the valuesquoted shall preferably be selected from those given in the appropriate clause of this sectionalspecification.SIST EN 131200:2003



- 5 -EN 131200:20021.3.2 Outline drawing and dimensionsThere shall be an illustration of the capacitor as an aid to easy recognition and for comparison of thecapacitor with others. Dimensions and their associated tolerances, which affect interchangeability andmounting, shall be given in the detail specification. All dimensions are preferably to be stated inmillimetres.Normally the numerical values shall be given for the length, the width and height of the body and thewire spacing, or for cylindrical types, the body diameter, and the length and diameter of theterminations. When necessary, for example when a number of items (capacitance values/voltageranges) is covered by a detail specification, the dimensions and their associated tolerances shall beplaced in a table below the drawing.When the configuration is other than described above, the detail specification shall state suchdimensional information as will adequately describe the capacitor. When the capacitor is not designedfor use on printed boards, this shall be clearly stated in the detail specification.1.3.3 MountingThe detail specification shall specify the method of mounting to be applied for the application of thevibration and the bump or shock tests. The design of the capacitor may be such that special mountingfixtures are required in its use. In this case the detail specification shall describe the mounting fixturesand they shall be used in the application of the vibration and bump or shock tests.If recommendations for mounting for “normal” use are made, they shall be included in the detailspecification under “9 Additional information (not for inspection purposes)”. If they are included awarning can be given that the full vibration, bump and shock performance may not be available ifmounting methods other than those specified in 1.1 of the detail specification are used.1.3.4 Ratings and characteristicsThe ratings and characteristics shall be in accordance with the relevant clauses of this specification,together with the following:a) rated capacitance range;see 2.2.1NOTE 1
When products approved to the detail specification may have different ranges, the following statement should be added:“The range of values available in each voltage range is given in the Register of approvals CECC 00200”.b) particular characteristics.NOTE 2
Additional characteristics may be listed, when they are considered necessary to specify adequately the component fordesign and application purposes.1.3.5 MarkingThe detail specification shall specify the content of the marking on the capacitor and on the package.Deviations from 1.5 of this sectional specification shall be specifically stated.1.4 DefinitionsFor the purposes of this standard the definitions given in EN 130000 apply, together with thefollowing:1.4.1performance grade 1 capacitorscapacitors intended for long-life applications with stringent requirements for the electrical parametersSIST EN 131200:2003



EN 131200:2002- 6 -1.4.2performance grade 2 capacitorscapacitors for general applications where the stringent requirements of performance grade 1 are notnecessary1.4.3stability gradea grade which is defined by the capacitance drift after climatic and mechanical tests and afterendurance testsNOTEThe performance grade and the stability grade shall be given in the detail specification.1.4.4performance grade and stability grade combinationsTable 1 shows the combinations of the performance grade and the stability gradeTable 1 — Combinations of performance grade and stability gradePerformance gradesStability gradesCombination designations11.1121.22-2The three combinations of performance grades and stability grades concern capacitance stability andtan
values. Distinction in performance of the three combinations are shown in final requirementsafter tests.1.4.5rated voltagethe maximum d.c. voltage which may be applied continuously to a capacitor at the rated temperatureNOTEThe sum of the d.c. voltage, peak a.c. voltage and peak pulse voltage applied to the capacitors shall not exceed the d.c.rated voltage. The value of the peak a.c. voltage allowed at different frequencies is under consideration.1.5 Marking1.5.1The information given in the marking is normally selected from the following list; the relativeimportance of each item is indicated by its position in the list:a) rated capacitance (may be indicated by the code given in EN 60062);b) rated voltage: (d.c. voltage may be indicated by the symbol ____ or _______);c) tolerance on rated capacitance (may be indicated by the code given in EN 60062);d) year and month (or week) of manufacture (may be indicated by one of the codes given inEN 60062);e) manufacturer’s name or trade mark;f) climatic category;g) manufacturer’s type designation;SIST EN 131200:2003



- 7 -EN 131200:2002h) national number of the DS, date of issue and any further information required by the nationalsystem, together with any amendment numbers, if issued.1.5.2The capacitor shall be clearly marked with a), b) and c) of 1.5.1 and with as many as possibleof the remaining items as is considered necessary. Any duplication of information in the marking onthe capacitor should be avoided.1.5.3The package containing the capacitor(s) shall be clearly marked with all the information listedin 1.5.4.1.5.4Any additional marking shall be so applied that no confusion can arise.2 Preferred ratings and characteristics2.1 Preferred climatic categoriesThe capacitors covered by this specification are classified into climatic categories according to thegeneral rules given in EN 60068-1.The lower and upper category temperature and the duration of the damp heat, steady state test shallbe within the following ranges:- Lower category temperature:- 55 C to - 10 C- Upper category temperature:+ 70 C to + 100 C- Duration of the damp heat, steady state test:04 days to 56 days.Values selected within these ranges shall be chosen from those listed in EN 60068-2. The severitiesfor the cold and dry heat tests are the lower and upper category temperatures respectively.2.2 Preferred values of ratings2.2.1 Rated capacitance (CR)Preferred values of rated capacitance are values chosen from the E series of preferred values givenin IEC 60063.2.2.2 Tolerance on rated capacitanceThe preferred tolerances on the rated capacitance are: 20 %;
10 %;
5 %;
2 %;
1 %.SIST EN 131200:2003



EN 131200:2002- 8 -2.2.3 Rated capacitance with associated tolerance valuesPreferred tolerances on the rated capacitance are given in Table 2.Table 2 — Preferred combinationsCapacitance seriesTolerancesE 6
20 %E 12
10 %E 24 5 %E 48 2 %E 96 1 %2.2.4 D.C. rated voltage (UR)The preferred values of d.c. rated voltage are:40; 63; 100; 160; 250; 400; 630; 1000; 1600; 2500 V. These values conform to the basic series ofpreferred values R5 given in ISO 3.2.2.5 Category voltage (UC)The category voltage is:UR for upper category temperatures up to 85 C,0,7 UR for upper category temperature of 100 C.2.2.6 Rated temperatureFor upper category temperatures
85 C the rated temperature is 85 C and for an upper categorytemperature < 85 C the rated temperature is equal to the upper category temperature.3 Quality assessment procedure3.1 Primary stage of manufactureThe primary stage of manufacture is the winding of the capacitor element or the equivalent operation.3.2 Structurally similar componentsCapacitors considered as being structurally similar are capacitors produced with similar process andmaterials, though they may be of different case sizes and values.SIST EN 131200:2003



- 9 -EN 131200:20023.3 Certified test recordsThe information required in 3.6 of EN 130000:1993 shall be made available when prescribed in thedetail specification and when requested by a purchaser. After the endurance test the parameters forwhich variables information is required are the capacitance change, tan
and the insulationresistance.3.4 Qualification approval3.4.1 SamplingThe sample shall be representative of the range of capacitors for which approval is sought. This mayor may not be the complete range covered by the detail specification.The sample shall consist of specimens having the lowest and highest voltages, and for these voltagesthe lowest and highest capacitances. When there are more than four rated voltages an intermediatevoltage shall also be tested. Thus for the approval of a range, testing is required of either four or sixvalues (capacitance/voltage combinations). When the range consists of less than four values thenumber of specimens to be tested shall be that required for four values.The test plan and the samples required for qualification approval are given in A.1. The headings ofcolumns No. 4 to 10 have the following significance:3This is the number of specimens to be tested per value for each group or subgroup4This is the total number of specimens required when four or less values are to betested7This is the total number of specimens required when six values are to be tested5 and 8These are the numbers of permissible non conforming items in any group orsubgroup with reference to columns 5 and 8 respectively.6 and 9These are total number of permissible non conforming items for all groups (otherthan group 0) and subgroups combined with reference to columns 4 and 7respectively.Spares are permitted as follows: one per value which may be used to replace the permitted defective in group 0; one per value which may be used as replacement for specimens lost due to incidents notattributable to the manufacturer.3.4.2 TestsThe complete series of tests specified for the test plan for the selected assessment level given inannex A are required for the approval of capacitors covered by one detail specification. The tests ofeach group shall be carried out in the order given.The whole sample, with the exception of those specimens to be submitted to the tests of group 5,shall be subjected to the tests of group 0 and then divided for the other groups.SIST EN 131200:2003



EN 131200:2002- 10 -Specimens found defective during the tests of group 0 shall not be used for the other groups.One nonconforming item is counted when a capacitor has not satisfied the whole or a part of the testsof a group.The approval is granted when the number of nonconforming items does not exceed the number ofpermissible nonconforming items specified.3.5 Quality conformity inspection3.5.1 Formation of inspection lotsa) Groups A and B inspection These tests shall be carried out on a lot-by-lot basis according to the test plan for the selectedassessment level in annex A. A manufacturer may aggregate the current production into inspection lots subject to the followingsafeguards:1) The inspection lot shall consist of capacitors produced with similar processes and materials,though they may be of different case sizes and values.2) The sample tested shall comprise capacitors of each of the values and dimensionscontained in the inspection lot: — in relation to their number; — with a minimum of five of any one value.3) If the strict application of the sampling plan requires less than five of any one value in thesample, the basis for the drawing of samples shall be agreed between the manufacturer andthe National Supervising Inspectorate.b) Group C inspection These tests shall be carried out on a periodic basis according to the test plan for the selectedassessment level in annex A. Samples shall be representative of the current production of the specified periods and shall bedivided into high, medium and low voltage ratings. In order to cover the range of approvals inany period one case size shall be tested from each voltage group. In subsequent periods othercase sizes and/or voltage ratings in production shall be tested with the aim of covering the wholerange.3.5.2 Delayed deliveryWhen according to the procedures (see 3.7 of EN 130000:1993) re-inspection has to be made,capacitance and solderability shall be checked as specified in group A or B Inspection (lot-by-lot) onlyafter two years storage.4 Test and measurement proceduresNOTEThis section supplements the information given in section 4 of EN 130000:1993.4.1 Visual inspection and check of dimensionsSee 4.4 of EN 130000:1993.SIST EN 131200:2003



- 11 -EN 131200:20024.2 Electrical tests4.2.1 Voltage proofSee 4.6 of EN 130000:1993 with the following additional details.In the test circuits delete the capacitor C1. The product of R1 and the rated capacitance Cx shall besmaller than or equal to 1 s and greater than 0,01 s.R1 includes the internal resistance of the power supply.R2 shall limit the discharge current to a value equal to or less than 1/A.The voltages given in Table 3 shall be applied for a period of 1 min between the measuring points ofTable 3 in 4.5.3 of EN 130000:1993.Table 3 — Test voltagesTest pointTest voltage1a)Grade 1:1,6 URGrade 2:1,4 UR1b), 1c) and 1d)2UR with a minimum of 200 VNOTEThe occurrence of self-healing breakdowns during the application of the test voltages is allowed.4.2.2 CapacitanceSee 4.7 of EN 130000:1993 with the following details.The capacitance shall be measured at, or corrected to, a frequency of 1000 Hz. For rated capacitancevalues
1 F, 50 Hz to 120 Hz may be used, but 1 kHz shall be the referee frequency.The applied peak voltage at 1000 Hz shall not exceed 3 % of the rated voltage, and the applied peakvoltage at 50 Hz to 120 Hz shall not exceed 20 % of the rated voltage with a maximum of 100 V (70V r.m.s).The capacitance shall be within the specified tolerance limits.4.2.3 Tangent of loss angle (tan )See 4.8 of EN 130000:1993 with the following details.a) Measuring conditions for measurements at 1 kHz (lot-by-lot test and where the detailspecification does not prescribe measuring conditions for periodic tests)Tan
shall be measured as follows and the value shall be noted (for reference purposes):— Frequency:100 Hz— Peak voltage: 3 % of the rated voltageSIST EN 131200:2003



EN 131200:2002- 12 -Tan
shall not exceed the values shown in Table 4.Table 4 — Maximum values of tan Tangent of loss angleMeasurementfrequencykHzRated capacitanceFPerformance grade1Performance grade21 kHzCR
1 F 10
10-4 20
10-4NOTE
For C > 1 F, values of tan
should be specified in the detail specification.b) Measuring conditions for measurements at 10 kHz (for tests where specified in the detailspecification)For capacitors with CR
1 F, tan
shall be measured as follows:- Frequency:10 kHz- Voltage:1 V r.m.s. maximum- Measurement error: 5
10-4 (absolute value)NOTEThe requirements are given after the relevant tests4.2.4 Insulation resistanceSee 4.5 of EN 130000:1993 with the following additional details.a) Before measurement, the capacitor shall be fully discharged. The product of the resistance of thedischarge circuit and the rated capacitance of the capacitor under test shall be
0,01 s or anyother value prescribed in the detail specification.b) The measuring voltage shall be in accordance with 4.5.2 of EN 130000:1993.The voltage shall be applied immediately at the correct value through the internal resistance of thevoltage source.The product of the internal resistance and the rated capacitance of the capacitor shall be smaller than1 s or any other value prescribed in the detail specification.SIST EN 131200:2003



- 13 -EN 131200:2002The insulation resistance shall conform to the requirements given in Table 5.Table 5 — Insulation resistanceMinimum RC productMinimum insulationMinimum insulationR = insulation resistancebetween the terminationsresistance between the terminationsresistance betweenterminations and caseC = rated capacitancesGGMeasuring points according to Table 3 in 4.5.3 of EN 130000:19931a)1a)1b)1c)1d)Rated capacitance:> 0,33 F 0,33 FD.C. rated voltage:> 100 V 100 V> 100 V 100 VGrade:12121212300007500150003750100255012,5100c)When the test is made at a temperature other than 20 C, the result shall, when necessary, becorrected to 20 C by multiplying the result of the measurement by the appropriate correctionfactor. In cases of doubt, measurement at 20 C is decisive. The correction factors given inTable 6 can be considered as an average for metallized polypropylene film capacitors.Table 6 — Correction factorsTemperature (C)Correction factor150,75201,0231,25271,5301,75352,0SIST EN 131200:2003



EN 131200:2002- 14 -4.2.5 Inductance (if required)See 4.11 of EN 130000:1993 with the following additional details.The maximum inductance value shall be stated in the detail specification.An approximate value can be derived from measurements of the resonance frequency andcapacitance values as measured in 6.2.2.Requirement: the value of inductance shall be less or equal to the maximum stated in the detailspecification.4.2.6 Characteristics depending on temperature (if required in the detail specification)See 4.22 of EN 130000:1993 with the following details.The static method of 4.22.1 of EN 130000:1993 applies.The capacitance shall be measured at the following temperature: lower category temperature
3 C (see Table 7); (20
2) C; upper category temperature
2 C (see Table 8).The insulation resistance is also measured at upper category temperature, but after the capacitancemeasurement has been made.Table 7 — Characteristics at lower category temperatureTest temperatureTemperature characteristic of capacitance- 10 C and - 25 C0
CC
+ 2,25 %- 40 C0
CC
+ 3 %- 55 C0
CC
+ 3,75 %SIST EN 131200:2003



- 15 -EN 131200:2002Table 8 — Characteristics at upper category temperatureTestCharacteristicMinimumInsulationtemperaturecapacitance/Insulation resistanceresistancetemperature(measuring point 1a)(measuring pointCR > 0,33 FCR
0,33 F1b), 1c) or 1d)Ri
CR (s)Ri (G)(G)70 C- 2,5 %
CC 01 5005585 C- 3,25 %
CC 01 20044100 C- 4 %
CC 0 7502,52,54.3 Tests of groups 1a and C1a4.3.1 Initial measurementsThe capacitance and tan
shall be measured according to 4.2.2 and 4.2.3 respectively. Forcapacitors with rated capacitance CR
1 F, tan
shall be measured at 10 kHz, for CR > 1 F, tan shall be measured at 1 kHz.4.3.2 Test U: Robustness of terminationsSee 4.13 of EN 130000:1993 with the following additional details.Test Ub: Bending and test Uc: Torsion are not required for components with terminations at one endintended for use on printed circuits.4.3.3 Test Tb: Resistance to soldering heatSee 4.14.2 of EN 130000:1993 with the following additional details.No predrying. Method 1A or method 1B shall be used as prescribed in the detail specification.SIST EN 131200:2003



EN 131200:2002- 16 -4.3.4 Final inspection and measurementThe capacitors shall be inspected and measured and shall meet the requirements given in Table 9.Table 9 — RequirementsExaminationMethod ofMeasurementRequirementsor measurementexaminationreferenceVisual examination4.2-No visible damageGrade 1,1Measured value at4.3.1CC 1 %CapacitanceGrade 1,2-CC 2 %Grade 2CC 3 %Tangent ofGrade 1,1Measured value at tan
10
10-4loss angleGrade 1,2-4.3.1 tan
20
10-4(for CR
1 F 1))Grade 2 tan
40
10-41) For CR > 1 F the requirements shall be given in the detail specification.4.4 Tests of groups 1b and C1b4.4.1 Initial measurementsThe capacitors shall be measured as specified in 4.3.1.4.4.2 Solderability4.4.2.1 GeneralThis test is not applicable to capacitors with screw terminations or capacitors with terminationsdesignated in the detail specification as not intended to be soldered.See 4.15 of EN 130000:1993 with the details given in 4.4.2.2.4.4.2.2 Test conditionsAgeing of 4 h dry heat at 155 C shall be applied unless the detail specification specifies no ageing ora different ageing procedure.When method 2 is used, a soldering iron of size A shall be used.SIST EN 131200:2003



- 17 -EN 131200:20024.4.2.3 RequirementsFor methods 1 and 2, the terminations shall be examined for good tinning as evidenced by freeflowing of the solder with wetting of the terminations. For method 3, the soldering time shall be lessthan 3 s.4.4.3 Test Na: Rapid change of temperatureSee 4.15 of EN 130000:1993 with the following additional details.Initial measurements shall be in accordance with 4.3.1.Number of cycles: 5Duration of exposure: 30 min, unless otherwise prescribed in the detail specification.After recovery, the capacitors shall be visually inspected and measured as prescribed in the detailspecification; they shall meet the requirements of the detail specification.4.4.4 Test Fc: Vibration, sinusoidalSee 4.16 of EN 130000:1993 with the following additional details.No initial measurements to be made. Procedure B4 and the following degree of severity of test Fcapply: 0,75 mm displacement or 98 m/s2, whichever gives the lower amplitude, over one of thefollowing frequency ranges: 10 Hz to 55 Hz, 10 Hz to 500 Hz, 10 Hz to 2000 Hz. The duration shall be3
2 h.The detail specification shall specify the frequency range to be used.The c
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