SIST EN 61106:1999

SLOVENSKI STANDARD
SIST EN 61106:1999
01-april-1999
Videodisks - Methods of measurements for parameters (IEC 61106:1993)
Videodisks - Methods of measurements for parameters
Videoplatten - Meßverfahren der Eigenschaften
Vidéodisques - Méthodes de mesure des paramètres
Ta slovenski standard je istoveten z: EN 61106:1993
ICS:
33.160.40 Video sistemi Video systems
SIST EN 61106:1999 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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NORME CEI
INTERNATIONALE IEC
61106
INTERNATIONAL
Première édition
STANDARD
First edition
1993-05
Vidéodisques — Méthodes de mesure
des paramètres
Videodisks — Methods of measurement
for parameters
© IEC 1993 Droits de reproduction réservés — Copyright - all rights reserved
Aucune partie de cette publication ne peut étre reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: X41 22 919 0300 e-mail: inmail@iec.ch IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
PRICE CODE
International Electrotechnical Commission
IEC MemityHapoitHaR 311eMTpOTexH114eCHHH HOMHCCHA
Pour prix, voir catalogue en vigueur
• •
For price, see current catalogue

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1106 ©IEC:1993 - 3 -
CONTENTS
Page
FOREWORD 5
INTRODUCTION 7
Clause
1 Scope 9
2 Normative references 9
3 List of parameters and their applications 9
4 Standard atmospheric conditions for testing 15
Table 1 - Measuring items 15
Annexes
A Thickness of protective transparent layer 21
B Rotation speed 23
C Track position and number 25
D Track depth 29
E Vert
ical deviation and acceleration of VHD 33
F Vert
ical deviation and acceleration of LV 39
G Radial deviation and acceleration of VHD 45
H
Radial deviation and acceleration of LV 51
J Tangential deviation of VHD 55
K
Tangential deviation of LV 57
L Birefringence of transparent disk 59
M Audio subcarrier amplitude and EFM amplitude 61
N
Audio subcarrier frequencies, channels 1 and 2 63
P
Maximum video level 67
Q Blanking level frequency 71
R Main carrier deviation 73
S
Pre-emphasis audio 75
T Pre-emphasis video 79
U Operation signals 83

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_ 5
1106 ©IEC:1993
INTERNATIONAL ELECTROTECHNICAL COMMISSION
VIDEODISKS - METHODS OF MEASUREMENT FOR PARAMETERS
FOREWORD
1)
The IEC (International Electrotechnical Commission) is a worldwide organization for standardization
comprising all national electrotechnical committees (IEC National Committees). The object of the IEC is to
promote international cooperation on all questions concerning standardization in the electrical and
electronic fields. To this end and in addition to other activities, the IEC publishes International Standards.
Their preparation is entrusted to technical committees; any IEC National Committee interested in
the subject dealt with may participate in this preparatory work. International, governmental and
non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates closely with the International Organization for Standardization (ISO) in accordance with
conditions determined by agreement between the two organizations.
2)
The formal decisions or agreements of the IEC on technical matters, prepared by technical committees on
which all the National Committees having a special interest therein are represented, express, as nearly as
possible, an international consensus of opinion on the subjects dealt with.
3)
They have the form of recommendations for international use published in the form of standards, technical
reports or guides and they are accepted by the National Committees in that sense.
4)
In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
This International Standard IEC 1106 has been prepared by IEC by sub-committee 60B:
Video recording, of IEC technical committee 60: Recording.
The text of this standard is based on the following documents:
DIS Report on Voting
60B(CO)134
60B(CO)147A
Full information on the voting for the approval of this standard can be found in the report
on voting indicated in the above table.

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1106 ©I EC:1993 _ 7 _
INTRODUCTION
Two videodisk systems are covered by the lEC publications quoted in clause 2. In order to
play back these two types of videodisks it is necessary to use an optical pick-up device for
the optical system and a capacitance pick-up device for the capacitance system. These
videodisks are characterized by mechanical, electrical and optical parameters for which
measuring methods are unknown.

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1106 ©IEC:1993 - 9 -
VIDEODISKS - METHODS OF MEASUREMENT FOR PARAMETERS
1 Scope
This International Standard collects the different typical parameters for videodisks
described in IEC 844, 845, 856 and 857 and proposes a method of measurement for each.
Some of these parameters can be measured by well known methods existing in every labo-
ratory, whilst other parameters need specific equipment described in the annexes.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute
provisions of this International Standard. At the time of publication, the editions indicated
were valid. All standards are subject to revision, and parties to agreements based on this
International Standard are encouraged to investigate the possibility of applying the most
recent editions of the standards indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 844: 1988, Pre-recorded capacitance grooveless videodisk system. 50 Hz/625 lines -
PAL, on Type VHD
IEC 845: 1988, Pre-recorded capacitance grooveless videodisk system. 60 Hz/525 lines -
NTSC, on Type VHD
Pre-recorded optical reflective videodisk system. «Laser vision» 50 Hz/625
IEC 856: 1986,
lines - PAL
IEC 857: 1986, Pre-recorded optical reflective videodisk system. «Laser vision» 60 Hz/525
lines - M/NTSC
3 List of parameters and their applications
Applies to Classification
(note 2)
3.1 Mechanical parameters
3.1.1 Thickness of protective transparent layer LV, (note 1) (3)
3.1.2 Thickness of disk areas LV, VHD (1)
3.1.3 Outer radius of disk LV, VHD (1)
3.1.4 Diameter of center hole LV, VHD (1)
3.1.5 Concentricity of disk assembled from two
single disks LV (1)
3.1.6 Inside diameter of label LV (1)
3.1.7 Outside diameter of label LV (1)
For the notes, see page 13.

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1106@ IEC:1993 – 11 –
Applies to
Classification
(note 2)
3.1.8 Rotation speed
3.1.8.1
Angular velocity of CAV* disk LV, VHD
(3)
3.1.8.2 Linear velocity of CLV** disk LV
(3)
3.1.8.3 Angular acceleration for CLV disk
LV (3)
3.1.9 Mass of the disk LV
(1)
3.1.10 Maximum unbalance force
LV, VHD (1)
3.1.11
Starting radius lead-in tracks LV, VHD (1)
3.1.12 Starting radius programme area
LV, VHD (1)
3.1.13
End radius programme area and starting position LV, VHD (1)
of lead-out tracks
3.1.14
Minimum number of programme tracks LV (1)
3.1.15 Length of lead-out tracks
LV (1)
3.1.16
Inner radius programme end signal area VHD (1)
3.1.17 Track pitch LV, VHD
(3)
3.1.18 Width and depth of information track
VHD (3)
3.1.19 Width and depth of pilot signal track VHD
(3)
3.1.20
Vertical deviation of programme tracks
during playback
3.1.20.1 Maximum distance from reference plane LV, VHD (3)
3.1.20.2 Maximum vertical acceleration LV, VHD
(3)
3.1.20.3
Maximum vertical deviation LV, VHD (3)
3.1.20.4 Maximum velocity LV
(3)
3.1.21
Maximum static deflection of disk LV, VHD (1)
3.1.22 Radial deviation of programme tracks
during playback LV, VHD (1)
3.1.22.1 Maximum deviation during one revolution
LV, VHD (3)
3.1.22.2 Maximum radial deviation LV, VHD
(3)
3.1.22.3
Maximum radial acceleration LV, VHD (3)
3.1.23 Tangential deviation of programme tracks
3.1.23.1 Maximum time base error
LV, VHD (3)
3.1.23.2 Shift between two adjacent tracks LV, VHD
(3)
3.1.24
Disk case VHD (1)
•
Constant Angular Velocity.
** Constant Linear Velocity.
Note 2, see page 13.

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1106 © I EC:1993 - 13 -
Applies to Classification
(note 2)
3.2 Disk material parameters
3.2.1 Refractive index LV (1)
3.2.2 Birefringence of transparent disk LV (3)
(1)
3.2.3 Reflectivity LV
3.2.4 VHD (2)
Surface resistivity
3.3 Recorded parameters
(1)
3.3.1 Audio subcarrier amplitude and EFM (note 3) LV, VHD
amplitude
LV, VHD (1)
3.3.2 Audio subcarrier frequencies, channels 1 and 2
Audio subcarrier frequency maximum deviation LV, VHD (1)
3.3.3
Video signal standards (visual check), color burst,
3.3.4
(1)
VIRS (note 3), ITS (note 3), address signals LV, VHD
LV, VHD (1)
3.3.5 Maximum video level
3.3.6 Blanking level frequency LV, VHD (1)
LV, VHD (1)
3.3.7 Main carrier deviation
VHD (1)
3.3.8 Pilot frequency
Pre-emphasis audio and video
3.3.9
LV, VHD (1)
3.3.9.1 Pre-emphasis audio
(1)
3.3.9.2 Pre-emphasis video LV, VHD
LV, VHD (1)
3.3.10 Digital data encoding format correctness
3.4 Operation signals
3.4.1 Radial signal
LV (3)
3.4.1.1 Radial modulation index
LV (3)
3.4.1.2 Radial reflection index
3.4.1.3 Radial signal to error ratio LV (3)
3.4.2 Push-pull tracking signal
3.4.2.1 Magnitude LV (3)
LV (3)
3.4.2.2 Noise
Tangential signal
3.4.3
LV, VHD (3)
3.4.3.1 Drop outs
LV (3)
3.4.3.2 Signal to noise ratio
LV (3)
3.4.4 High frequency modulation index
NOTES
1 LV Laser vision
2 (1) Parameters which can be measured by conventional techniques.
(2) Parameters for which specific methods exist with an IEC definition.
Parameters of videodisk technology which need specific attention.
(3)
3 EFM Eight to Fourteen Modulation.
VIRS Vertical Interval Reference Signal.
ITS International Test Signal.

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1106 ©IEC:1993 - 15 -
4
Standard atmospheric conditions for testing
Measurements and mechanical checks shall be carried out at any combination of tem-
perature, humidity and air pressure within the following limits unless otherwise specified
for ce rt
ain parameters in IEC 844, 845, 856 and 857:
Ambient temperature:
15 °C to 35 °C;
Relative humidity: 45%to75%;
Air pressure:
86 kPa to 106 kPa.
Samples shall be conditioned in the testing environment for 24 h before testing.
Table 1 - Measuring items
Parameters
LV VHD
3.1 Mechanical parameters
3.1.1 Thickness of protective transparent layer
Annex A —
3.1.2 Thickness of disk areas
A disk may be measured with sufficient accuracy
by means of general measuring instruments such
3.3.1.3 Outer radius of disk
as a dial gauge, thickness gauge, caliper, and
3.1.4 Diameter of centre hole
plug gauge
3.1.5 Concentricity of disk assembled from
two single disks
3.1.6 Inside diameter of label
3.1.7 Outside diameter of label
3.1.8 Rotation speed
Annex B
3.1.8.1 Angular velocity of CAV disk
3.1.8.2 Linear velocity of CLV disk —
Conventional method —
3.1.8.3 Angular acceleration for CLV disk
A disk shall be measured on a dynamic
3.1.9 Mass of the disk
balancing machine with a specified rotation
3.1.10 Maximum unbalance force
speed
Annex C
3.1.11 Starting radius lead-in tracks
3.1.12 Starting radius programme area
3.1.13 End radius programme area and starting
position of lead-out tracks
3.1.14 Minimum number of programme tracks
3.1.15 Length of lead-out tracks
3.1.16 Inner radius programme end signal
—
Annex C

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1106 © IEC:1993
- 17 -
Table 1
(continued)
Parameters
LV VH D
Optical microscope (measure mean track pitch)
3.1.17 Track pitch
3.1.18 Width and depth of information track
3.1.19 Annex D
Width and depth of pilot signal track
3.1.20
Vertical deviation of programme tracks
during playback
3.1.20.1 Maximum distance from reference plane
Annex F Annex E
3.1.20.2 Maximum vertical acceleration
3.1.20.3 Maximum ve rt
ical deviation
3.1.20.4 Maximum velocity
3.1.21
Maximum static deflection of disk
Mechanical method
3.1.22
Radial deviation of programme tracks
during playback
3.1.22.1 Maximum deviation during one revolution
3.1.22.2 Maximum radial deviation Annex H Annex G
3.1.22.3 Maximum radial acceleration
3.1.23 Tangential deviation of programme tracks Annex K
Annex J
Special test disk will be required for this
3.1.23.1
Maximum time base error
measurement.
3.1.23.2 Shift between two adjacent tracks
Conventional disk under consideration.
3.1.24 Disk case
Conventional method
3.2
Disk material parameters
Conventional method
3.2.1 Refractive index
Annex L
3.2.2 Birefringence of transparent disk
3.2.3 Reflectivity Conventional method
3.2.4 Surface resistivity
IEC 93

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1106 © I EC:1993
- 19 -
Table 1 (concluded)
Parameters
LV VI-10
3.3 Recorded parameters
Optical microscope (measure mean track pitch)
3.3.1 Audio subcarrier amplitude and EFM amplitude
Annex M
3.3.2 Audio subcarrier frequencies, channels 1 and 2
Annex N
3.3.3 Audio subcarrier frequency maximum deviation
Special test disk will be required for this
measurement
3.3.4 Video signal standards (visual check), color
Verify the location of
burst, VIRS, ITS, address signals
each test signal by use
—
of waveform monitor
3.3.5 Maximum video level
Annex P
3.3.6 Blanking level frequency
Annex Q
3.3.7 Main carrier deviation
Annex R
3.3.8 Pilot frequency
—
Under consideration
3.3.9 Pre-emphasis audio and video
3.3.9.1 Pre-emphasis audio
Annex S
3.3.9.2 Annex T Under consideration
Pre-emphasis video
3.3.10 Digital data encoding format correctness
Digital data can be measured on a waveform
monitor or video monitor at vertical
blanking time interval
3.4 Operation signals
3.4.1 Radial signal
3.4.1.1 Radial modulation index
3.4.1.2 Radial reflection index Annex U
3.4.1.3 Radial signal to error ratio
3.4.2 Push-pull tracking signal
3.4.2.1 Magnitude
Annex U
3.4.2.2 Noise
3.4.3 Tangential signal
Annex U
3.4.3.1 Drop outs
3.4.3.2 Signal to noise ratio
3.4.4 High frequency modulation index

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1106 ©I EC:1993 - 21 -
Annex A
(normative)
Thickness of protective transparent layer
A.1 Application
This measuring method shall be applied.
Parameter Applies to
3.1.1 Thickness of protective transparent layer LV —
A.2 Measuring apparatus
Microscope.
A.3 Measurement
The difference between the positions (a) and (b) of the microscope objective (see figure
A.1) is
x.
(a) The microscope is focused on the information layer.
(b) The microscope is focused on the su rface of the transparent layer.
The refractive index of the disk material is n.
The thickness of the transparent layer is d = x/n.

a)
b)
IEC 588/93
Figure A.1 - Measuring method

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1106 ©IEC:1993 – 23 –
Annex B
(normative)
Rotation speed
B.1 Application
This measuring method shall be applied.
Parameters
Applies to
3.1.8.1 Angular velocity of CAV disk LV VHD
3.1.8.2 Linear velocity of CLV disk
LV
3.1.8.3 Angular acceleration of CLV disk LV —
B.2 Measuring apparatus
^
C
^
i I Modified videodisk player
Optical stylus or standard pick-up radius
r (m)
EH
r
!EC 589/93
w is the progressive average over one revolution (rad/s).
The measuring equipment is a modified videodisk player provided with an indication of the
motor angular velocity w in radians per second and with an indication of the distance
r, in
metres from the optical stylus or standard pick-up to the geometric centre of the centre
hole.
These parameters and their time dependent changes give the possibility of recording
the angular velocity of a CAV disk, the linear velocity of a CLV disk, and the angular
acceleration of a CLV disk at any radius of the disk.
When a modified videodisk player delivers a coloured picture to a TV set, the spindle
motor has the correct angular velocity
w=2nf
where f is the frequency.
B.3 Measurement
B.3.1 (3.1.8.1) Angular velocity of CAV disk
Frequency LV VHD
NTSC 29,97 Hz 14,985 Hz
PAL 25 Hz 12,5 Hz
B.3.2 (3.1.8.2) Linear velocity of CLV disk (for LV)
V = CO x r
B.3.3 (3.1.8.3) Angular acceleration of CLV disk (for LV)
d c,)
CC =
d t

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1106 © I EC:1993 _ 25 _
Annex C
(normative)
Track position and number
C.1 Application
This measuring method shall be applied.
Parameters Applies to
3.1.11 Starting radius lead-in tracks LV VHD
3.1.12 Starting radius programme area LV VHD
3.1.13 End radius programme area
LV VHD
3.1.14 Minimum number of programme tracks
LV
3.1.15 Length of lead-out tracks
LV
3.1.16 Inner radius programme end signal — VHD
C.2 Measuring apparatus
Modified videodisk player
Optical stylus or standard pick-up radius r (m)
lEC 589/93
The measuring equipment is a modified videodisk player provided with an indication of the
distance r, in metres, from the optical stylus or standard pick-up to the geometric centre of
the centre hole.
The signal from the video output is fed into a video waveform monitor.
C.3 Measurement
C.3.1 (3.1.11) Starting radius lead-in tracks
When the lead-in code is present for the first time in the vertical interval control and
address signals, the average radius of this track (r, in metres) gives the start position of
the lead-in tracks.
C.3.2 (3.1.12) Starting radius programme area
When the picture or time code is present for the first time in the control and address
signals, the average radius of this track (r,
in metres) gives the starting radius of the
programme area.

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1106 ©IEC:1993 – 27 –
C.3.3 (3.1.13) End radius programme area
When the lead-out code is present for the first time, the average radius of this track (r, in
metres) gives the end radius of the programme area.
C.3.4 (3.1.14) Minimum number of programme tracks (for LV)
C.3.3) minus the starting radius of the
The end radius of the programme area (see
programme area (see C.3.2), divided by the track pitch, gives the minimum number of
programme tracks.
C.3.5 (3.1.15) Length of lead-out tracks (for LV)
C.3.3. The difference between the maximum radius
The measuring method is the same as
at the end of the programme and the maximum radius where the lead-out code is present
for the last time gives the length of the lead-out tracks.
C.3.6 (3.1.16) Inner radius of programme end signal area (for VHD)
When the lead-out code is present for the last time in a track, the average radius of this
track (r, in metres) gives the inner radius of the programme end signal area.

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1106 © I EC:1993 - 29 -
Annex D
(normative)
Track depth
D.1 Application
This measuring method shall be applied.
Applies to
Parameters
VHD
3.1.18 Width and depth of information track —
VHD
3.1.19 Width and depth of pilot signal track —
D.2 Measuring apparatus
Scanning electron microscope
D.3 Measurement
Figures D.1 and D.2 show scanning electron microscope photographs.
(a)
(b)
IEC 590/93
(a) Represents a side view of the pits in normal condition.
(b) Shows the same section, but amplified five times, in the vertical direction.
Figure D.1 - Information track

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1106 © I EC:1993 -31 -
(a)

Pit depth of pilot signal Pit width of pilot signal
(b)
Pit width of information signal
59/193
IEC
(a) Represents section of the pit in normal condition.
(b) Explanation of the photograph (a).
Figure D.2 - Information and pilot signal track

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1106 ©I EC:1993 - 33 -
Annex E
(normative)
Vertical deviation and acceleration of VHD
E.1 Application
This measuring method shall be applied.
Parameters Applies to
3.1.20.1 Maximum distance from reference plane —
VHD
3.1.20.2 Maximum vertical acceleration
— VHD
3.1.20.3 Maximum vertical deviation
— VHD
E.2 Measuring apparatus
For the measurement of vertical deviation, the capacitance variation between a probe
(measuring device) and a disk is converted to a voltage variation which shows the dis-
tance variation.
The capacitance Co
(f), between the electrode of the probe head and the disk su rf
ace, is
given by:
S
Co = e x
Do
where
S is the area of the electrode in square metres
Do is the distance between the electrode and the disk in metres;
E = 8,855 x 10-
12 F/m
VS >Do
The capacitance variation AC (F), caused by distance change AD, will be calculated as
follows:
exS ex S 1 1
AC =
- ex
Do
Do - AD Do -AD Do
There is no linear relation between D
and C. However, the inverted characteristics can be
obtained by the non-contact displacement measuring equipment (see figure E.1). There-
fore the following formula can be obtained:
AV =
Kx AD
K
where is a constant.

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1106 ©IEC:1993 - 35 -
Gap adjuster (distance)
Recorder
Non - contact
displacement
measuring
,,,1
equipment
o
0
o
o
A
Capacitance probe 0
o
i i
o
o
0 0
B
Linearizer Spectrum
Acceleration
converter analyzer
!EC 592/93
Figure E.1 - Measurement block diagram
The equation for the acceleration a (m/s 2) is given by:
a=axco2 =ax(2rcf)2
where
a is the amplitude (m)
w is the angular velocity(s-l)
f is the frequency (Hz)
The dynamic range of the equipment for the practical measurement may be as much
as 70 dB. The system uses an acceleration converter which converts displacement to
acceleration as shown in figure E.1.
The acceleration converter is a second order high-pass filter.
E.3 Measurement
Measurement procedure:
1) place a VHD disk to be measured on the turntable;
2) then spin the disk at the speed of 900 rpm for NTSC, and 750 rpm for PAL;
3) read a capacitance variation at the non-contact displacement measuring equipment;
4) the spectrum analyzer will display the measurement result which is also recorded
on the XY recorder.

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1106 ©IEC:1993 — 37
E.3.1 (3.1.20.1) Maximum distance from reference plane
DS = D., — Do
where
D 1 is the distance between the electrode and reference plane (see figure E.1)
Ds is the distance from reference plane
E.3.2 (3.1.20.2) Maximum vertical acceleration
The output voltage B (see figure E.1) is linearly related to the vertical acceleration.
E.3.3 (3.1.20.3) Maximum vertical deviation
The output voltage A (see figure E.1) is linearly related to the ve rtical deviation.

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1106 © I EC:1993 — 39 —
Annex F
(normative)
Vertical deviation and acceleration of LV
F.1 Application
This measuring method shall be applied.
Parameters Applies to
3.1.20.1 Maximum distance from reference plane LV
3.1.20.2 Maximum vertical acceleration LV
3.1.20.3 Maximum vertical deviation
LV
3.1.20.4 Maximum velocity
LV —
F.2 Measuring apparatus
The measuring equipment is a modified videodisk player provided with an optical stylus
following the information plane in an ideal way in the ve rtical direction (see figure F.1).
The output voltage A (see figure F.2 for NTSC and F.3 for PAL) is equivalent to the
ve rtical position of the optical stylus with respect to the reference plane.
The disk is rotating at play back speed.
F.3 Measurement
F.3.1 (3.1.20.1) Maximum distance from reference plane
The output voltage A is linearly related to the distance from the reference plane P (see
figure F.1).
F.3.2 (3.1.20.2) Maximum vertical acceleration
The output voltage C (see figures F.2 and F.3) is linearly related to the ve rtical
acceleration.
F.3.3 (3.1.20.3) Maximum vertical deviation
D (see figures F.2 and F.3) is linearly related to the ve rtical deviation.
The output voltage

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1106 ©IEC:1993 - 41 -
F.3.4 (3.1.20.4)
Maximum velocity
The output voltage B
(see figure F.3) is linearly related to the vertical velocity.
—Disk
E
80 m m
E 0
N
^
N
N
iiiiiiA .riii►iii
``^`
Programme tracks /►
Reference plane
Clamping device
Optical stylus
—Hub plane
1&C 593193
Figure F.1 - Measurement of vertical deviation of programme tracks during
rotation at playback speed
High-pass
Modified filter
videodisk
player
= 1 100 Hz
Low pass
Fourth order
filter
Butterworth
=1100Hz Fourth order
Butterworth
First order
differential
fo =SHz
First order
differential
fo = 5Hz
reC 59403
Calibration with the vertically moving mirror over the optical stylus.
For instance, the mirror may be moved by means of a loudspeaker system.
Figure F.2 - Block diagram of measuring circuit (NTSC)

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11060 IEC:1993 — 43 —
High-pass
Modified filter
videodisk D
•
player
=1100Hz
Low-pass
Fourth order
filter
Butterworth
=1100Hz Fourth order
Butterworth
First order
differential
fo =5Hz
First order
differential
-► C
fo=5Hz
tEC 595 3
19
Calibration with the vertically moving mirror over the optical stylus.
For instance, the mirror may be moved by means of a loudspeaker system.
Figure F.3 — Block diagram of measuring circuit (PAL)

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1106 ©IEC:1993 - 45 -
Annex G
(normative)
Radial deviation and acceleration of VHD
G.1 Application
This measuring method shall be applied.
Parameters
Applies to
3.1.22.1 Maximum deviation during one revolution
— VHD
3.1.22.2
Maximum radial deviation — VHD
3.1.22.3
Maximum radial acceleration — VHD
G.2 Measuring apparatus
For the measurement of eccentricity and track roundness, the current variation flowing in
the tracking servo drive coil installed in the playback stylus can be converted to radial
acceleration of the disk's recorded track.
A
B
Modified
Acceleration
Spectrum
videodisk
ITF circuit
converter
analyzer
player
IEC 596/93
Figure G.1 - Block diagram of measuring equipment
G.3 Measurement
Player
r-- Disk — 1 ITF circuit
I I
Detector and
compensator
Radial O
deviation kD (s) C (s) O
0 (s)
E (s) P (s)
Tracking servo
Loop gain
G(s)
G (s)
kD (s)
Cantilever
IEC 597193
Figure G.2 - Transfer function

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1106 ©IEC:1993 - 47 -
Figure G.2 shows the transfer function of the measurement block diagram of figure G.1.
In figure G.2 ITF (Inverse Transfer Function) output, P(s) is given by
kD(s) x
C(s)
P(s) - x 0(s)
1 + G(s)
where
0(s) is the radial deviation of the disk
k is a constant
p - kD(s) x
C(s)
x a
1 + G(s)
where
p is the amplitude of P(s)
a is the amplitude of 0(s)
Therefore the equation for inverse transfer function is given by
+ G(s)
C(s) = Kx 1
D(s)
where K is a constant
Figure G.3 shows an example of C(s).
Thus, the output amplitude, p, is given by
p=Kxkxa
Therefore deviation is given by
1

a-
Kxk xp
The equation for the acceleration, a, is given by
a = a xw2 = a x(2nf)2
where
co is the angular velocity
f
is the frequency

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1106 ©I EC:1993 - 49 -
G.3.1 (3.1.22.1) Maximum deviation during one revolution
The output voltage A (see figure G.1) is linearly related to the radial deviation.
G.3.2 (3.1.22.2)
Maximum radial deviation
The output voltage A is linearly related to the radial deviation.
G.3.3 (3.1.22.3) Maximum radial acceleration
B (see figure G.1) is linearly related to the radial acceleration.
The output voltage
Response
‘'s -12 dB/octave
10
0-
■
- 10—
- 20 —
-30 -
-40 —
I I
Frequency
100 1 k (Hz)
!EC 598193
Figure G.3 - An example of C(s)

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1106 ©IEC:1993 - 51 -
Annex H
(normative)
Radial deviation and acceleration of LV
H.1 Application
This measuring method shall be applied.
Parameters Applies to
3.1.22.1 Maximum deviation during one revolution LV
3.1.22.2 Maximum radial deviation LV
3.1.22.3 LV —
Maximum radial acceleration
H.2 Measuring apparatus
The measuring equipment is a modified videodisk player provided with an optical stylus
following the track in an ideal way in the radial direction.
The output voltage A (see figure H.2) is linearly related to the radial position of the optical
stylus (see figure H.1).
The disk is rotating at its nominal velocity.
H.3 Measurement
H.3.1 (3.1.22.1) Maximum deviation during one revolution
The output voltage A is linearly related to the radial position of the optical stylus.
H.3.2 (3.1.22.2) Maximum radial deviation
The output voltage C (see figure H.2) is linearly related to the radial deviation.
H.3.3 (3.1.22.3) Maximum radial acceleration
The output voltage B (see figure H.2) is linearly related to the radial acceleration.
0 80 mm
Programme tracks
^T^
Optical stylus
1EC 599193
Figure H.1 - Measurement of radial deviation of programme tracks during
rotation at playback speed*. The disk is rotating around the
geometric centre of the centre hole
For CLV this implies the rotational speed corresponding to the radius at which the readout is made.

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1106 ©IEC:1993 — 53 —
High-pass
Modified filter
videodisk
player
f = 2 200 Hz
Low-pass
Fourth order
filter
Butterworth
= 2 200 Hz Fourth order
Butterworth
First order
differential
fo =5Hz
First order
differential
fo =5Hz
/EC 600193
Calibration with radially moving track.
For instance, the track can be moved by means of a loudspeaker system.
Figure H.2 — Block diagram of measuring equipment

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