SIST EN 60444-1:2002
(Main)Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
Specifies a simple method of measurement of resonance frequency and resonance resistance of quartz crystal units and describes a suitable measuring network for use over the frequency range 1 MHz to 200 MHz.
Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-Netzwerk -- Teil 1: Verfahren zur Messung der Resonanzfrequenz und des Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem Pi-Netzwerk
Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi -- Partie 1: Méthode fondamentale pour la mesure de la fréquence de résonance et de la résistance de résonance des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi
Définit une méthode simple de mesure de la fréquence de résonance et de la résistance de résonance des résonateurs à quartz et décrit un circuit de mesure convenable, applicable dans une gamme de fréquences de 1 MHz à 200 MHz.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in pi-network (IEC 60444-1:1986)
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SLOVENSKI STANDARD
SIST EN 60444-1:2002
01-september-2002
Measurement of quartz crystal unit parameters by zero phase technique in a pi-
network - Part 1: Basic method for the measurement of resonance frequency and
resonance resistance of quartz crystal units by zero phase technique in pi-network
(IEC 60444-1:1986)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -
- Part 1: Basic method for the measurement of resonance frequency and resonance
resistance of quartz crystal units by zero phase technique in a pi-network
Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-
Netzwerk -- Teil 1: Verfahren zur Messung der Resonanzfrequenz und des
Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem
Pi-Netzwerk
Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle
dans le circuit en pi -- Partie 1: Méthode fondamentale pour la mesure de la fréquence
de résonance et de la résistance de résonance des quartz piézoélectriques par la
technique de phase nulle dans le circuit en pi
Ta slovenski standard je istoveten z: EN 60444-1:1997
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
SIST EN 60444-1:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 60444-1:2002
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SIST EN 60444-1:2002
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SIST EN 60444-1:2002
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SIST EN 60444-1:2002
NORME
CEI
INTERNATIONALE
IEC
444-1
INTERNATIONAL
Deuxième édition
STANDARD
Second edition
1986
piézoélectriques
Mesure des paramètres des quartz
par la technique de phase nulle dans le circuit en it
Première partie:
Méthode fondamentale pour la mesure de la fréquence
de résonance et de la résistance de résonance des
quartz piézoélectriques par la technique de phase
nulle dans le circuit en 7L
Measurement of quartz crystal unit parameters
network
by zero phase technique in a it-
Part 1:
Basic method for the measurement of resonance
frequency and resonance resistance of quartz crystal
units by zero phase technique in a it-network
© CEI 1986 Copyright - all rights reserved
Droits de reproduction réservés —
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized
utilisée sous quelque forme que ce soit et par aucun procédé, in any form or by any means, electronic or mechanical,
la photocopie les crofilm, without permission
électronique ou mécanique, y compris et including photocopying and mi
microfilms, sans l'accord écrit e publisher
de l'éditeur. in writing from th
Genève Suisse
Bureau central de la Commission Electrotechnique Internationale 3, rue de Varembé
Commission Electrotechnique Internationale CODE PRIX
International Electrotechnical Commission PRICE CODE
IEC
McKomapoaHae 3neerporexHH4ecKan Konnwccta
• Pour prix, voir catalogue en vigueur
•
For price, see current catalogue
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SIST EN 60444-1:2002
— 3 —
444-1©IEC 1986
CONTENTS
Page
FOREWORD 5
5
PREFACE
Clause
7
1. Scope
7
2. Definition of resonance frequency
Reference plane and shielding box 9
3.
4. Principle of measurement 9
5. Measuring circuit 9
5.1 The it-network 11
5.2 Accessories of the it-network 15
5.3 Associated equipment 15
Method of measurement 21
6.
6.1 Initial calibration of the It-network 21
6.2 Frequency and resistance measurement 23
A — Additional information on accuracy
APPENDIX 25
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SIST EN 60444-1:2002
– 5 –
444-1 IEC 1986
INTERNATIONAL ELECTROTECHNICAL COMMISSION
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS
BY ZERO PHASE TECHNIQUE IN A H-NETWORK
Part 1: Basic method for the measurement of resonance frequency
and resonance resistance of quartz crystal units by zero phase technique
in a 7c-network
FOREWORD
1) The formal decisions or agreements of the I E C on technical matters, prepared by Technical Committees on which all the
National Committees having a special interest therein are represented, express, as nearly as possible, an inte rnational consensus
of opinion on the subjects dealt with.
They have the form of recommendations for international use and they are accepted by the National Committees in that
2)
sense.
rnational unification, the I E C expresses the wish that all National Committees should adopt the text of
3) In order to promote inte
the I E C recommendation for their national rules in so far as national conditions will permit. Any divergence between the I E C
the corresponding national rules should, as far as possible, be clearly indicated in the latter.
recommendation and
PREFACE
This standard has been prepared by I E C Technical Committee No. 49: Piezoelectric Devices for
Frequency Control and Selection.
This second edition replaces the first edition of IEC Publication 444 (1973).
rt 1 of a series of publications dealing with the measurement of quartz crystal
This standard forms Pa
unit parameters by zero phase technique in a it-network.
2: Phase Offset Method for Measurement of Motional Capacitance of Qua rtz Crystal Units,
Part
issued as IEC Publication 444-2 (1980).
Part 3, containing a basic method for the measurement of two-terminal parameters of quartz crystal
units up to 200 MHz by phase technique in a it-network with compensation of the parallel capacitance
Co, will be issued as I EC Publication 444-3.
4 containing a method for the measurement of load resonance frequency f L, load resonance
Part
and pulling sensi-
L, frequency pulling range O
resistance R L, load resonance frequency offset Of
fL1, L2
tivity S, will be issued as I E C Publication 444-4.
The text of this standard is based on IEC Publication 444 (first edition 1973) with the amendments
contained in the following documents:
Report on Voting
Six Months' Rule
49(CO)141 49(CO)152
Further information can be found in the Repo rt on Voting indicated in the table above.
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SIST EN 60444-1:2002
– 7
444-1 © IEC 1986
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS
BY ZERO PHASE TECHNIQUE IN A II-NETWORK
Part 1: Basic method for the measurement of resonance frequency
and resonance resistance of quartz crystal units by zero phase technique
in a n-network
1. Scope
This standard specifies a simple method of measurement of resonance frequency and resonance
resistance of quartz crystal units and describes a suitable measuring network.
The measuring method and the network are suitable for use over the frequency range 1 MHz to
200 MHz with a fractional frequency accuracy of the order of 10 - 6 with a reproducibility of 10-6
depending on the type of crystal unit being measured, and an accuracy of the measurement
to 10- 8
of resonance resistance of ± 2% to ± 5% depending on the accuracy of the voltage measure-
ment.
However, above approximately 100 MHz the use of this measuring method is limited by the
effects of the shunt capacitance Co of the crystal unit under test. To enable the measuring method
to be used under these conditions, the use of some method of Co compensation is advisable.
A method of Co compensation will be issued in IEC Publication 444-3 as an IEC repo rt.
Note. — The modifications to the measuring system and network contained in this standard have been introduced to
ensure that the claims contained within it are achievable. They do not, however, invalidate the network produced
according to the first edition. These networks are still acceptable as an inte rnational standard method of
measurement of resonance frequency f and resonance resistance Rr.
If the reference resistors described in the standard are slightly modified to allow inse rtion into networks man-
ufactured according to the first edition of Publication 444 then the problem of obtaining satisfactory reference
resistors is solved.
2. Definition of resonance frequency
The crystal unit is a 3-terminal network with a complex transfer admittance Y B 12 , as
12 = G 12 + j
defined in Sub-clause A1.1 of Appendix A.
The enclosure is considered as the common terminal.
For glass enclosures, the third terminal is defined in Clause 3.
The resonance frequency is defined as the lower of the two frequencies of the crystal unit alone
under specified conditions at which B12 is zero.
At this frequency, the resonance resistance is 1/G
12 = Rr.
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SIST EN 60444-1:2002
444-1 © IEC 1986 9
3. Reference plane and shielding box
Because of lead inductance of the crystal unit it is necessary to specify a reference plane at which
the measurements are to be made. This plane is located at a distance of 2 mm from the place where
the pins or leads emerge from the crystal unit, unless otherwise specified. The third terminal for
glass enclosures is a metal shielding box with internal dimensions 27 mm in height and the base
plane of 40 mm x 40 mm (base plane = reference plane) and closed at the top. The crystal unit is to
be located at the centre of the base plane of the shielding box.
4. Principle of measurement
The measurement is reduced to a 2-terminal impedance measurement by inserting the crystal
unit in a it-network (see Figure 1).
The phase of the crystal transfer admittance is indicated on a phasemeter connected across the
it-network. The frequency giving zero phase reading is measured.
Zero phase is calibrated by inserting a reference resistor in the n-network. The value of the
resonance resistance can be calculated from the voltage readings on channels A and B.
5. Measuring circuit
The measuring circuit consists basically of a It-network connected with coaxial cables to the
associated equipment (see Figure 1).
Frequency
counter
A
Attenuator 30 dB
Generator
50S2
f--
I ^^
Attenuator
O 1 I
^
-TJ
50 Sz
Line stretcher/
n-network
line equalizer
B
384/85
Notes 1. —
The 30 dB attenuator in channel A may be desirable with certain phasemeters and voltmeters.
2. —
The line stretcher of constant impedance in channel B may be desirable for ease of equalizing the electrical
length of the connecting cables. (A "line stretcher" with va
ri
able length is a phase equalizing device of constant
impedance.)
3.
— When using some generators it may be advisable to use a filter to reduce the harmonic distortion to the level
specified in Sub-clause 5.3.1.1.
FIGURE 1
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SIST EN 60444-1:2002
444-1 OOIEC 1986 – 11 –
The fact is emphasized that the construction of the it-network determines the accuracy of the
set-up, whereas the associated equipment can be extended, if necessary, to produce a very
sophisticated set-up. For this reason, only the essential elements of the associated equipment are
specified (see Sub-clause 5.3).
5.1 The m-network
5.1.1 Electrical specification
5.1.1.1 Circuit diagram
385/85
FIGURE 2
R 2 = R6 = 159 Ç (disk type)
3 5 = 14.2 S2 (disk type)
R = R
R 4 = R = 66.2 S2 (rod type)
7
Tolerance ± 1%
2 = 0.5 pF to 5 pF (air trimmer)
Ct t = Ct
The function of the input and output pads is twofold:
Note. —
a) to match the crystal impedance to the associated equipment;
to attenuate reflections from the associated equipment.
b)
5.1.1.2 The frequency range shall be 1 MHz to 200 MHz.
5.1.1.3 The logarithmic ratio of the respective voltages at the B-channel with and without the shorting
blank inserted in the n-network is termed the "cross-talk attenuation" of the n-network test set-up.
(in decibels) is given by the expression:
The cross-talk attenuation a c
VBs
ac = 20 log ,
VBo
is the voltage at the B-channel with the shorting blank inserted into the m-network and
where VBs
is the voltage at the B-channel with the shorting blank removed from the n-network. Measured
VBo
at a frequency of 100 MHz in the measuring circuit according to Figure 1, page 9, the cross-talk
attenuation shall be >60 dB.
5.1.1.4 At all frequencies between 1 MHz and 200 MHz the phase measured at 75 S2 shall not deviate
by more than ± 0.2° from the phase measured at 25 S2 in the measuring circuit according to
Figure 1 (see Sub-clause 6.1).
At a frequency of 200 MHz, the phase over the resistance range 15 f2 to 100 S2 shall not deviate
by more than ± 0.5° from the phase measured at 25 S2 in the measuring circuit according to
Figure 1 (see Figure 3, page 13, and Sub-clause 6.1).
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SIST EN 60444-1:2002
1986 –
444-1 © IEC 13 –
q)(*)
+0.4
+0.2
0 10 MHz
50 MHz
- 0.2
100 MHz
- 0.4
200 MHz
- 0.6
- 0.8
- 1.0
- 1.2
- 1.4
- 1.6 -
I I t I l.
0 25 100 R(0)
50 75
386/85
FIG.
3. – Plot showing the phase change from the value at 25 S2 versus reference resistor values from
0 to 100 51 at 10 MHz, 50 MHz, 100 MHz and 200 MHz. Measuring circuit according to
Figure 1, page 9.
5.1.1.5 At all levels of drive between 5 pW and 5 mW the phase measured at 25 S2 shall not deviate by
more than ± 0.5° over the frequency range 1 MHz to 200 MHz from the phase measured at
0.5 mW in the measuring circuit according to Figure 1.
5.1.1.6 At all frequencies between 1 MHz and 200 MHz the resistance of the 25 5 -2 reference resistor
shall not deviate by more than 2% from the value measured at 1 MHz in the measuring circuit
according to Figure 1.
5.1.1.7 At a frequency of 200 MHz, the reflection coefficient measured with the shorting blank having
the dimensions of Sub-clause 5.2.2 shall be less than 5% within the reference temperature range
–55 °C to +105 °C. The output and input shall be terminated within 50 S2.
5.1.1.8 Measured with the shorting metal blank of Sub-clause 5.2.2 in the it-network, the insertion
attenuation over the specified frequency range shall be 29.6 ± 0.3 dB.
5.1.1.9 The stray capacitance between contact plates shall be smaller than 0.05 pF.
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SIST EN 60444-1:2002
444-1 © IEC 1986 – 15 –
5.1.1.10 With the 25 S2 reference resistor of Sub-clause 5.2.1 in the n-network set-up as Figure 1, page 9,
the phase is measured over the temperature range –55 °C to +105 °C at a frequency of 200 MHz.
The permissible difference is ± 0.2° with reference to the value at +25 °C.
5.1.1.11 The resistance between the contact plates and the body of the terminated n-network shall be
R
12.5 E2. The tolerance is defined by the tolerances of R 2 to 7 (Figure 2, page 11).
5.1.2 Mechanical specification
Typical n-networks which meet the requirements of Sub-clause 5.1.1 consist of the following
part
s (see Figures A9 to A13, pages 37 to 43).
a) Two resistive attenuators (14.8 dB each) in a metal body, consisting of resistors
R 2 to R 7 (see
Figure 2).
b) Two coaxial connectors (50 S2) with sufficiently low contact resistance.
c) Two contact plates against which the crystal terminals are pressed. The contacts with the crystal
terminals shall be made at the top edges of contact plates, which se rve to define the reference
plane.
d) Two spring-loaded plastic blocks.
e) Plastic spacer to determine the location of the reference plane.
f) Dielectric.
g) Two high-frequency precision air t rimmers 0.5 pF to 5
...
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