SIST EN ISO 12085:2000

SLOVENSKI STANDARD
SIST EN ISO 12085:2000
01-december-2000
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SIST ISO 12085:2001
SIST ISO 12085:2001/TC1:2001
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Geometrical product specification (GPS) - Surface texture: Profile method - Motif
parameters (ISO 12085:1996)
Geometrische Produktspezifikationen (GPS) - Oberflächenbeschaffenheit:
Tastschnittverfahren - Motifkenngrößen (ISO 12085:1996)
Spécification géométrique des produits (GPS) - Etat de surface: Méthode du profil -
Parametres liés aux motifs (ISO 12085:1996)
Ta slovenski standard je istoveten z: EN ISO 12085:1997
ICS:
17.040.20 Lastnosti površin Properties of surfaces
SIST EN ISO 12085:2000 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN ISO 12085:2000

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SIST EN ISO 12085:2000

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SIST EN ISO 12085:2000

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SIST EN ISO 12085:2000
I NTE RNATI ONAL IS0
STANDARD 12085
First edition
1996-08-1 5
Geometrical Product Specification (GPS) -
Surface texture: Profile method - Motif
parameters
Spécification géométrique des produits (GPS) - État de surface: Méthode
du profil - Paramètres liés aux motifs
Reference number
IS0 12085:1996(E)

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SIST EN ISO 12085:2000
IS0 12085:1996(E)
Contents Page
1 ScoDe . 1
2 Normative references . 1
3 Definitions . 1
3.1 General definitions . 1
3.2 Parameter definitions . 3
4 Theoretically exact operator of the motif method . 5
4.1 General . 5
4.2 Conventional limits of motifs . 5
4.3 Depth discrimination . 5
4.4 ldsntification of roughness and waviness motifs through
the combination of motifs . 8
4.5 Procedure for parameter calculation . 10
5 Measuring conditions of parameters . 12
5.1 Convention concerning traversing the primary profile . 12
5.2 Recommended measurement conditions . 12
5.3 Profile quantization step . 12
5.4 Rule for acceptance .
12
5.5 Use of motifs method for analysis of multiprocess
surfaces. . . 12
5.6 Indications on the drawings . . 12
O IS0 1996
All riahts reserved Unless otherwise SDecified. no Dart of this publication may be repro-
U
duced or utilized in any form or by any means, electronic or mechanical, including photo-
copying and microfilm, without permission in writing from the publisher
International Organization for Standardization
Case Postale 56 CH-1 21 1 Genève 20 Switzerland
Printed in Switzerland
II

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SIST EN ISO 12085:2000
IS0 12085:1996(E)
0 IS0
Annexes
A Calculation method for combination of motifs . 13
Relation between motif parameters and function of surfaces . 16
B
C Relation to the GPS matrix model . 17
D Bibliography . 18
...
III

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SIST EN ISO 12085:2000
IS0 12085:1996(E) 0 IS0
Foreword
IS0 (the International Organization for Standardization) is a worldwide fed-
eration of national standards bodies (IS0 member bodies). The work of
preparing International Standards is normally carried out through IS0
technical committees. Each member body interested in a subject for
which a technical committee has been established has the right to be rep-
resented on that committee. International organizations, governmental and
non-governmental, in liaison with ISO, also take part in the work. IS0 col-
laborates closely with the International Electrotechnical Commission (IEC)
on all matters of electrotechnical standardization.
Draft International Standards adopted by the technical committees are cir-
culated to the member bodies for voting. Publication as an International
Standard requires approval by at least 75 % of the member bodies casting
a vote.
International Standard IS0 12085 was prepared jointly by Technical Com-
mittees iSO/TC 57, Metrology and properties of surfaces, Subcommit-
tee SC 1, Geometrical parameters - instruments and procedures for
measurement of surface roughness and waviness, lSO/TC 3, Limits and
fits and ISOflC 1 O, Technical drawings, product definition and related
documentation, Subcommittee SC 5, Dimensioning and tolerancing.
Annex A forms an integral part of this International Standard. Annexes B, C
and D are for information only.
iv

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SIST EN ISO 12085:2000
@ IS0 IS0 12085:1996(E)
Introduction
This International Standard is a Geometrical Product Specification (GPS)
standard and is to be regarded as a General GPS standard (see
ISO/TR 14638). It influences links 2, 3 and 4 of the surface texture chain of
standards on roughness profile and waviness profile.
For more detailed information of the relation of this International Standard
to other GPS standards, see annex C.
The approach described in this International Standard facilitates the de-
termining roughness and waviness parameters from the primary profile by
finding those motifs which characterize the surface under consideration.
This method is independent of any profile filter and results in parameters
which are based on the depth and spacing of the motifs. These par-
ameters, which are complementary to those defined in IS0 4287, can be
used to describe the functional properties of workpieces as indicated in
Annex B.
V

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SIST EN ISO 12085:2000

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SIST EN ISO 12085:2000
INTERNATIONAL STANDARD 0 IS0 IS0 12085:1996(E)
Geometrical Product Specification (GPS) - Surface
texture: Profile method - Motif parameters
1 Scope
This International Standard defines terms and parameters used for determining surface texture by the motif
L method, It also describes the corresponding ideal operator and measuring conditions.
2 Normative references
The following standards contain provisions which, through reference in this text, constitute provisions of this lnter-
national Standard. At the time of publication, the editions indicated were valid. All standards are subject to revision,
and parties to agreements based on this International Standard are encouraged to investigate the possibility of ap-
plying the most recent editions of the standards indicated below. Members of IEC and IS0 maintain registers of
currently valid International Standards.
IS0 1302.1 992, Technical drawings - Method of Indicating surface texture
IS0 3274 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal character-
istics of contact (stylus) Instruments.
IS0 4287.1 996, Geometrical Product Specifications (GPS) - Surface texture. Profile method - Terms, definitions
and parameters of surface texture
L
IS0 4288 1996, Geometrical Product Specifications (GPS) - Surface texture: Profile method - Rules and pro-
cedures for the assessment of surface texture
1- 3 Definitions
For the purposes of this International Standard the following definitions apply.
3.1 General definitions
3.1.1 surface profile: (See IS0 4287.)
3.1.2 primary profile: (See IS0 3274.)
1

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SIST EN ISO 12085:2000
IS0 12085:1996(E) 0 IS0
3.1.3 local peak of profile: A part of a profile between two adjacent minima of the profile (see figure 1).
Local peak of the profile
Figure 1 - Local peak of profile
3.1.4 local valley of profile: A part of a profile between two adjacent maxima of the profile (see figure 2).
- Local valley of the profile
I
Figure 2 - Local valley of profile
3.1.5 motif: A portion of the primary profile between the highest points of two local peaks of the profile, which
are not necessarily adjacent.
A motif is characterized by (see figures 3 and 5):
- its length, ARi or AW,, measured parallel to the general direction of the profile;
- its two depths, H, and HI+ 1, or Hwj and Hw,+ 1, measured perpendicular to the general direction of the primary
profile;
- its T characteristic, that is the smallest depth between the two depths.
AR I i
T=MIN[H,:H,,,I
here: T = Hj+,
Figure 3 - Roughness motif
3.1.6 roughness motif: Motif derived by using the ideal operator with limit value A (see figure 3).
NOTE 1 By this definition, a roughness motif has a length ARi smaller than or equal to A.

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SIST EN ISO 12085:2000
0 IS0 IS0 12085:1996(E)
3.1.7 upper envelope line of the primary profile (waviness profile): Straight lines joining the highest points of
peaks of the primary profile, after conventional discrimination of peaks (see figure 4).
/-Upper envelope line
Figure 4 - Upper envelope line
3.1.8 waviness motif: Motif derived on the upper envelope line by using the ideal operator with limit value B (see
figure 5).
Upper envelope line
r'l 1 I
l I
T = MIN [Hwj; Hwj
il
here: T = Hw *,
Figure 5 -Waviness motif
3.2 Parameter definitions
3.2.1 mean spacing of roughness motifs, AR: The arithmetical mean value of the lengths AR; of roughness mo-
tifs, within the evaluation length (see figure 61, i.e.
ln
AR=-T AR;
ne '
L 1=1
where n is the number of roughness motifs (equal to the number of ARi values).
3.2.2 mean depth of roughness motifs, R: The arithmetical mean value of the depths Hj of roughness motifs,
within the evaluation length (see figure 61, i.e.
1"
R=-x H. J
m.
J=1
where m is the number of Hj values.
NOTE 2 The number of H, values is twice the number of ARi values (m = 2n)
3.2.3 maximum depth of profile irregularity, Rx: The largest depth, H,, within the evaluation length.
EXAMPLE
On figure 6: Rx = Hg.
3

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SIST EN ISO 12085:2000
IS0 12085: 1996(E)
Figure 6 - Roughness parameters
3.2.4 mean spacing of waviness motifs, AW The arithmetical mean value of the lengths AWi of waviness mo-
tifs, within the evaluation length (see figure 71, i.e.
AW=-C ln A&
n.
I=1
where n is the number of waviness motifs (equal to the number of AWj values).
3.2.5 mean depth of waviness motifs, W: The arithmetical mean value of the depths Hwj of waviness motifs,
within the evaluation length (see figure 71, i.e.
W=-c lrn Hwj
m
J =I
where m is the number of Hw, values.
NOTE 3 The number of Hwj values is twice the number of AWj values (rn = 24.
3.2.6 maximum depth of waviness, Wx: The largest depth Hwj, within the evaluation length (see figure 7).
3.2.7 total depth of waviness, Wte: The distance, measured in a direction perpendicu!ar to the general direction
of the primary profile, between the highest point and the lowest point of the upper envelope line of the primary
profile (see figure 7).
2.5 vm i
LX
500 pm
Figure 7 - Waviness parameters
4

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SIST EN ISO 12085:2000
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IS0 12085:1996( E)
4 Theoretically exact operator of the motif method
4.1 General
This clause describes the identification conditions of motifs (length and depth discrimination) and presents the
process for calculating roughness and waviness parameters.
4.2 Conventional limits of motifs
The recommended values for limits A and B as described in figure 8 are given under clause 5.
O spacing 2 A
7
A - spacing I B
I
L
ai Roughness moth b) Wavlners motlrs
Figure 8 - ConvenLmal limits of motifs
4.3 Depth discrimination
The depth discrimination applies to the primary profile for the assessment of surface roughness.
4.3.1 Discrimination based on minimum depth
Divide the primary profile into sections of width A/2, and take the height of each rectangle.
The local peaks taken into account are those whose depth is larger than 5 YO of the mean height of these rec-
tangles (see figure 9).
L
LLocal peak retained L Local peak rejected
LHeigh+ of this rectangle
(example) (example)
I,
Figure 9 - Depth discrimination
5

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SIST EN ISO 12085:2000
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IS0 12085:1996(E)
4.3.2 Discrimination based on maximum depth
For the roughness motifs the depths of w
...